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IEEE Transactions on Biomedical Circuits and Systems, ISSN 1932-4545, 10/2017, Volume 11, Issue 5, pp. 1111 - 1122
Journal Article
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, ISSN 0278-0070, 05/2011, Volume 30, Issue 5, pp. 732 - 745
Journal Article
IEEE transactions on biomedical circuits and systems, ISSN 1932-4545, 10/2017, Volume 11, Issue 5, pp. 1111 - 1122
Two brain signal acquisition (BSA) front-ends incorporating two CMOS ultra-low power low noise amplifier arrays and serializers operating in MOSFET weak... 
Electrocorticography (ECoG) | noise efficiency factor (NEF) | CMOS | analog front-end (AFE) | instrumentation amplifier (InAmp) | weak inversion (WI) region | operational transconductance amplifier (OTA) | power efficiency factor (PEF) | Electroencephalogram (EEG) | ultra-low power (ULP)
Journal Article
IEEE Micro, ISSN 0272-1732, 07/2013, Volume 33, Issue 4, pp. 66 - 75
Journal Article
IEEE Transactions on Very Large Scale Integration (VLSI) Systems, ISSN 1063-8210, 03/2015, Volume 23, Issue 3, pp. 580 - 583
Resistive open faults (ROFs) represent common manufacturing defects in IC interconnects and result in delay faults that cause timing failures and reliability... 
Integrated circuit interconnections | low power design | Very large scale integration | Detectability | multi-VDD test | Circuit faults | variability | Resistance | resistive opens | small delay faults | Delays | Integrated circuit modeling | Testing | COMPUTER SCIENCE, HARDWARE & ARCHITECTURE | DELAY TEST | OPEN DEFECTS | ENGINEERING, ELECTRICAL & ELECTRONIC
Journal Article
Microelectronics Reliability, ISSN 0026-2714, 05/2015, Volume 55, Issue 6, pp. 937 - 944
•Development and reliability of a platinum-based microheater with low power consumption.•The microhotplate consumes only 11.8mW when heated up to... 
Microhotplate | Bridge-type SiO2 membrane | Pt | Reliability | Low power consumption | Bridge-type SiO 2 membrane | SYSTEM | PHYSICS, APPLIED | MEMBRANE | PERFORMANCE | BEHAVIOR | NANOSCIENCE & NANOTECHNOLOGY | ENGINEERING, ELECTRICAL & ELECTRONIC | FILMS | MICRO-HOTPLATE | MICROHEATER | METAL | FABRICATION | OXIDE GAS SENSORS
Journal Article
Nuclear Inst. and Methods in Physics Research, A, ISSN 0168-9002, 05/2014, Volume 746, pp. 4 - 10
CLIC (compact linear collider) is a future e+e− collider based on normal-conducting technology, currently under study at CERN. Its design is based on a novel... 
PETS | RF low power test | Precision machining | Vacuum brazing | CLIC | INSTRUMENTS & INSTRUMENTATION | SPECTROSCOPY | NUCLEAR SCIENCE & TECHNOLOGY | PHYSICS, PARTICLES & FIELDS | Pets | Electron beams | Tanks | Detectors | Nuclear power generation | Tuning | Bars
Journal Article
Instruments and Experimental Techniques, ISSN 0020-4412, 05/2017, Volume 60, Issue 3, pp. 307 - 313
A new specialized MPD Test Beam setup was mounted at the extracted beam of the Nuclotron at the Joint Institute for Nuclear Research to carry out methodical... 
INSTRUMENTS & INSTRUMENTATION | LOW-POWER | ENGINEERING, MULTIDISCIPLINARY | Detectors | Research institutes
Journal Article
KSII Transactions on Internet and Information Systems, ISSN 1976-7277, 03/2017, Volume 11, Issue 3, pp. 1393 - 1405
It is well known that duty-cycling control by dynamically adjusting the polling interval according to the traffic loads can effectively achieve power saving in... 
Low power listening | Wireless sensor networks | Sequential hypothesis testing | COMPUTER SCIENCE, INFORMATION SYSTEMS | wireless sensor networks | TELECOMMUNICATIONS | sequential hypothesis testing | Control | Communications traffic | Research | Engineering research | 컴퓨터학
Journal Article
by Jia Li and Qiang Xu and Yu Hu and Xiaowei Li
IEEE Transactions on Very Large Scale Integration (VLSI) Systems, ISSN 1063-8210, 07/2010, Volume 18, Issue 7, pp. 1081 - 1092
Journal Article
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, ISSN 0278-0070, 11/2011, Volume 30, Issue 11, pp. 1762 - 1767
Journal Article
Journal of Electronic Testing, ISSN 0923-8174, 6/2014, Volume 30, Issue 3, pp. 329 - 341
Journal Article
Analog Integrated Circuits and Signal Processing, ISSN 0925-1030, 3/2017, Volume 90, Issue 3, pp. 625 - 638
Journal Article
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, ISSN 0278-0070, 07/2004, Volume 23, Issue 7, pp. 1142 - 1153
Journal Article
Plasma Processes and Polymers, ISSN 1612-8850, 05/2010, Volume 7, Issue 5, pp. 366 - 370
Journal Article
IEEE Transactions on Very Large Scale Integration (VLSI) Systems, ISSN 1063-8210, 03/2005, Volume 13, Issue 3, pp. 384 - 395
Reduction in test power is important to improve battery lifetime in portable electronic devices employing periodic self-test, to increase reliability of... 
Costs | scan design | Electronic equipment testing | Life testing | Combinational circuits | Batteries | Circuit testing | Logic testing | Delay | Flip-flops | Automatic testing | supply gating | Low power test | Scan design | Supply gating | DISSIPATION | low power test | COMPUTER SCIENCE, HARDWARE & ARCHITECTURE | LEAKAGE | ENGINEERING, ELECTRICAL & ELECTRONIC | Studies
Journal Article
IEICE Transactions on Information and Systems, ISSN 0916-8532, 2013, Volume E96.D, Issue 9, pp. 2003 - 2011
Test power has become a critical issue, especially for low-power devices with deeply optimized functional power profiles. Particularly, excessive capture power... 
low power test | at-speed testing | ATPG | test power reduction | IR-drop | Low power test | Test power reduction | At-speed testing | COMPUTER SCIENCE, SOFTWARE ENGINEERING | COMPUTER SCIENCE, INFORMATION SYSTEMS | POWER | Vectors (mathematics) | Devices | Circuits | Mathematical analysis | Time measurements | Failure
Journal Article
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