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IEEE Transactions on Very Large Scale Integration (VLSI) Systems, ISSN 1063-8210, 01/2017, Volume 25, Issue 1, pp. 238 - 246
The generation of significant power droop (PD) during at-speed test performed by Logic Built-In Self Test (LBIST) is a serious concern for modern ICs. In fact,... 
microprocessor | Logic BIST (LBIST) | Latches | Correlation | power droop (PD) | Microprocessors | test | Built-in self-test | Delays | Circuit faults | Clocks | COMPUTER SCIENCE, HARDWARE & ARCHITECTURE | ENGINEERING, ELECTRICAL & ELECTRONIC | Integrated circuits | Faults | Reduction | Electronics industry | Delay
Journal Article
Journal of Advanced Research in Dynamical and Control Systems, 2017, Volume 9, Issue 14, pp. 561 - 567
Journal Article
International Journal of Engineering and Advanced Technology, 04/2019, Volume 8, Issue 4, pp. 624 - 629
Journal Article
International Journal of Applied Engineering Research, ISSN 0973-4562, 12/2015, Volume 10, Issue 23, pp. 43866 - 43872
Journal Article
IEEE Transactions on Very Large Scale Integration (VLSI) Systems, ISSN 1063-8210, 09/2017, Volume 25, Issue 9, pp. 2602 - 2615
Test points are inserted into integrated circuits to increase fault coverage especially in logic built-in self-test schemes. Commercial tools have been... 
logic built-in self-test (LBIST) | Estimation | Tools | Built-in self-test | Area overhead | test coverage | test point insertion (TPI) | testability | Timing | Circuit faults | Optimization | COMPUTER SCIENCE, HARDWARE & ARCHITECTURE | ENGINEERING, ELECTRICAL & ELECTRONIC
Journal Article
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, ISSN 0278-0070, 06/2019, Volume 38, Issue 6, pp. 1028 - 1041
Journal Article
International Journal of Applied Engineering Research, ISSN 0973-4562, 2015, Volume 10, Issue 10, pp. 26221 - 26229
Journal Article
Journal of Signal Processing Systems, ISSN 1939-8018, 2016
The threat of hardware Trojans has been widely recognized by academia, industry, and government agencies. A Trojan can compromise security of a system in spite... 
hardware security | Data- och informationsvetenskap | Datorteknik | Naturvetenskap | hardware Trojan | LBIST | Natural Sciences | Computer and Information Sciences | Computer Engineering
Journal Article
Journal Article
International Journal of Applied Engineering Research, ISSN 0973-4562, 2015, Volume 10, Issue 3, pp. 7537 - 7551
Journal Article
2019 IEEE International Test Conference (ITC), 11/2019, pp. 1 - 6
Test Compression and logic built-in self-test (LBIST) are proven DFT solutions to address the quality and safety requirements of automotive electronics but... 
Physical Synthesis | LBIST | Test Compression
Conference Proceeding
IEEE Journal of Solid-State Circuits, ISSN 0018-9200, 01/2008, Volume 43, Issue 1, pp. 21 - 28
Journal Article
2019 IEEE 28th Asian Test Symposium (ATS), 12/2019, pp. 13 - 135
This article presents methods of increasing logic built-in self-test (LBIST) delay fault coverage using artificial neural networks (ANNs) to selecting test... 
lbist | intellectual property | test points | neural networks
Conference Proceeding
Journal Article
2012 IEEE 21st Asian Test Symposium, ISSN 1081-7735, 11/2012, pp. 2 - 2
With a large focus on test data size and fitting into tester's capabilities, sometimes the focus of field testing is pushed to the side. There is an emerging... 
USA Councils | Encounter Test | Automatic test pattern generation | Built-in self-test | Cadence | LBIST | Electronic mail | Logic testing | Automotive engineering
Conference Proceeding
2012 25th International Conference on VLSI Design, ISSN 1063-9667, 01/2012, pp. 394 - 399
In order for logic built-in-self-test (LBIST) to achieve coverages comparable with deterministic tests, multiple (and frequently many) seeds are often needed.... 
Logic gates | Automatic test pattern generation | LFSR-reseeding | Vectors | Polynomials | LBIST | SMT | Circuit faults | System-on-a-chip
Conference Proceeding
2018 International Conference on Advances in Computing, Communications and Informatics (ICACCI), 09/2018, pp. 2131 - 2135
LBIST will become a necessary part for Application Specific Standard Products (ASSPs) and complex business Integrated circuits. This paper aims to set up the... 
Legged locomotion | ASSP | Tools | Logic gates | LBIST | Pins | Circuit faults | Integrated circuit modeling | Testing
Conference Proceeding
2018 IEEE International Test Conference in Asia (ITC-Asia), 08/2018, pp. 37 - 42
As Advanced Driver Assistance Systems (ADAS) in cars become a reality, more electronic applications in the automotive space require periodic online testing.... 
Multicore processing | Random access memory | Process control | intest | Tools | ADAS | ASIL | processor | multicore | extest | Logic gates | LBIST | Safety | Testing | Multicore | Intest | Processor | Extest
Conference Proceeding
2019 14th International Conference on Design & Technology of Integrated Systems In Nanoscale Era (DTIS), 04/2019, pp. 1 - 6
In-field Self-Test of safety-critical devices becomes very important due to the stringent requirements introduced by the current standards such as IEC 61805... 
In-Field Testing | Safety-Critical | SBST | Built-in self-test | Software | Hardware | LBIST | Registers | Engines | Automotive engineering
Conference Proceeding
2019 3rd International Conference on Trends in Electronics and Informatics (ICOEI), 04/2019, pp. 174 - 178
Design for testing implies on adding an extra hardware to circuit under test so that the difficulty in testing the circuit becomes easy and large number of... 
Fault diagnosis | Fault coverage | Computer architecture | Logic gates | observation point | LBIST | Circuit faults | Test pattern generators | Observability | SCOAP
Conference Proceeding
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