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2003, IEE electrical measurement series, ISBN 0852969996, Volume 11, xxix, 645
To obtain the full value from instrumentation, users require familiarity with a number of basic concepts and an understanding of how those building blocks... 
Electronic instruments | Testing | Electronic instruments -- Testing | Electronic instruments--Testing | Engineering instruments
Book
2001, Oxford series in electrical and computer engineering, ISBN 9780195140163, xx, 684
Book
Journal of Electronic Testing, ISSN 0923-8174, 4/2016, Volume 32, Issue 2, pp. 209 - 225
Journal Article
Journal of Electronic Testing: Theory and Applications (JETTA), ISSN 0923-8174, 06/2017, Volume 33, Issue 3, pp. 315 - 328
Journal Article
2016 IEEE International Test Conference (ITC), ISSN 1089-3539, 11/2016, pp. 1 - 9
The growing number of chips in automotive applications has created an increasing urge to avoid electronic failures in the field. Part Average Testing (PAT) is... 
Integrated circuits | Industries | part average testing | automotive mixed signal | Circuit faults | Vehicle dynamics | Probes | analog fault coverage | Testing
Conference Proceeding
IEEE Transactions on Very Large Scale Integration (VLSI) Systems, ISSN 1063-8210, 10/2011, Volume 19, Issue 10, pp. 1765 - 1774
Journal Article
2016 IEEE International Test Conference (ITC), ISSN 1089-3539, 11/2016, pp. 1 - 9
The detection level of defects in today's mixed-signal ICs lags behind the extremely high demand of industries such as automotive. This is mainly because... 
open-gate defect | Metals | Logic gates | Analog circuits | fault modeling | Capacitance | mixed-signal test | Semiconductor process modeling | Transistors | Circuit faults | open defects | defect-oriented test
Conference Proceeding
ETRI Journal, ISSN 1225-6463, 02/2013, Volume 35, Issue 1, pp. 109 - 119
Static testing of analog‐to‐digital (A/D) and digital‐to‐analog (D/A) converters becomes more difficult when they are embedded in a system on chip. Built‐in... 
Mixed‐signal testing | A/D converter | static testing | D/A converter | BIST | Mixed-signal testing | Static testing | TELECOMMUNICATIONS | ENGINEERING, ELECTRICAL & ELECTRONIC
Journal Article
Applied Mechanics and Materials, ISSN 1660-9336, 08/2013, Volume 380-384, pp. 3378 - 3381
The embedded digital-analog mixed-signal circuit testing has become one of the difficulties to be solved. In this paper, a SoC embedded ADC has been tested... 
ADC testing | ATE | Mixed-signal | SoC
Journal Article
Journal of Electronic Testing, ISSN 0923-8174, 10/2012, Volume 28, Issue 5, pp. 571 - 584
Journal Article
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