X
Search Filters
Format Format
Subjects Subjects
Subjects Subjects
X
Sort by Item Count (A-Z)
Filter by Count
materials science, multidisciplinary (144) 144
physics, applied (133) 133
hillocks (104) 104
hillock formation (98) 98
hillock (95) 95
physics, condensed matter (77) 77
growth (70) 70
thin films (59) 59
engineering, electrical & electronic (51) 51
metallurgy & metallurgical engineering (42) 42
thin-films (41) 41
analysis (39) 39
materials science, coatings & films (38) 38
dielectric films (37) 37
stress (37) 37
films (33) 33
aluminum (32) 32
instruments & instrumentation (32) 32
whisker (32) 32
chemistry, physical (31) 31
diffusion (31) 31
microstructure (30) 30
nuclear science & technology (30) 30
physics, atomic, molecular & chemical (30) 30
hillock growth (29) 29
silicon (29) 29
nanoscience & nanotechnology (27) 27
characterization and evaluation of materials (26) 26
electromigration (26) 26
optical and electronic materials (26) 26
temperature (26) 26
physics, nuclear (25) 25
tin (25) 25
annealing (24) 24
materials science (24) 24
morphology (24) 24
nanostructure (22) 22
alloys (21) 21
atomic force microscopy (21) 21
tin whiskers (21) 21
crystallography (19) 19
aluminium (18) 18
electronics and microelectronics, instrumentation (18) 18
evolution (18) 18
material science (17) 17
nanostructures (17) 17
surface (17) 17
surfaces (17) 17
behavior (16) 16
copper (16) 16
density (16) 16
deposition (16) 16
grain boundaries (16) 16
mechanism (16) 16
irradiation (15) 15
mikrostruktur (15) 15
stress relaxation (15) 15
chemistry (14) 14
damage (14) 14
dünnfilm (14) 14
nano-hillock formation (14) 14
aluminum films (13) 13
microscopy (13) 13
nucleation (13) 13
optics (13) 13
orientation (13) 13
physics (13) 13
resistivity (13) 13
wärmebehandlung (13) 13
afm (12) 12
chemical-vapor-deposition (12) 12
druckspannung (12) 12
etching (12) 12
nanotechnology (12) 12
oxidation (12) 12
animals (11) 11
chemical vapor deposition (11) 11
creep (11) 11
crystals (11) 11
gold (11) 11
heavy ions (11) 11
intermetallic compounds (11) 11
koh (11) 11
korngrenze (11) 11
oberflächenmorphologie (11) 11
relaxation (11) 11
silicium (11) 11
sputtering (11) 11
stability (11) 11
stresses (11) 11
ätzen (11) 11
anisotropy (10) 10
atomkraftmikroskopie (10) 10
deformation (10) 10
dünnschicht (10) 10
graphite (10) 10
hochtemperatur (10) 10
impact (10) 10
kinetics (10) 10
layers (10) 10
more...
Language Language
Publication Date Publication Date
Click on a bar to filter by decade
Slide to change publication date range


Infrared Physics and Technology, ISSN 1350-4495, 08/2017, Volume 84, pp. 87 - 93
In this paper we present the recent progress in the growth of (1 0 0) HgCdTe epilayers using metal organic chemical vapour deposition on GaAs epi-ready... 
Infrared detectors | HgCdTe | Hillocks | Macro-defects | MOCVD | VAPOR-PHASE EPITAXY | PHYSICS, APPLIED | HETEROSTRUCTURES | MOVPE | DETECTORS | INSTRUMENTS & INSTRUMENTATION | ORIENTATION | OPTICS | Gallium arsenide | Chemical vapor deposition | Investigations
Journal Article
Thin Solid Films, ISSN 0040-6090, 11/2019, p. 137692
Hillocks are protruding sections of a surface that can influence the electronic and mechanical properties of a thin film. In monolithic films, these hillocks... 
immiscible alloys | MATERIALS SCIENCE | copper tantalum | sputtering | hillock formation | thin films
Journal Article
Applied Surface Science, ISSN 0169-4332, 09/2019, Volume 487, pp. 1341 - 1347
Journal Article
Physical Review Letters, ISSN 0031-9007, 11/2004, Volume 93, Issue 20, pp. 1 - 206104
The room temperature spontaneous growth of low melting point metal whiskers, such as Sn, poses a serious reliability problem in the semiconducting industry; a... 
