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1. Full Text Kikuchi pattern analysis of noncentrosymmetric crystals
by Nolze, G and Grosse, C and Winkelmann, A
Journal of Applied Crystallography, ISSN 1600-5767, 10/2015, Volume 48, Issue 5, pp. 1405 - 1419
Different models of Kikuchi pattern formation are compared with respect to their applicability to noncentrosymmetric crystals, and the breakdown of Friedel's... 
Friedel's rule | Kikuchi patterns | electron backscatter diffraction | enantiomorphy | polarity | Electron backscatter diffraction | CRYSTALLOGRAPHIC POINT GROUPS | CHANNELING PATTERNS | FACTOR PHASE INFORMATION | CRYSTALLOGRAPHY | COMPOUND SEMICONDUCTORS | FRIEDEL LAW | CHEMISTRY, MULTIDISCIPLINARY | POLARITY DETERMINATION | DIFFUSE-SCATTERING | SITE DETERMINATION | MICROSCOPE | Semiconductors | Analysis | Crystals
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2. Atlas of backscattering Kikuchi diffraction patterns
by Dingley, D. J and Baba-Kishi, K. Z and Randle, V
1995, Microscopy in materials science series., ISBN 9780750302128, ix, 135
Diffraction patterns | Scanning electron microscopy | Microscopy | Crystallography | Materials
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3. Full Text NLPAR: Non-local smoothing for enhanced EBSD pattern indexing
by Brewick, Patrick T and Wright, Stuart I and Rowenhorst, David J
Ultramicroscopy, ISSN 0304-3991, 05/2019, Volume 200, pp. 50 - 61
Due to continued advances in phosphor sensitivity and camera technology, electron backscattered diffraction (EBSD) within a scanning electron microscope (SEM)... 
Non-local means filtering | Kikuchi patterns | Pattern indexing | EBSD | ELECTRON | DICTIONARY APPROACH | MICROSCOPY | Nickel alloys | Algorithms | Structure | Heat resistant alloys | Crystals
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4. Full Text AstroEBSD: exploring new space in pattern indexing with methods launched from an astronomical approach
by Britton, Thomas Benjamin and Tong, Vivian S and Hickey, Jim and Foden, Alex and Wilkinson, Angus J
Journal of Applied Crystallography, ISSN 1600-5767, 12/2018, Volume 51, Issue 6, pp. 1525 - 1534
Electron backscatter diffraction (EBSD) is a technique used to measure crystallographic features in the scanning electron microscope. The technique is highly... 
scanning electron microscopy | electron Kikuchi diffraction | indexing | astronomy | electron backscatter diffraction | EBSD | Scanning electron microscopy | Electron backscatter diffraction | Electron kikuchi diffraction | Astronomy | Indexing | CALIBRATION | CRYSTAL ORIENTATIONS | MATCHING ALGORITHM | RESOLUTION | CRYSTALLOGRAPHY | RELATE 2 SETS | DICTIONARY APPROACH | IDENTIFICATION | CHEMISTRY, MULTIDISCIPLINARY | LOCAL TEXTURE | Diffraction patterns | Satellites | Algorithms | Computer simulation | Electron back scatter | Software | Night sky | Crystallography | Crystal structure | Computer programs
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5. Full Text Blind lattice‐parameter determination of cubic and tetragonal phases with high accuracy using a single EBSD pattern
by Han, Ming and Chen, Chen and Zhao, Guangming and Li, Lili and Nolze, Gert and Yu, Baojun and Huang, Xiaodong and Zhu, Ye
Acta Crystallographica Section A, ISSN 2053-2733, 11/2018, Volume 74, Issue 6, pp. 630 - 639
The Bravais lattices and their lattice parameters are blindly determined using electron backscatter diffraction (EBSD) patterns of materials with cubic or... 
lattice parameters | Kikuchi patterns | electron backscatter diffraction | EBSD | Bravais lattices | ELECTRON | RUTILE | BACKSCATTER DIFFRACTION PATTERN | CRYSTALLOGRAPHY | CHEMISTRY, MULTIDISCIPLINARY | Diffraction patterns | Accuracy | Crystal lattices | Cubic lattice | Systematic errors | Simulation | Electron back scatter | Lattice parameters | Crystallography | Crystal structure
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6. Full Text Direct detection of electron backscatter diffraction patterns
by Wilkinson, Angus J and Moldovan, Grigore and Britton, T. Benjamin and Bewick, Angus and Clough, Robert and Kirkland, Angus I
Physical Review Letters, ISSN 0031-9007, 08/2013, Volume 111, Issue 6, p. 065506
We report the first use of direct detection for recording electron backscatter diffraction patterns. We demonstrate the following advantages of direct... 
