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Journal of applied physics, ISSN 0021-8979, 07/2015, Volume 118, Issue 4, p. 44511
Current-voltage (IV) characteristics and the temperature dependence of the contact resistance [R(T)] of Au/YBa2Cu3O7-delta (optimally doped YBCO) interfaces... 
Physical Sciences | Physics | Science & Technology | Physics, Applied | Gold compounds | Copper oxide | Cuprite | Barium compounds | Electric properties | Temperature dependence | Electric potential | Amplitudes | Energy levels | YBCO superconductors | Electric contacts | Emission | Contact resistance | Electrical conduction | Current voltage characteristics | Switching | Hopping conduction
Journal Article
Dalton transactions : an international journal of inorganic chemistry, ISSN 1477-9234, 2018, Volume 47, Issue 30, pp. 10187 - 10194
.... conduction mechanism is described. In the present work, we have synthesized novel Se 78−x Ag x Te 20 Sn 2 (0 ≤ ≤ 6) semiconducting glasses for improving thermally activated... 
Physical Sciences | Chemistry, Inorganic & Nuclear | Chemistry | Science & Technology | Temperature dependence | Silver | Density | Potential barriers | Defects | Hopping conduction
Journal Article
RSC advances, ISSN 2046-2069, 04/2016, Volume 6, Issue 46, pp. 3975 - 39757
Rubidium aluminium diphosphate was synthesized by a conventional solid-state technique and its conduction properties determined by impedance spectroscopy... 
Physical Sciences | Chemistry | Chemistry, Multidisciplinary | Science & Technology | Grains | Mathematical models | Cations | Hopping (conductivity) | Impedance spectroscopy | Diphosphates | Relaxation time | Alternating current
Journal Article
Physica status solidi. C, ISSN 1862-6351, 01/2017, Volume 14, Issue 1-2, pp. np - n/a
...‐doped n‐type and a Mg‐doped p ‐type sample of GaN, both of which exhibit the characteristic of hopping conduction among impurity sites, have been analyzed. For the n‐GaN sample, Efros‐Shklovskii variable... 
GaN | Hall effect | impurity conduction | Solid state physics | Drift | Impurities | Hopping conduction
Journal Article
Journal Article
IEEE electron device letters, ISSN 0741-3106, 2012, Volume 33, Issue 12, pp. 1693 - 1695
In this letter, we investigate the origin of hopping conduction in the low-resistance state (LRS... 
resistance random access memory (RRAM) | hydration-dehydration reaction | supercritical fluid | Hopping conduction | Engineering, Electrical & Electronic | Engineering | Technology | Science & Technology
Journal Article
Applied Physics A, ISSN 0947-8396, 6/2014, Volume 115, Issue 3, pp. 943 - 951
Journal Article