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Journal Article
Journal of clinical oncology, ISSN 1527-7755, 12/2014, Volume 32, Issue 34, pp. 3810 - 3816
Journal Article
PloS one, ISSN 1932-6203, 05/2012, Volume 7, Issue 5, pp. e37677 - e37677
Journal Article
09/2018, Devices, Circuits, and Systems, ISBN 9780367655952, 412
eBook
2015, Devices, circuits, and systems, ISBN 1466590831, Volume 39, xlii, 397
...: From Particles to Circuits addresses the problem of soft errors in digital integrated circuits subjected to the terrestrial natural radiation environment... 
Integrated circuits | Atmospheric radiation | Digital integrated circuits | Soft errors (Computer science) | Cosmic rays | Effect of radiation on | Circuits & Devices | Aerospace Engineering | Industrial Electronics | Particles | Engineering Sciences | Micro and nanotechnologies | Microelectronics
Book
01/2019, ISBN 303921280X
Research on radiation-tolerant electronics has increased rapidly over the past few years, resulting in many interesting approaches to modeling radiation effects and designing radiation-hardened... 
single event effects | n/a | radiation-hardening-by-design (RHBD) | frequency divider by two | single event upset | Image processing | CMOS analog integrated circuits | FPGA | total ionizing dose (TID) | Impulse Sensitive Function | soft error | hardening by design | radiation hardening by design | X-rays | duplex | triplex | line buffer | heavy ions | VHDL | FPGA-based digital controller | radiation hardening by design (RHBD) | radiation hardening | SRAM-based FPGA | proton irradiation | ring oscillator | sensor readout IC | fault tolerance | space application | physical unclonable function | voltage controlled oscillator (VCO) | Ring Oscillators | analog single-event transient (ASET) | single event opset (SEU) | SEB | single event upsets | bipolar transistor | total ionizing dose | protons | triple modular redundancy (TMR) | gain degradation | space electronics | saturation effect | configuration memory | Co-60 gamma radiation | total ionization dose (TID) | frequency synthesizers | CMOS | PLL | TDC | single-event upsets (SEUs) | bandgap voltage reference (BGR) | 4MR | single-shot | error rates | soft errors | heavy-ions | single-event effects (SEE) | single event transient (SET) | SEE testing | proton irradiation effects | RFIC | single event upset (SEU) | FMR | ionization | radiation tolerant | neutron irradiation effects | digital integrated circuits | single event gate rupture (SEGR) | power MOSFETs | ring-oscillator | selective hardening | voltage reference | nuclear fusion | TMR | gamma-rays | gamma ray | instrumentation amplifier | radiation effects | reference circuits | radiation-hardened
eBook
PloS one, ISSN 1932-6203, 10/2014, Volume 9, Issue 10, pp. e110464 - e110464
Journal Article
Journal Article