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Journal of Physics Condensed Matter, ISSN 0953-8984, 07/2016, Volume 28, Issue 38, p. 385301
Micromechanically exfoliated mono- and multilayers of molybdenum disulfide (MoS2) are investigated by spectroscopic imaging ellipsometry. In combination with... 
complex dielectric function | optical properties | transition metal dichalcogenides | 2D materials | imaging ellipsometry | PHYSICS, CONDENSED MATTER | MONOLAYER MOS2 | 2-DIMENSIONAL MATERIALS | OPTICAL-PROPERTIES | GRAPHENE | NANOSHEETS | TRANSITION-METAL DICHALCOGENIDES | FILMS | PROGRESS | ELECTRONICS
Journal Article
Analytical Chemistry, ISSN 0003-2700, 2019, Volume 91, Issue 10, p. 6769
The main issues of imaging ellipsometry-based biosensing for small molecules are the low sensitivity and narrow detection range due to the low molecular weight... 
Gold | Dielectric constant | Chloramphenicol | Molecular weight | Ellipsometry | Chloromycetin | Nanoparticles | Amplification | Sensitivity | Low molecular weights | Imaging | Safety engineering | Food safety | Biosensors | Product safety
Journal Article
Thin Solid Films, ISSN 0040-6090, 02/2011, Volume 519, Issue 9, pp. 2730 - 2736
Our aim was to make possible to use spectroscopic ellipsometry for mapping purposes during one measuring cycle (minimum one rotation period of polarizer or... 
Mapping | Ellipsometry | Thin film | PHYSICS, CONDENSED MATTER | PROFILES | PHYSICS, APPLIED | MATERIALS SCIENCE, MULTIDISCIPLINARY | SILICON | MODEL | ION-IMPLANTED SEMICONDUCTORS | SPECTROSCOPIC ELLIPSOMETRY | ZNO LAYERS | MATERIALS SCIENCE, COATINGS & FILMS | Polarization | Pinholes | Production lines | Imaging | Refractivity | Detectors | Images
Journal Article
Analytical Chemistry, ISSN 0003-2700, 03/2016, Volume 88, Issue 6, pp. 3211 - 3217
Electrochemical-total internal reflection ellipsometry (EC-TIRE) has been proposed as a technique to observe the redox reactions on the electrode surface due... 
CHEMISTRY, ANALYTICAL | SPECTROSCOPY | POLYMER | SURFACE | INTERFACES | IMAGING ELLIPSOMETRY | LYSOZYME | DISSOLVED-OXYGEN | BIOSENSOR | ADSORPTION | CHARGE | Gold | Voltammetry | Usage | Chemical properties | Ellipsometry
Journal Article
Journal of Applied Physics, ISSN 0021-8979, 2012, Volume 112, Issue 12, p. 123523
In this work, we have examined the optical properties of exfoliated graphene on an Si/SiO2 substrate using spectroscopic imaging ellipsometry in the visible... 
LAYER | PHYSICS, APPLIED | Thermal properties | Measurement | Atomic force microscopy | Usage | Graphene | Optical properties | Refractive index | Raman spectroscopy | Spectroscopy | Imaging | Inversions | Silicon substrates | Spectra | Ellipsometry
Journal Article
Plasma Sources Science and Technology, ISSN 0963-0252, 12/2012, Volume 21, Issue 6, pp. 65005 - 1-7
For the in situ analysis of nano-sized particles in a laboratory plasma, Mie ellipsometry is a well established technique. We present a simple setup with two... 
LIGHT-SCATTERING | PARTICLES | PHYSICS, FLUIDS & PLASMAS | INTERSTELLAR DUST | Nanocomposites | Dynamics | Imaging | Nanomaterials | On-line systems | Nanostructure | Argon | Ellipsometry | Teknik och teknologier | TEKNIKVETENSKAP | Engineering and Technology | TECHNOLOGY
Journal Article
Applied Surface Science, ISSN 0169-4332, 11/2017, Volume 421, pp. 547 - 552
Journal Article
Journal of Biomedical Optics, ISSN 1083-3668, 5/2017, Volume 22, Issue 5, pp. 056005 - 056005
Journal Article
AIP Conference Proceedings, ISSN 0094-243X, 06/2019, Volume 2110, Issue 1
After years of development, total internal reflection imaging ellipsometry (TIRIE) biosensor has advanced from a concept to a practical analysis tool for... 
Surface Plasmon Resonance | Total Internal Reflection | Label-free biosensor | Imaging Ellipsometry | Evanescent Wave | Biomolecules | Reflection | Biosensors | Imaging | Ellipsometry
Journal Article
Applied Surface Science, ISSN 0169-4332, 11/2017, Volume 421, pp. 435 - 439
Spectroscopic imaging ellipsometry (SIE) is used to localize and characterize flakes of conducting, semi-conducting and insulating 2D-materials. Although the... 
Spectroscopic imaging ellipsometry | 2D material | Flake detection | Flakesearch | PHYSICS, CONDENSED MATTER | PHYSICS, APPLIED | 2-DIMENSIONAL MATERIALS | PROGRESS | GRAPHENE | CHEMISTRY, PHYSICAL | MATERIALS SCIENCE, COATINGS & FILMS | Graphene | Anisotropy | Graphite
Journal Article
Forensic Science International, ISSN 0379-0738, 2015, Volume 253, pp. 28 - 32
Journal Article
Sensors & Actuators: B. Chemical, ISSN 0925-4005, 01/2014, Volume 190, pp. 221 - 226
Journal Article
Thin Solid Films, ISSN 0040-6090, 11/2014, Volume 571, Issue 3, pp. 453 - 462
Tumor marker detection contributes to the early diagnosis of cancers. However, due to the lack of detection specificity, its results cannot act as a direct... 
Imaging ellipsometry | Tumor markers | Biosensor | Joint detection | VISUALIZATION | PHYSICS, CONDENSED MATTER | PHYSICS, APPLIED | MATERIALS SCIENCE, MULTIDISCIPLINARY | CANCER | MATERIALS SCIENCE, COATINGS & FILMS | Detectors | Tumors | Imaging | Ferritin | Markers | Diagnosis | Biosensors | Ellipsometry | Cancer
Journal Article
Applied Physics A, ISSN 0947-8396, 2/2019, Volume 125, Issue 2, pp. 1 - 10
Light-to-heat conversion using active plasmonic materials is essential in wide-ranging applications, such as sensing, photonics, drug delivery, biomedical... 
Condensed Matter Physics | Optical and Electronic Materials | Characterization and Evaluation of Materials | Surfaces and Interfaces, Thin Films | Manufacturing, Machines, Tools, Processes | Physics | Nanotechnology | PLATFORM | SURFACE-PLASMONS | HEAT | PHYSICS, APPLIED | FILMS | MATERIALS SCIENCE, MULTIDISCIPLINARY
Journal Article
Thin Solid Films, ISSN 0040-6090, 08/2018, Volume 660, pp. 759 - 765
Spectroscopic imaging ellipsometry was used to study 50 μm × 50 μm squares recorded into glassy As S thin film by electron beam with different exposure doses.... 
Thin films | Imaging ellipsometry | Chalcogenide glass | Micro-structuring | Optical properties | SYSTEM | PHYSICS, CONDENSED MATTER | PHYSICS, APPLIED | BEHAVIOR | MATERIALS SCIENCE, MULTIDISCIPLINARY | RESIST | IRRADIATION | CONDUCTIVITY | AMORPHOUS-SEMICONDUCTORS | REFRACTIVE-INDEX | MATERIALS SCIENCE, COATINGS & FILMS |