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Journal of Electronic Testing, ISSN 0923-8174, 12/2010, Volume 26, Issue 6, pp. 641 - 658
Journal Article
2008 17th Asian Test Symposium, ISSN 1081-7735, 11/2008, pp. 43 - 48
We propose a testing methodology for analog and radio-frequency (RF) circuitry that incorporates digital circuits for performance calibration and adaptation.... 
mixed-signal testing | Circuit optimization | Costs | self-tuning circuit | Length measurement | Design for testability | Time measurement | Calibration | Circuit testing | Radio frequency | Automatic testing | Production | digital calibration | RF testing | analog testing | Analog testing | Mixed-signal testing | Digital calibration | Self-tuning circuit
Conference Proceeding
JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, ISSN 0923-8174, 10/2012, Volume 28, Issue 5, pp. 571 - 584
High pin count packaging and 3D IC technology make testing such advanced ICs more and more difficult and expensive. The HOY wireless test platform provides an... 
Design-for-testability (DfT) | DESIGN | PROTOTYPE | Analog-to-digital converter (ADC) | Analog and mixed-signal test | OSCILLATOR | Sigma-Delta modulation | ENGINEERING, ELECTRICAL & ELECTRONIC | SCHEME | Built-in self-test (BIST) | SIGMA | Wireless test | SELF-TEST
Journal Article
2006, 430
Part of "Frontiers in Electronic Testing" book series, this book focuses on the evolution of test technology, and provides insight about the abiding importance... 
Electronics | Electronic circuits | Testing
eBook
2014 IEEE 32nd VLSI Test Symposium (VTS), ISSN 1093-0167, 04/2014, pp. 1 - 6
This paper describes an on-chip intellectual property (IP) testing platform, Universal High Frequency Test structure (UHFTs), which makes logic, memory, and... 
Buffer storage | flexible | high speed | Digital/analog/mixed-signal | Built-in self-test | on-chip tester | System-on-chip | IP networks | Phase locked loops | universal | Clocks | CMOS | Platforms | Digital | High frequencies | Corners | Buffers | Standards
Conference Proceeding
Journal of Electronic Testing, ISSN 0923-8174, 12/2015, Volume 31, Issue 5, pp. 479 - 489
Journal Article
Journal of Electronic Testing, ISSN 0923-8174, 12/2009, Volume 25, Issue 6, pp. 301 - 308
For mixed-signal cores on System-on-a-Chip (SoC) platforms, the current methodology in test development is to use special test modes for block isolation such... 
Engineering | Computer-Aided Engineering (CAD, CAE) and Design | SoC test | Circuits and Systems | Mixed-signal test | Embedded system test | Electrical Engineering | ENGINEERING, ELECTRICAL & ELECTRONIC | Integrated circuits | Embedded systems | Semiconductors | Product life cycle | Testing
Journal Article
IEEE Transactions on Instrumentation and Measurement, ISSN 0018-9456, 04/2004, Volume 53, Issue 2, pp. 602 - 611
Journal Article
Journal of Electronic Testing, ISSN 0923-8174, 2/2007, Volume 23, Issue 1, pp. 85 - 94
In this paper, testing of radio frequency (RF) devices with mixed-signal testers is discussed. General purpose automatic test equipment (ATE) will be used. In... 
Engineering | mixed signal | ATE | DFT | Computer-Aided Engineering (CAD, CAE) and Design | Circuits and Systems | IC testing | Electronic and Computer Engineering | Mixed signal | ENGINEERING, ELECTRICAL & ELECTRONIC | Radio frequency
Journal Article
Journal Article
2009 27th IEEE VLSI Test Symposium, ISSN 1093-0167, 05/2009, pp. 291 - 296
Modern mixed-signal/RF circuits with digital calibration capabilities could achieve significant performance improvements once the calibration process is... 
Algorithm design and analysis | mixed-signal testing | Energy consumption | least-mean-square (LMS) adapatation | Circuit simulation | Built-in self-test | Very large scale integration | ADC testing | Calibration | Circuit testing | Convergence | Radio frequency | calibratoin acceleration | Computer industry | digital calibration
Conference Proceeding
2010 28th VLSI Test Symposium (VTS), ISSN 1093-0167, 04/2010, pp. 289 - 294
Conference Proceeding
IEEE Transactions on Electromagnetic Compatibility, ISSN 0018-9375, 06/2015, Volume 57, Issue 3, pp. 339 - 348
Journal Article
IEEE Transactions on Instrumentation and Measurement, ISSN 0018-9456, 12/2001, Volume 50, Issue 6, pp. 1485 - 1489
Journal Article
29th VLSI Test Symposium, ISSN 1093-0167, 05/2011, pp. 315 - 320
Output variation testing of TFT-LCD source driver ICs is very expensive and time-consuming due to the large amount of analog output channels and levels to... 
Integrated circuits | mixed-signal testing | TFT-LCD | Voltage measurement | Accuracy | source driver | built-in self-testing | Built-in self-test | sigma-delta modulation | Driver circuits | Clocks
Conference Proceeding
Journal of Electronic Testing, ISSN 0923-8174, 12/2007, Volume 23, Issue 6, pp. 581 - 592
This paper describes measurement methods for testing discrete semiconductors in the environment defined by the IEEE 1149.4 standard for a mixed-signal bus.... 
Engineering | 1149.4 | Computer-Aided Engineering (CAD, CAE) and Design | Circuits and Systems | Boundary scan | Discrete semiconductors | Electronic and Computer Engineering | MIXED-SIGNAL TEST | boundary scan | discrete semiconductors | ENGINEERING, ELECTRICAL & ELECTRONIC | Circuit components | Methods | Semiconductor industry | Semiconductors
Journal Article
Integration, the VLSI Journal, ISSN 0167-9260, 2005, Volume 38, Issue 4, pp. 579 - 596
This paper presents a simple built-in current sensor (BICS) design for quiescent current ( I DDQ) testing of CMOS data converter circuits. The proposed BICS... 
CMOS data converter testing | CMOS mixed-signal IC testing | Built-in current sensor (BICS) | IDDQ testing | CIRCUITS | I-DDQ testing | COMPUTER SCIENCE, HARDWARE & ARCHITECTURE | built-in current sensor (BICS) | ANALOG | SELF-TEST | ENGINEERING, ELECTRICAL & ELECTRONIC
Journal Article
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