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2001, Oxford series in electrical and computer engineering, ISBN 9780195140163, xx, 684
Book
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, ISSN 0278-0070, 3/2019, Volume Early Access, pp. 1 - 1
Analog/RF built-in test (BIT) techniques are essential for reducing the very high costs of specification-based tests and for high-safety applications. The... 
Measurement | Monte Carlo methods | test metrics | Computational modeling | Analog/RF test | Extreme Value Theory | Estimation | Probability density function | Circuit faults | Integrated circuit modeling | probability density estimation | Engineering Sciences | Micro and nanotechnologies | Microelectronics
Journal Article
Journal Article
2017 IEEE International Test Conference (ITC), ISSN 1089-3539, 10/2017, Volume 2017-, pp. 1 - 8
Through four use cases with examples, we describe how IEEE 1687 can be extended to include analog and mixed-signal chips, including linkage to circuit... 
Semiconductor device measurement | analog test | ATE | IEEE 1687 | Instruments | Biological system modeling | Analog circuits | Built-in self-test | System-on-chip | mixed signal test | Mixed signal test | Analog test
Conference Proceeding
2017 IEEE 26th Asian Test Symposium (ATS), ISSN 1081-7735, 11/2017, pp. 184 - 188
In this paper, we propose a test and debug methodology to support at-speed testing of the high-speed mixed signal JESD204B Receiver Physical Layer (JESD204B Rx... 
JESD204B | PHY ATPG | Receivers | Built-in self-test | High Speed Serial Link | Mixed Signal BIST | Generators | Circuit faults | Phase locked loops | Clocks
Conference Proceeding
JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE, ISSN 1598-1657, 2016, Volume 16, Issue 5, pp. 713 - 718
Predicting precise specifications of differential mixed-signal circuits is a difficult problem, because analytically derived correlation between process... 
ADC | Digital-to-analog converter | Analog-to-digital converter | Mixed-signal testing | DAC | mixed-signal testing | PHYSICS, APPLIED | digital-to-analog converter | analog-to-digital converter | ENGINEERING, ELECTRICAL & ELECTRONIC
Journal Article
Integration, the VLSI Journal, ISSN 0167-9260, 09/2016, Volume 55, pp. 415 - 424
Journal Article
Yi Qi Yi Biao Xue Bao/Chinese Journal of Scientific Instrument, ISSN 0254-3087, 12/2016, Volume 37, pp. 94 - 101
Journal Article
IEEE Transactions on Instrumentation and Measurement, ISSN 0018-9456, 06/2011, Volume 60, Issue 6, pp. 2014 - 2024
Journal Article
IEEE Transactions on Nanotechnology, ISSN 1536-125X, 07/2013, Volume 12, Issue 4, pp. 486 - 497
Journal Article
Journal Article
IEEE Transactions on Circuits and Systems II: Express Briefs, ISSN 1549-7747, 11/2012, Volume 59, Issue 11, pp. 785 - 789
Precisely measuring specifications of differential analog and mixed-signal circuits is a difficult problem for self-test development because the imbalance... 
Radio frequency | loopback test | Noise | Analog-to-digital converter (ADC) | digital-to-analog converter (DAC) | differential mixed-signal testing | Built-in self-test | Capacitance | Harmonic analysis | Generators | Principal component analysis | ENGINEERING, ELECTRICAL & ELECTRONIC | Nonlinear equations | Specifications | Circuits | High speed | Hardware | Spectra | Arrays
Journal Article
2016 IEEE International Test Conference (ITC), ISSN 1089-3539, 11/2016, pp. 1 - 9
The growing number of chips in automotive applications has created an increasing urge to avoid electronic failures in the field. Part Average Testing (PAT) is... 
Integrated circuits | Industries | part average testing | automotive mixed signal | Circuit faults | Vehicle dynamics | Probes | analog fault coverage | Testing
Conference Proceeding
Computer Applications in Engineering Education, ISSN 1061-3773, 11/2016, Volume 24, Issue 6, pp. 905 - 913
Journal Article
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