STRAINS | CCD CAMERAS | TEXTURE | BACK-SCATTER DIFFRACTION | PHYSICS, MULTIDISCIPLINARY | KIKUCHI PATTERNS | NOISE TRANSFER | MICROSCOPY | ACTIVE PIXEL SENSOR | MICROSTRUCTURE | PHASE IDENTIFICATION
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7. Full Text Aleukemic myeloid leukemia cutis with a kikuchi disease-like inflammatory pattern in myelodysplastic syndrome
by Khieu, Michelle and Beauvais, Alexis and Matz, Rebecca and Bersabe, Adrian and Brown, Patrick and Brown, Alexander and Fillman, Eric and Hall, Jordan
Southern Medical Journal, ISSN 0038-4348, 04/2017, Volume 110, Issue 4, pp. 308 - 313
Myeloid leukemia cutis (MLC) is a rare disease characterized by the infiltration of neoplastic myeloid, myelomonocytic, or monocytic precursors into the skin,... 
Kikuchi disease-like inflammatory pattern | Kikuchi-Fujimoto disease | myelodysplastic syndrome | aleukemic leukemia cutis | MEDICINE, GENERAL & INTERNAL | DIFFERENTIAL-DIAGNOSIS | FUJIMOTO-DISEASE | HISTIOCYTIC NECROTIZING LYMPHADENITIS | EMPHASIS | CUTANEOUS LESIONS | Skin Diseases - diagnosis | Myelodysplastic Syndromes - diagnosis | Histiocytic Necrotizing Lymphadenitis - diagnosis | Humans | Histiocytic Necrotizing Lymphadenitis - pathology | Aged, 80 and over | Male | Skin Diseases - pathology | Myelodysplastic Syndromes - pathology | Skin - pathology
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8. Full Text Principles of depth‐resolved Kikuchi pattern simulation for electron backscatter diffraction
by WINKELMANN, A
Journal of Microscopy, ISSN 0022-2720, 07/2010, Volume 239, Issue 1, pp. 32 - 45
Summary This paper presents a tutorial discussion of the principles underlying the depth‐dependent Kikuchi pattern formation of backscattered electrons in the... 
dynamical electron diffraction | Electron backscatter diffraction | Kikuchi pattern | convergent beam electron diffraction | THERMAL DIFFUSE-SCATTERING | EBSD PATTERNS | INTENSITY | THICK SPECIMENS | MICROSCOPY | MOLYBDENITE FILMS | MULTIPLE-SCATTERING | CRYSTALS | PHONON-SCATTERING | CONTRAST | Electron microscopy | Monte Carlo method | Analysis | Scanning electron microscopy | Electron scattering | Monte Carlo methods | Computer simulation | Electron diffraction | Backscattering | Mathematical models | Electron back scatter diffraction
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9. Full Text Phase discrimination by pattern brightness in EBSD mappings
by Afshar, Mehran
Materials Characterization, ISSN 1044-5803, 10/2017, Volume 132, pp. 405 - 412
A new method that allows identifying different phases with a similar crystal structure without using information from the EDS detector was developed. The... 
Phase discrimination method | POIB method | Electron backscatter diffraction (EBSD) | ELECTRON BACKSCATTER DIFFRACTION | KIKUCHI PATTERNS | MATERIALS SCIENCE, MULTIDISCIPLINARY | METALLURGY & METALLURGICAL ENGINEERING | RESOLUTION | MICROSCOPY | IDENTIFICATION | CRYSTALS | MATERIALS SCIENCE, CHARACTERIZATION & TESTING | SEM | ALLOY | Alloys | Structure | Crystals
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10. Full Text Specimen‐thickness effects on transmission Kikuchi patterns in the scanning electron microscope
by RICE, K.P and KELLER, R.R and STOYKOVICH, M.P
Journal of Microscopy, ISSN 0022-2720, 06/2014, Volume 254, Issue 3, pp. 129 - 136
Summary We report the effects of varying specimen thickness on the generation of transmission Kikuchi patterns in the scanning electron microscope. Diffraction... 
scanning electron microscopy | Monte Carlo simulations | transmission kikuchi diffraction | ultrathin films | transmission EBSD | Ultrathin films | Scanning electron microscopy | Transmission EBSD | Transmission kikuchi diffraction | NANOPARTICLES | SCATTER DIFFRACTION | PERFORMANCE | MICROSCOPY | BACKSCATTER DIFFRACTION | EBSD | SURFACES | Thin films | Monte Carlo method | Dielectric films | Diffraction patterns | Energy use | Spatial distribution | Computer simulation | Microscopy | Aluminum | Indexing
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11. Full Text Model mechanisms in Kikuchi pattern formation from crystals
by Winkelmann, Aimo
Crystal Research and Technology, ISSN 0232-1300, 04/2017, Volume 52, Issue 4, pp. np - n/a
In diffraction experiments on crystals, different types of diffraction patterns can be observed. Depending on various factors like the scattering energy,... 