TIN WHISKERS | SPONTANEOUS GROWTH | FILMS | PHYSICS, MULTIDISCIPLINARY | ZINC | HILLOCK FORMATION
Journal Article
Journal of Materials Research, ISSN 0884-2914, 2014, Volume 29, Issue 2, pp. 197 - 206
A strategy for identifying the preferred sites and overall propensity of a Sn film to form whiskers has been developed based on film textures, local grain... 
INTERMETALLIC GROWTH | HILLOCK | MECHANISM | STRESS EVOLUTION | LEAD-FREE | ORIENTATION | MATERIALS SCIENCE, MULTIDISCIPLINARY | TIN | MORPHOLOGY | Stresses | Thin films | Thermal expansion | Grains | Anisotropy | Surface layer | Energy density | Thermal cycling | Texture
Journal Article
physica status solidi (b), ISSN 0370-1972, 04/2016, Volume 253, Issue 4, pp. 644 - 647
The formation and reduction of pyramidal hillocks on InGaAs/InP(111)A grown by metal organic chemical vapor deposition were investigated. The triangular... 
InGaAs | InP | hillocks | surfaces | off‐axis substrates | Surfaces | Hillocks | Off-axis substrates | PHYSICS, CONDENSED MATTER | off-axis substrates | GAAS | Reduction | Diffraction | Indium phosphides | X-rays | Solid state physics | Formations | Crystallinity | Substrates
Journal Article
Journal of Physics and Chemistry of Solids, ISSN 0022-3697, 11/2018, Volume 122, pp. 109 - 117
In this work aluminium (Al) films were deposited on different substrates, and their phase, microstructure and film growth process were tracked. Three types of... 
Al thin film | Metalloid and non-metal substrates | Grain growth mechanism | Metal | ALUMINUM | PHYSICS, CONDENSED MATTER | HILLOCK GROWTH | CHEMISTRY, MULTIDISCIPLINARY | Thin films | Silicon | Dielectric films | Optical properties
Journal Article
Acta Materialia, ISSN 1359-6454, 10/2014, Volume 79, pp. 59 - 65
Journal Article
Journal of Applied Physics, ISSN 0021-8979, 03/2016, Volume 119, Issue 10, p. 105302
We have performed X-ray synchrotron micro-diffraction measurements to study the processes controlling the formation of hillocks and whiskers in Sn layers on... 
TIN WHISKERS | PHYSICS, APPLIED | DYNAMIC RECRYSTALLIZATION DRX | FILMS | MECHANISM | STRESS EVOLUTION | WHISKER GROWTH | HILLOCK FORMATION | Tin compounds | Usage | Nucleation | Diffraction | X-rays | Research | Properties
Journal Article
Applied Surface Science, ISSN 0169-4332, 2011, Volume 257, Issue 22, pp. 9503 - 9506
Journal Article
EPL, ISSN 0295-5075, 08/2016, Volume 115, Issue 4, pp. 43001 - 43001
We report on nanostructuring of the KCl(001) surface induced by the individual impact of slow highly charged ions. Samples were irradiated with Xe ions with... 
CLEAN GOLD SURFACE | DESORPTION | IMPACT | PHYSICS, MULTIDISCIPLINARY | SOLIDS | ALKALI-HALIDES | HOLLOW ATOMS | FRONT | BARRIER MODEL | NEUTRALIZATION | HILLOCK FORMATION | Charged ions | Phase diagrams | Charge | Desorption | Formations | Nanostructure | Kinetic energy | Pits
Journal Article
Thin Solid Films, ISSN 0040-6090, 08/2012, Volume 520, Issue 21, pp. 6571 - 6575
Hillock formation in Al thin films with varying thicknesses of SiO as a passivation layer was investigated during thermal cycling. Based on the stress... 
