X
Search Filters
Format Format
Format Format
X
Sort by Item Count (A-Z)
Filter by Count
Journal Article (3143) 3143
Conference Proceeding (2374) 2374
Dissertation (228) 228
Publication (139) 139
Book Chapter (57) 57
Book Review (13) 13
Book / eBook (7) 7
Magazine Article (3) 3
Government Document (1) 1
Paper (1) 1
Reference (1) 1
Web Resource (1) 1
more...
Subjects Subjects
Subjects Subjects
X
Sort by Item Count (A-Z)
Filter by Count
high k dielectric materials (1994) 1994
high-k gate dielectrics (1849) 1849
physics, applied (1352) 1352
high-k (1026) 1026
engineering, electrical & electronic (901) 901
materials science, multidisciplinary (884) 884
dielectrics (881) 881
silicon (824) 824
physics, condensed matter (699) 699
hafnium oxide (604) 604
logic gates (573) 573
high-k dielectrics (562) 562
dielectric materials (544) 544
mosfets (497) 497
leakage current (456) 456
annealing (426) 426
capacitors (417) 417
atomic layer deposition (398) 398
high-k dielectric (386) 386
nanoscience & nanotechnology (380) 380
materials science, coatings & films (356) 356
transistors (352) 352
devices (350) 350
electrodes (344) 344
hfo2 (344) 344
dielektrikum (342) 342
voltage (336) 336
temperature (329) 329
degradation (312) 312
dielectric constant (308) 308
cmos technology (291) 291
gates (291) 291
capacitance (289) 289
films (287) 287
mosfet (286) 286
thin films (283) 283
dielektrizitätskonstante (277) 277
stress (270) 270
dielectric substrates (265) 265
gate dielectrics (263) 263
threshold voltage (262) 262
tunneling (259) 259
chemistry, physical (258) 258
oxides (236) 236
deposition (235) 235
aluminum oxide (226) 226
hafnium (223) 223
reliability (221) 221
mos devices (216) 216
tin (215) 215
hafnium compounds (207) 207
analysis (206) 206
leckstrom (205) 205
thin-films (205) 205
mosfet circuits (203) 203
oxide (193) 193
electric properties (182) 182
high-k dielectric materials (181) 181
dielectric films (170) 170
electron traps (167) 167
field-effect transistors (166) 166
fabrication (165) 165
optics (161) 161
permittivity (157) 157
stability (156) 156
nonvolatile memory (150) 150
semiconductor devices (150) 150
ceramics (149) 149
hfo (149) 149
metal gate (149) 149
oxidation (149) 149
dielektrische schicht (146) 146
dielectric measurements (143) 143
dielectric devices (142) 142
stacks (138) 138
zro2 (138) 138
performance (137) 137
electrical-properties (135) 135
interface (133) 133
random access memory (133) 133
semiconductors (133) 133
al2o3 (132) 132
silicon compounds (131) 131
cmos (130) 130
germanium (129) 129
high- k (129) 129
doping (128) 128
electric potential (127) 127
flash memory (127) 127
high-k dielectric thin films (125) 125
high-k materials (125) 125
transistor (125) 125
mobility (123) 123
passivation (121) 121
dielectric breakdown (120) 120
substrates (119) 119
frequency (118) 118
density (117) 117
mos-fet (117) 117
polymers (117) 117
more...
Library Location Library Location
Language Language
Language Language
X
Sort by Item Count (A-Z)
Filter by Count
English (5475) 5475
Japanese (111) 111
Chinese (87) 87
French (10) 10
Korean (10) 10
German (3) 3
Swedish (2) 2
Portuguese (1) 1
Spanish (1) 1
more...
Publication Date Publication Date
Click on a bar to filter by decade
Slide to change publication date range


Materials Science & Engineering R, ISSN 0927-796X, 2011, Volume 72, Issue 6, pp. 97 - 136
Journal Article
Chemistry of Materials, ISSN 0897-4756, 05/2017, Volume 29, Issue 9, pp. 3809 - 3826
2D materials are layered crystalline materials and are the most attractive nanomaterials due to their potentials in next-generation electronics. Because most... 
EPITAXIAL GRAPHENE | CHEMICAL-VAPOR-DEPOSITION | GATE DIELECTRICS | MATERIALS SCIENCE, MULTIDISCIPLINARY | CHEMISTRY, PHYSICAL | BLACK PHOSPHORUS | MOS2 TRANSISTORS | HIGH-K DIELECTRICS | MULTILAYER MOS2 | LARGE-AREA SYNTHESIS | FIELD-EFFECT TRANSISTORS | ELECTRONIC-STRUCTURE
Journal Article
Journal Article
ACS Applied Materials & Interfaces, ISSN 1944-8244, 01/2017, Volume 9, Issue 2, pp. 1793 - 1800
Journal Article
IEEE Transactions on Semiconductor Manufacturing, ISSN 0894-6507, 11/2019, Volume 32, Issue 4, pp. 444 - 449
Journal Article
Thin Solid Films, ISSN 0040-6090, 10/2016, Volume 616, pp. 482 - 501
Journal Article