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Micron, ISSN 0968-4328, 1997, Volume 28, Issue 4, pp. 279 - 308
Journal Article
Ultramicroscopy, ISSN 0304-3991, 1997, Volume 67, Issue 1, pp. 219 - 232
An environmental cell high resolution electron microscope (EHREM) has been developed for in situ studies of dynamic chemical reactions on the atomic scale. It... 
Environmental high resolution electron microscopy | Catalysis | K RA MICROSCOPY | catalysis | CRYSTAL | MICROSCOPY | environmental high resolution electron microscopy | CATALYSTS | VANADYL PYROPHOSPHATE | Electron microscopy
Journal Article
Ultramicroscopy, ISSN 0304-3991, 1997, Volume 69, Issue 2, pp. 117 - 127
Height anomalies in tapping mode atomic force microscopy (AFM) in air are shown to be caused by adhesion, Depending on the damping of the oscillation the... 
Atomic force microscopy | CONTRAST | K RA MICROSCOPY | atomic force microscopy | MICROSCOPY | SUBSTRATE | MODULATION
Journal Article
Ultramicroscopy, ISSN 0304-3991, 1997, Volume 67, Issue 1, pp. 1 - 9
Since the mid-1980s, electron back-scatter diffraction (EBSD, also known as back-scatter Kikuchi diffraction, BKD) has become a well-known and often used... 
Orientation imaging microscopy | Electron back-scatter diffraction | Microstructure characterization | microstructure characterization | K RA MICROSCOPY | MICROSCOPY | orientation imaging microscopy | electron back-scatter diffraction
Journal Article
Ultramicroscopy, ISSN 0304-3991, 1997, Volume 67, Issue 1, pp. 11 - 17
Orientation imaging microscopy (OIM), which images the microstructure using the electron backscattered diffraction probe, has proven to be a powerful tool for... 
Microdiffraction | Texture | Backscattering | microdiffraction | K RA MICROSCOPY | MICROSCOPY | backscattering | texture | Microscope and microscopy
Journal Article
Ultramicroscopy, ISSN 0304-3991, 1997, Volume 69, Issue 1, pp. 39 - 49
Electric potential measurements on different metals and semiconductors have been performed using a scanning probe microscope. The measured potential shows a... 
Contact potential | AFM | SPM | Kelvin probe | Surface potential | Chemical contrast | K RA MICROSCOPY | RESOLUTION | chemical contrast | surface potential | PROBE FORCE MICROSCOPY | contact potential | MICROSCOPY | SCANNING TUNNELING POTENTIOMETRY
Journal Article
Journal of Microscopy, ISSN 0022-2720, 03/1997, Volume 185, Issue 3, pp. 354 - 365
In this paper, we compare the performance of three iterative methods for image restoration: the Richardson–Lucy algorithm, the iterative constrained... 
image restoration | 3‐D imaging | confocal microscopy | Confocal microscopy | 3-D imaging | Image restoration | MAXIMUM-LIKELIHOOD | FLUORESCENCE MICROSCOPY | K RA MICROSCOPY | MICROSCOPY
Journal Article
Ultramicroscopy, ISSN 0304-3991, 12/1996, Volume 66, Issue 3-4, pp. 251 - 259
Cantilever dynamics characterizing the operation of a scanning force microscope (SFM) in the dynamic mode at high oscillation amplitudes were investigated in... 
61.16.Ch | 62.20.-x | 02.60.Cb | SURFACE | MICROSCOPY | K RA MICROSCOPY | Spectrum analysis | Analysis
Journal Article
Ultramicroscopy, ISSN 0304-3991, 1997, Volume 69, Issue 1, pp. 1 - 11
In the Vincent-Midgley technique, where the electron beam is precessed around the optical axis, integrated electron diffraction intensities can be measured... 
Electron diffraction | MICROSCOPY | K RA MICROSCOPY | electron diffraction
Journal Article
SCANNING, ISSN 0161-0457, 01/1997, Volume 19, Issue 1, pp. 1 - 14
Journal Article
Ultramicroscopy, ISSN 0304-3991, 1997, Volume 69, Issue 3, pp. 211 - 217
Droplets of aqueous solutions of CaCl and P O have been imaged with a scanning force microscope operated in tapping mode. We found two distinctly different... 
Liquids | Wetting | Phase contrast | AFM | Tapping mode | Cantilever resonance | Droplet | Soft materials | wetting | K RA MICROSCOPY | tapping mode | droplet | cantilever resonance | soft materials | liquids | phase contrast | MICROSCOPY | SURFACES
Journal Article
Ultramicroscopy, ISSN 0304-3991, 1997, Volume 68, Issue 1, pp. 69 - 75
The dependence of electron microscopic contrast on atomic number has been separated experimentally from that on mass thickness in a Philips CM20 transmission... 
MICROSCOPY | K RA MICROSCOPY
Journal Article
Journal of Microscopy, ISSN 0022-2720, 12/1996, Volume 184, Issue 3, pp. 214 - 228
The size distribution of liposomes is often determined using freeze fracture, cryoelectron microscopy or dynamic light scattering. However, the resulting size... 
dynamic light scattering | freeze fracture electron microscopy | liposomes | Cryotransmission electron microscopy | size distribution | vesicles | cryotransmission electron microscopy | SYSTEM | CRYO-ELECTRON MICROSCOPY | AQUEOUS-SOLUTIONS | SUSPENSIONS | INTEGRAL-EQUATIONS | POLYDISPERSITY | MICROSCOPY | BILE-SALT | SHOWING OVERPROJECTION | K RA MICROSCOPY | TRUNCATION
Journal Article
Ultramicroscopy, ISSN 0304-3991, 1997, Volume 68, Issue 3, pp. 173 - 180
The possibilities of obtaining information about interband scattering processes from electron energy-loss spectra, taken in a VG601UX scanning transmission... 
MICROSCOPY | SCATTERING | K RA MICROSCOPY
Journal Article
Ultramicroscopy, ISSN 0304-3991, 1996, Volume 66, Issue 1, pp. 21 - 33
The characteristics of two single-crystal YAG-based slow-scan CCD (SSC) cameras are measured and analyzed for various electron accelerating voltages. A... 
DETECTION EFFICIENCY | K RA MICROSCOPY | MICROSCOPY | CHARGE-COUPLED-DEVICE | PERFORMANCE
Journal Article
Journal of Microscopy, ISSN 0022-2720, 03/1997, Volume 185, Issue 3, pp. 366 - 374
The aberrations introduced when focusing within a specimen with a refractive index equal to that of water using an oil‐immersion objective are investigated... 
confocal microscopy | Aberration | point spread function | Confocal microscopy | Point spread function | K RA MICROSCOPY | LIGHT | aberration | ELECTROMAGNETIC DIFFRACTION | MICROSCOPY | ABERRATIONS | PLANAR INTERFACE
Journal Article
Journal of Microscopy, ISSN 0022-2720, 10/1997, Volume 188, Issue 1, pp. 17 - 23
Journal Article
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