crystals | Kikuchi patterns | diffraction | incoherent scattering | CRYSTALLOGRAPHY | SCANNING-ELECTRON-MICROSCOPE | SCATTERING | Diffraction patterns | Diffraction | Electron diffraction | Scattering | Kinematics | Coherence | Crystals | Coherent scattering
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12. Full Text Crystallometric and projective properties of Kikuchi diffraction patterns
by Nolze, Gert and Winkelmann, Aimo
Journal of Applied Crystallography, ISSN 1600-5767, 02/2017, Volume 50, Issue 1, pp. 102 - 119
Kikuchi diffraction patterns can provide fundamental information about the lattice metric of a crystalline phase. In order to improve the possible precision... 
backscatter Kikuchi diffraction | BKD | electron backscatter diffraction | Kikuchi band position | EBSD | Kikuchi band width | cross ratio | CRYSTALLOGRAPHY | IDENTIFICATION | SIMULATION | CHEMISTRY, MULTIDISCIPLINARY | DAMAGE | PHASE | SEM | POINT | Structure | Analysis | Crystals | Crystallography | Diffraction | Diffraction patterns | Accuracy | Crystal lattices | Mathematical analysis | Lattice parameters | Forecasting | Gnomonic projection
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13. Full Text Nanometres‐resolution Kikuchi patterns from materials science specimens with transmission electron forward scatter diffraction in the scanning electron microscope
by BRODUSCH, N and DEMERS, H and GAUVIN, R
Journal of Microscopy, ISSN 0022-2720, 04/2013, Volume 250, Issue 1, pp. 1 - 14
Summary A charge‐coupled device camera of an electron backscattered diffraction system in a scanning electron microscope was positioned below a thin specimen... 
transmission Kikuchi diffraction (TKD) | scanning transmission electron microscopy (STEM) | transmission electron forward scatter diffraction (t‐EFSD) | nanodiffraction | scanning electron microscopy (SEM) | Electron backscatter diffraction (EBSD) | Transmission electron forward scatter diffraction (t-EFSD) | Nanodiffraction | Transmission Kikuchi diffraction (TKD) | Scanning electron microscopy (SEM) | Scanning transmission electron microscopy (STEM) | QUALITY | SIMULATION | MICROSCOPY | transmission electron forward scatter diffraction (t-EFSD) | EBSD | PHASE | ORIENTATION | SEM | SPATIAL-RESOLUTION | Electron microscopy | Transmission electron microscopes | Electron microscopes | Mineralogy | Diffraction | Charge coupled devices | Diffraction patterns | Scanning electron microscopy | Nanostructure | Orientation | Scatter | Electron back scatter diffraction
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14. Full Text Retrieving overlapping crystals information from TEM nano‐beam electron diffraction patterns
by VALERY, A and RAUCH, E.F and CLÉMENT, L and LORUT, F
Journal of Microscopy, ISSN 0022-2720, 11/2017, Volume 268, Issue 2, pp. 208 - 218
Summary The diffraction patterns acquired with a transmission electron microscope (TEM) contain Bragg reflections related to all the crystals superimposed in... 
precession electron diffraction | template matching | transmission electron microscopy | phase mapping | ACOM–TEM | crystallographic orientation | ACOM-TEM | RESOLUTION | MICROSCOPY | TRANSMISSION KIKUCHI DIFFRACTION | EBSD | SCATTER DIFFRACTION | ORIENTATION | MICROSCOPE | BACKSCATTER DIFFRACTION | Transmission electron microscopes | Electric contacts | Electron diffraction | Spatial discrimination | Mapping | Thin films | Diffraction patterns | Electron beams | Convolution | Tungsten | Silicon | Lamella | Microscopes | Crystal structure | Automation | Grains | Crystals | Electron microscopes | Nickel silicide | Information retrieval | Foils | Orientation | Template matching | Transmission electron microscopy | Diffraction | X rays | Information processing | Spatial resolution | Electrons | Indexing | Engineering Sciences | Materials
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15. Full Text Element-specific Kikuchi patterns of Rutile
by Vos, M and Winkelmann, A and Nolze, G
Ultramicroscopy, ISSN 0304-3991, 09/2015, Volume 156, pp. 50 - 58
The kinetic energy of keV electrons backscattered from a rutile (TiO ) surface depends measurably on the mass of the scattering atom. This makes it possible to... 