Hillock | Aluminum | Thermal cycle | Passivation
Journal Article
Journal of Crystal Growth, ISSN 0022-0248, 09/2016, Volume 450, pp. 66 - 73
Journal Article
Journal of Physics: Condensed Matter, ISSN 0953-8984, 10/2011, Volume 23, Issue 39, pp. 393001 - np
This topical review focuses on recent advances in the understanding of the formation of surface nanostructures, an intriguing phenomenon in ion-surface... 
TRACK FORMATION | PHYSICS, CONDENSED MATTER | PROBE MICROSCOPY | LATENT TRACKS | LITHIUM-FLUORIDE | SCANNING-TUNNELING-MICROSCOPY | NANO-HILLOCK FORMATION | RADIATION-DAMAGE | ATOMIC-FORCE-MICROSCOPY | ELECTRONIC EXCITATIONS | POTENTIAL-ENERGY | Charged ions | Heavy ions | Condensed matter | Electronics | Formations | Nanostructure | Excitation | Surface structure
Journal Article
by Zhou, P and Zhou, C and Zhang, Q and Zhang, HQ and Liu, Z and Guan, S and Wang, G and Jia, J and Lv, X and Shao, J and Cui, Y and Chen, X and Chen, L
Nuclear Inst. and Methods in Physics Research, B, ISSN 0168-583X, 07/2013, Volume 307, pp. 221 - 224
Muscovite mica sheets were bombarded by lithium, carbon and oxygen ions in the energy range from several hundred keV to several MeV. The induced surface... 
Muscovite mica | Energy loss | Hillock nanostructure | PHYSICS, ATOMIC, MOLECULAR & CHEMICAL | PHYSICS, NUCLEAR | NANO-HILLOCK FORMATION | POTENTIAL-ENERGY | DAMAGE | FEATURES | TRACKS | IMPACT | THRESHOLD | INSTRUMENTS & INSTRUMENTATION | NUCLEAR SCIENCE & TECHNOLOGY | SWIFT HEAVY-IONS | HIGHLY-CHARGED IONS | SCANNING FORCE MICROSCOPY
Journal Article
Surface & Coatings Technology, ISSN 0257-8972, 02/2012, Volume 206, Issue 11-12, pp. 2991 - 2997
Understanding the controlling mechanism in growth of hillocks may lead to new processes enabling the growth of self-assembled hillocks. By processing the... 
Metallic thin films | Hillock | Coble creep | Fractal analysis | Residual stress | Selvedge layer | AU/PD THIN-FILMS | PHYSICS, APPLIED | GOLD-FILMS | ELECTROMIGRATION | GROWTH | STRESS | MATERIALS SCIENCE, COATINGS & FILMS | SURFACES | Thin films | Palladium | Dielectric films | Analysis
Journal Article
Journal of Electronic Materials, ISSN 0361-5235, 11/2014, Volume 43, Issue 11, pp. 4308 - 4316
Journal Article
Thin Solid Films, ISSN 0040-6090, 08/2012, Volume 520, Issue 21, pp. 6571 - 6575
Hillock formation in Al thin films with varying thicknesses of SiO as a passivation layer was investigated during thermal cycling. Based on the stress... 
Thermal cycle | Hillock | Aluminum | Passivation | PHYSICS, CONDENSED MATTER | PHYSICS, APPLIED | MATERIALS SCIENCE, MULTIDISCIPLINARY | GRAIN-ORIENTATION | RELAXATION | ALUMINUM FILMS | GROWTH | STRESS | MATERIALS SCIENCE, COATINGS & FILMS
Journal Article
Vacuum, ISSN 0042-207X, 2010, Volume 84, Issue 8, pp. 1062 - 1065
Journal Article
No results were found for your search.

Cannot display more than 1000 results, please narrow the terms of your search.