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2005, ISBN 0387231161, xiv, 357
Introduction to Focused Ion Beams is geared towards techniques and applications. This is the only text that discusses and presents the theory directly related... 
Focused ion beams | Physics | Optical and Electronic Materials | Solid State Physics and Spectroscopy | Condensed Matter | Surfaces and Interfaces, Thin Films
Book
1994, ISBN 9780471582601, Volume 37., xiii, 324
Book
2011, 2nd, completely rev. and enlarged ed., ISBN 9783527320479, xxiv, 533
Surveying and comparing all techniques relevant for practical applications in surface and thin film analysis, this second edition of a bestseller is a vital... 
Thin films | Surfaces | Electron spectroscopy | Spectrum analysis | Analysis
Book
2012, World Scientific series in materials and energy, ISBN 9814322822, Volume 1-2, 2 v.
Book
2008, EMC 2008 14th European Microscopy Congress 1-5 September 2008, Aachen, Germany, ISBN 9783540851561, Volume 1
Web Resource
Microscopica acta, ISSN 0342-958X, 1977
Journal
Analytical Chemistry, ISSN 0003-2700, 10/2016, Volume 88, Issue 20, pp. 10284 - 10289
We report the crucial components required to perform scanning electrochemical microscopy (SECM) with nanometer-scale resolution. The construction and... 
CELLS | CHEMISTRY, ANALYTICAL | FORCE | MODE | SECM | TIP | PROBE | Usage | Research | Structure | Scanning microscopy | Nanotechnology | Nanoparticles | Analytical chemistry | Scanning electron microscopy | Electrocatalysis | Experiments | Construction | Scanning | Microscopy | Instrumentation | Hardware | Nanostructure | Chambers
Journal Article
by Birk, G
1984, ISBN 9780959105506, 120 p., [8] p. of plates
Book
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