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Publication Date Publication Date
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Sensors & Actuators: A. Physical, ISSN 0924-4247, 2009, Volume 151, Issue 2, pp. 220 - 230
Journal Article
Smart Structures and Systems, ISSN 1738-1584, 08/2018, Volume 22, Issue 2, pp. 201 - 207
Journal Article
Journal of Applied Optics, ISSN 1002-2082, 03/2018, Volume 39, Issue 2, pp. 180 - 186
Journal Article
Proceedings of SPIE, ISSN 0277-786X, 01/2012, Volume 8335, Issue 1, pp. 83350R - 83350R-7
The paper put forward the system error evaluation method of 3D scanning system for gangue monitoring; analyzed system errors including integrated error which... 
integrated error | laser scanning system | measurement error | error analysis | laser rangefinder | the trend of error change | Gangue | Scanning | Horizontal | Error analysis | Lasers | Mathematical analysis | Monitoring | Three dimensional
Conference Proceeding
IEEE Transactions on Dielectrics and Electrical Insulation, ISSN 1070-9878, 02/2018, Volume 25, Issue 1, pp. 199 - 206
Journal Article
Optics Communications, ISSN 0030-4018, 03/2019, Volume 434, pp. 1 - 6
DMD based lithography system provides the feasibility to achieve multi-point parallel direct writing exposure. However, the distortion of the projection lens... 
Microlithography | Lithography | Digital image processing | FABRICATION | OPTICS | MASKLESS LITHOGRAPHY | Image processing | Integrated circuit fabrication
Journal Article
Optical Review, ISSN 1340-6000, 02/2015, Volume 22, Issue 1, pp. 1 - 8
We propose a new soldering process and a system for a quad flat package IC (QFP-IC). The incident line-formed laser beam converted by this system can realize... 
Laser soldering | Laser beam scanning | Galvano motor | Quad flat package (QFP) | Yttrium aluminum garnet (YAG) laser | ELECTRONIC COMPONENTS | DIODE-LASERS | STATE | JOINTS | OPTICS | Rare earth metals | Integrated circuits | Control systems | Semiconductor chips
Journal Article
Laser Physics, ISSN 1054-660X, 7/2012, Volume 22, Issue 7, pp. 1229 - 1234
This study is the first to demonstrate the selectivity quantum well intermixing process by using a femtosecond laser scanning-induced disordering technique.... 
Laser Technology, Photonics | Physics | CRYSTAL-FIBER | PHYSICS, APPLIED | PHOTONIC INTEGRATED-CIRCUITS | ION-IMPLANTATION | POLYMER | FABRICATION | AIR | OPTICS | PULSES | Universities and colleges | Lasers | Mechanical engineering | Analysis | Quantum wells
Journal Article
Optical and Quantum Electronics, ISSN 0306-8919, 12/2009, Volume 41, Issue 14, pp. 981 - 988
Journal Article
IEEE Transactions on Electron Devices, ISSN 0018-9383, 09/2003, Volume 50, Issue 9, pp. 1994 - 1997
Journal Article
Proceedings of the IEEE, ISSN 0018-9219, 11/2013, Volume 101, Issue 11, pp. 2450 - 2457
Reports on the development and production of the IBM System/360 system processor which was introduced in 1964. The April 1964 announcement of IBM System/360... 
Computers | Program processors | Operating systems | Software development | Product design | Hardware | Integrated circuit modeling | Research and development | ENGINEERING, ELECTRICAL & ELECTRONIC
Journal Article
2017 International Conference on Intelligent Computing, Instrumentation and Control Technologies (ICICICT), 07/2017, Volume 2018-, pp. 1207 - 1214
Manufacturing of Integrated Circuits (ICs) plays a vital role in electronic industry. ICs are fabricated on a thin slice of crystalline silicon called wafers.... 
Semiconductor device modeling | lithographic wafer scanner | Artificial Neural Network | Artificial neural networks | data-determined approaches | modeling based approaches | Silicon | lithography | Mathematical model | Iterative Feedback Tuning | Integrated circuit modeling | Tuning
Conference Proceeding
Infrared Physics and Technology, ISSN 1350-4495, 06/2017, Volume 83, pp. 252 - 258
In recent years, various thermal microscope imaging systems have been developed to meet the demands of micro-thermal analysis for large-scale integrated... 
Edge directed interpolation | Error correction | Thermal microscope imaging system | Spatial resolution | Optical micro-scanning | INSTRUMENTS & INSTRUMENTATION | PHYSICS, APPLIED | OPTICS | Integrated circuits | Information science | Algorithms | Image processing | Detectors | Semiconductor chips
Journal Article
Yadian Yu Shengguang/Piezoelectrics and Acoustooptics, ISSN 1004-2474, 02/2008, Volume 30, Issue 1, pp. 39 - 44
Journal Article
2015 12th IEEE International Conference on Electronic Measurement & Instruments (ICEMI), 07/2015, Volume 3, pp. 1508 - 1512
To solve the conflict for the field of vision, image quality and detector level, the expansion of the field of vision for remote sensing is regard as an... 
Integrated optics | Optical fibers | precision measurement | scanning system | Optical variables measurement | remote sensing | accuracy clinometer | Optical reflection | Mirrors | Rotation measurement | Precision measurement | Scanning system | Remote sensing | Accuracy clinometer
Conference Proceeding
2002, AD-a410 457.
Program Manager, Aircrew Integrated Systems (PM-ACIS) is developing a new helmet-mounted display (HMD) technology based on scanning lasers. Under this program,... 
lasers | prototypes | pe62787a | safety | helmet mounted displays | integrated systems | flight crews | optical scanning
Government Document
2017 IEEE International Conference on Signal Processing, Informatics, Communication and Energy Systems (SPICES), 08/2017, pp. 1 - 8
Lithographic wafer scanners or wafer steppers are the machines used for the manufacturing of Integrated Circuits (ICs). Modeling based approaches are being... 
Semiconductor device modeling | Chip manufacture | lithographic wafer scanner | Artificial Neural Network | Process control | Artificial neural networks | data-determined approaches | modeling based approaches | Mathematical model | Iterative Feedback Tuning | Integrated circuit modeling | Tuning
Conference Proceeding
IEEE Transactions on Applied Superconductivity, ISSN 1051-8223, 06/1999, Volume 9, Issue 2, pp. 3491 - 3494
Journal Article
Proceedings of SPIE, ISSN 0277-786X, 10/2010, Volume 7655, Issue 1, pp. 76551B - 76551B-5
Introducing current situation of laser imaging scanning optical system and structure, analyzing the existing limitations of laser imaging scanning optical... 
Imaging optics | Laser imaging | Integrated optical waveguide | Scanning system
Conference Proceeding
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