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Nano Letters, ISSN 1530-6984, 11/2010, Volume 10, Issue 11, pp. 4405 - 4408
Journal Article
Ultramicroscopy, ISSN 0304-3991, 05/2015, Volume 152, pp. 57 - 62
We present results from an aberration corrected scanning transmission electron microscope which has been customised for high resolution quantitative Lorentz... 
Differential phase contrast | Aberration correction | Lorentz microscopy | Magnetic thin films | ELEMENTS | RESOLUTION | MICROSCOPY | STEM | Magnetism | Magnetization | Electron microscopy | Transmission electron microscopes | Scanning electron microscopy | Microscopy | Imaging | Customizing | Instrumentation | Hardware | Aberration | Magnetic fields
Journal Article
Chemical Communications, ISSN 1359-7345, 4/2014, Volume 5, Issue 38, pp. 4873 - 488
One of the experimental challenges in the study of nanomaterials in liquids in the (scanning) transmission electron microscope ((S)TEM) is gaining quantitative... 
IN-SITU OBSERVATION | NANOPARTICLES | IMAGING PROTEIN | GROWTH | RESOLUTION | NANOMATERIALS | DYNAMICS | NUCLEATION | CELL | CHEMISTRY, MULTIDISCIPLINARY | WATER | Scanning electron microscopy | Electric potential | Liquids | Transmission electron microscopy | Imaging | Voltage | Nanomaterials | Optimization
Journal Article
Nature Methods, ISSN 1548-7091, 2014, Volume 11, Issue 4, pp. 423 - 428
Journal Article
1998, Royal Microscopical Society microscopy handbooks, ISBN 9781859960660, Volume 39., xii, 114
Book
Acta Crystallographica Section B, ISSN 2052-5206, 08/2019, Volume 75, Issue 4, pp. 475 - 484
Journal Article
NANO LETTERS, ISSN 1530-6984, 03/2010, Volume 10, Issue 3, pp. 1028 - 1031
Journal Article
Journal of Physics D: Applied Physics, ISSN 0022-3727, 04/2018, Volume 51, Issue 20, p. 205104
We report a path-separated electron interferometer within a scanning transmission electron microscope. In this setup, we use a nanofabricated grating as an... 
electron microscopy | scanning transmission electron microscopy | electron holography | electron interferometry | PHYSICS, APPLIED | HOLOGRAPHY | IMAGE | HIGH-RESOLUTION | DIFFRACTION | Physics
Journal Article
Ultramicroscopy, ISSN 0304-3991, 2010, Volume 110, Issue 7, pp. 903 - 923
We explore the dynamics of image formation in the so-called annular bright field mode in scanning transmission electron microscopy, whereby an annular detector... 
Annular bright field (ABF) | Scanning transmission electron microscopy (STEM) | High angle annular dark field (HAADF) | S-STATE MODEL | PHASE-CONTRAST | RESOLUTION | DETECTOR | CRYSTALS | DIFFRACTION | TILT | ADF-STEM | MICROSCOPY | Electron microscopy | Detectors | Scanning electron microscopy | Dynamics | Annular | Imaging | Images | Scanning transmission electron microscopy | Image contrast
Journal Article
ULTRAMICROSCOPY, ISSN 0304-3991, 05/2017, Volume 176, pp. 112 - 131
Cathodoluminescence (CL) is a powerful tool for the investigation of optical properties of materials. In recent years, its combination with scanning... 
TRANSITION RADIATION | DISLOCATIONS | DEFECTS | OPTICAL-PROPERTIES | Quantum emitters | LOCALIZED SURFACE-PLASMONS | NANOSTRUCTURES | SINGLE-PHOTON EMISSION | Cathodoluminescence | MICROSCOPY | STEM | Nano-optics | ENERGY-LOSS SPECTROSCOPY | Band gap measurements | LIGHT-EMISSION | Plasmonics | QUANTUM-WELLS
Journal Article
Applied Physics Letters, ISSN 0003-6951, 11/2009, Volume 95, Issue 19, pp. 191913 - 191913-3
We show that an annular detector placed within the bright field cone in scanning transmission electron microscopy allows direct imaging of light elements in... 
DIFFRACTION | PHYSICS, APPLIED | TRANSMISSION ELECTRON MICROSCOPY | CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS | CONES | IMAGES | RESOLUTION | CRYSTALS | ATOMS | SIMULATION | VISIBLE RADIATION | SCATTERING | THICKNESS
Journal Article
Ultramicroscopy, ISSN 0304-3991, 03/2014, Volume 138, pp. 28 - 35
We report the development of revolving scanning transmission electron microscopy – RevSTEM – a technique that enables characterization and removal of sample... 
Revolving STEM (RevSTEM) | Drift correction | Scanning transmission electron microscopy (STEM) | Projective standard deviation (PSD) | Image distortion | Signal to noise ratio | Z-CONTRAST | MICROSCOPY | Revolving STEM (ReySTEM) | STEM | Electron microscopy | Structure | Analysis | Crystals
Journal Article
Ultramicroscopy, ISSN 0304-3991, 02/2016, Volume 161, pp. 146 - 160
Journal Article
Ultramicroscopy, ISSN 0304-3991, 03/2018, Volume 186, pp. 49 - 61
The new capabilities of a FEG scanning electron microscope (SEM) equipped with a scanning transmission electron microscopy (STEM) detector for defect... 
STEM | ALUMINUM | DISLOCATIONS | FILMS | CHANNELING CONTRAST | ALLOYS | SILICON | DIFFRACTION | SEM | MICROSCOPY
Journal Article
Ultramicroscopy, ISSN 0304-3991, 05/2018, Volume 188, pp. 1 - 7
The performance of the detector is of key importance for low-dose imaging in transmission electron microscopy, and counting every single electron can be... 
Low-dose | Electron counting | STEM | Single electron signal | PARTICLE CRYO-EM | GRAPHENE | MICROSCOPY | ATOMIC-RESOLUTION | SPECIMENS | MOTION | EXPOSURES | RADIATION-DAMAGE | TEM | Electron microscopy | Transmission electron microscopes | Algorithms
Journal Article