Simulation | Electron Rutherford backscattering | Kikuchi pattern | TiO2 | TiO 2 | ELECTRON | MICROSCOPY | SCATTERING | Force and energy | Diffraction patterns | Rutile | Backscattering | Crystals | Titanium | Angular distribution | Kinetic energy | Titanium dioxide
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16. Full Text Determining the Bravais lattice using a single electron backscatter diffraction pattern
by Li, Lili and Han, Ming
Journal of Applied Crystallography, ISSN 1600-5767, 02/2015, Volume 48, Issue 1, pp. 107 - 115
The ab initio derivation of the Bravais lattice from the Kikuchi bands detected from a single electron backscatter diffraction (EBSD) pattern is successfully... 
gnomonic correction | reconstruction | Bravais lattice | reciprocal lattice planes | electron backscatter diffraction patterns | reciprocal lattice vectors | Electron backscatter diffraction patterns | PHASE | KIKUCHI-DIFFRACTION | CELL PARAMETERS | SEM | CRYSTALLOGRAPHY | IDENTIFICATION | Electron microscopy | Structure | Analysis | Crystals | Diffraction | Crystallography | Electrons | Crystal structure
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17. Full Text A new method for locating Kikuchi bands in electron backscatter diffraction patterns
by Zhang, Yongsheng and Fang, Shangqiang and Lin, Chucheng and Zhang, Jimei and Jiang, Caifen and Zeng, Yi and Huang, Fuqiang and Miao, Hong
Microscopy Research and Technique, ISSN 1059-910X, 12/2019, Volume 82, Issue 12, pp. 2035 - 2041
Electron backscatter diffraction (EBSD) device can provide crystal structure, orientation, and phase content data through analysis of EBSD patterns. The... 
image processing | edge detection | electron backscatter diffraction | Kikuchi bands | Diffraction patterns | Diffraction | Image processing | Mathematical analysis | Hough transformation | Electron back scatter | Reliability analysis | Axes (reference lines) | Crystal structure | Electrons | Kikuchi lines
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18. Full Text A New and Unexpected Spatial Relationship Between Interaction Volume and Diffraction Pattern in Electron Microscopy in Transmission
by Brodu, Etienne and Brodu, Etienne and Bouzy, Emmanuel and Bouzy, Emmanuel
Microscopy and Microanalysis, ISSN 1431-9276, 12/2018, Volume 24, Issue 6, pp. 634 - 646
The finding of this study is that the interaction volume in electron microscopy in transmission is well ordered laterally, with a remarkable and unexpected... 
interaction volume | electron microscopy | transmission Kikuchi diffraction | diffraction pattern | Monte Carlo simulation | THERMAL DIFFUSE-SCATTERING | BACKSCATTER | INCIDENT ENERGY | MATERIALS SCIENCE, MULTIDISCIPLINARY | DICTIONARY APPROACH | SIMULATION | MICROSCOPY | EBSD | KIKUCHI DIFFRACTION | DISTRIBUTIONS | MATCHING APPROACH | SAMPLE THICKNESS | Diffraction patterns | Scanning electron microscopy | Image analysis | Image processing | Computer simulation | Electron diffraction | Scattering cross sections | Software | Sensors | Electron microscopy
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19. Full Text Lattice constant measurement from electron backscatter diffraction patterns
by SAOWADEE, N and AGERSTED, K and BOWEN, J.R
Journal of Microscopy, ISSN 0022-2720, 05/2017, Volume 266, Issue 2, pp. 200 - 210
Summary Kikuchi bands in election backscattered diffraction patterns (EBSP) contain information about lattice constants of crystallographic samples that can be... 
yttria‐stabilized zirconia | strontium titanate | lattice constant | XRD | EBSD pattern | EBSD | Kikuchi band width | yttria-stabilized zirconia | STRAINS | PHASE | MICROSCOPY
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20. Full Text Comparison of EBSD patterns simulated by two multislice methods
by LIU, Q.B and CAI, C.Y and ZHOU, G.W and WANG, Y.G
Journal of Microscopy, ISSN 0022-2720, 10/2016, Volume 264, Issue 1, pp. 71 - 78
Summary The extraction of crystallography information from electron backscatter diffraction (EBSD) patterns can be facilitated by diffraction simulations based... 
Dynamical electron diffraction | revised real space method | EBSD patterns | multislice method | Multislice method | Revised real space method | LATTICE ROTATIONS | ELASTIC STRAIN-MEASUREMENT | ELECTRON BACKSCATTER DIFFRACTION | KIKUCHI PATTERNS | RESOLUTION | MICROSCOPY | PHASE IDENTIFICATION | CRYSTALS | SCATTERING | Methods | Diffraction | Electrons
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