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Chung-kuo chi liang, 1900
Journal
2009, ISBN 9780849337604, xiii, 730
Handbook of Optical Metrology: Principles and Applicationsbegins by discussing key principles and techniques before exploring practical applications of optical... 
Metrology | Optical measurements
Book
Journal
Metrologia, ISSN 0026-1394, 04/2010, Volume 47, Issue 2, pp. 47 - 47
Journal Article
2017, De diversis artibus, ISBN 9782503568317, Volume tom 100 (n.s. 63), 652 pages
Book
Industrial metrology, ISSN 0921-5956, 1990
Journal
2014, Prima edizione., Storia della tecnologia italiana. Temi, personaggi e opere, ISBN 9788896764930, Volume 1o volume, xviii, 278
Book
NCSL International measure, ISSN 1931-5775, 2006
Journal
CIRP annals, ISSN 0007-8506, 2016, Volume 65, Issue 2, pp. 643 - 665
The field of Large-Scale Metrology has been studied extensively for many decades and represents the combination and competition of topics as diverse as geodesy... 
Metrology | Large-Scale Metrology | Modeling
Journal Article
Thin solid films, ISSN 0040-6090, 06/2015, Volume 584, pp. 176 - 185
Ellipsometric scatterometry has gained wide industrial applications in semiconductor manufacturing after ten years of development. Among the various types of... 
Depolarization | Mueller matrix ellipsometry | Nanometrology | Computational metrology | Optical scatterometry | Mueller matrix polarimetry | Nanostructure | Optical metrology | Broadband transmission | Integrated circuit fabrication | Case studies | Thin films | Semiconductors | Computation | Metrology | Instrumentation | Ellipsometers | Ellipsometry
Journal Article
Proceedings of the Institution of Mechanical Engineers, ISSN 0954-4062, 1989
Journal
2011, 4. Aufl., ISBN 9783527408115, xiv, 354
Raman spectroscopy is the inelastic scattering of light by matter. Being highly sensitive to the physical and chemical properties of materials, as well as to... 
Metrology | Raman spectroscopy | Nanostructured materials
Book
Measurement science & technology, ISSN 1361-6501, 07/2016, Volume 27, Issue 7, p. 072001
In this review, the use of x-ray computed tomography (XCT) is examined, identifying the requirement for volumetric dimensional measurements in industrial... 
additive manufacture | metrology | x-ray computed tomography | Engineering | Technology | Engineering, Multidisciplinary | Instruments & Instrumentation | Science & Technology
Journal Article
2017, History and philosophy of technoscience, ISBN 1848936028, Volume 9, xii, 262 pages
This collection offers a new understanding of the epistemology of measurement. The interdisciplinary volume explores how measurements are produced, for... 
Measurement | Metrology | History | History of Science & Technology | Philosophy of Science | Philosophy of Technology
Book
2012, ISBN 9814397946, xii, 450
Book
2013, ISBN 1439827990, xxvi, 638 pages
"Ultra-high resolution holograms are now finding commercial and industrial applications in such areas as holographic maps, 3D medical imaging, and consumer... 
Holography | TECHNOLOGY & ENGINEERING / Lasers & Photonics | Image processing | Digital techniques | SCIENCE / Physics
Book
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