X
Search Filters
Format Format
Format Format
X
Sort by Item Count (A-Z)
Filter by Count
Journal Article (316) 316
Conference Proceeding (237) 237
Publication (40) 40
Book / eBook (28) 28
Dissertation (28) 28
Web Resource (11) 11
Book Chapter (8) 8
Magazine Article (2) 2
Standard (1) 1
more...
Subjects Subjects
Subjects Subjects
X
Sort by Item Count (A-Z)
Filter by Count
engineering, electrical & electronic (210) 210
testing (124) 124
circuit testing (118) 118
circuits (92) 92
engineering (92) 92
built-in self-test (76) 76
circuits and systems (76) 76
mixed-signal test (72) 72
circuit faults (70) 70
mixed-signal testing (70) 70
integrated circuits (63) 63
computer science, hardware & architecture (59) 59
computer-aided engineering and design (58) 58
analog circuits (55) 55
electronic and computer engineering (55) 55
mixed-signal (48) 48
bist (45) 45
analog (43) 43
automatic testing (43) 43
electrical engineering (43) 43
system testing (42) 42
mixed signal circuits (38) 38
electronics (37) 37
analysis (36) 36
mixed-signal circuits (36) 36
design (34) 34
circuit simulation (33) 33
integrierte digitalschaltung (33) 33
microelectronics (32) 32
costs (31) 31
design engineering (31) 31
design and construction (30) 30
radio frequency (29) 29
signal processing (29) 29
cmos (28) 28
prüfung integrierter schaltungen (28) 28
design for testability (27) 27
simulation (27) 27
hardware (26) 26
mixed signal (26) 26
studies (26) 26
integrierte analogschaltung (25) 25
instruments & instrumentation (24) 24
monitoring (24) 24
engineering sciences (23) 23
algorithms (22) 22
electronic circuits (22) 22
fault diagnosis (22) 22
integrated circuit modeling (22) 22
integrated circuit testing (22) 22
linearity (22) 22
micro and nanotechnologies (22) 22
noise (22) 22
signal generators (22) 22
system-on-a-chip (22) 22
voltage (22) 22
adc (21) 21
clocks (21) 21
computer simulation (21) 21
analog-digital conversion (20) 20
filters (20) 20
research (20) 20
signalmischung (20) 20
usage (20) 20
[ spi.nano ] engineering sciences [physics]/micro and nanotechnologies/microelectronics (19) 19
cmos technology (19) 19
embedded systems (19) 19
fault detection (19) 19
signal, image and speech processing (19) 19
analog-to-digital converter (18) 18
devices (18) 18
production (18) 18
semiconductor chips (18) 18
switches (18) 18
analoge integrierte schaltung (17) 17
calibration (17) 17
digital (17) 17
digital circuits (17) 17
faults (17) 17
methods (17) 17
nanoscience & nanotechnology (17) 17
system-on-chip (17) 17
very large scale integration (17) 17
design-for-test (16) 16
operational amplifiers (16) 16
specifications (16) 16
analog integrated circuits (15) 15
analog test (15) 15
analogschaltung (15) 15
electronic books (15) 15
frequency (15) 15
phase locked loops (15) 15
standards (15) 15
design for test (14) 14
mathematical models (14) 14
performance evaluation (14) 14
signal design (14) 14
automatic test equipment (13) 13
capacitors (13) 13
diagnosis (13) 13
more...
Library Location Library Location
Language Language
Publication Date Publication Date
Click on a bar to filter by decade
Slide to change publication date range


Proceedings of the 50th Annual Design Automation Conference, ISSN 0738-100X, 05/2013, pp. 1 - 7
The high cost of testing certain analog, mixed-signal, and RF circuits has driven in the recent years the development of alternative low-cost tests to replace... 
test metrics | statistical blockade | analog/mixed-signal/RF IC testing | extreme value theory | Measurement | Maximum likelihood estimation | Monte Carlo methods | Integrated circuit modeling | Standards | Analog/mixed-signal/RF IC testing | Testing | Extreme value theory | Test metrics | Statistical blockade
Conference Proceeding
Journal of Electronic Testing, ISSN 0923-8174, 6/2019, Volume 35, Issue 3, pp. 317 - 334
Journal Article
2018 International Electrical Engineering Congress (iEECON), 03/2018, pp. 1 - 4
This paper presents and tests a new design concept for a swept frequency module for improved eddy current testing. The module consists of a programmable swept... 
Swept frequency model | AD5933 | Metals | mixed-signal integrated circuit | Impedance | Probes | Eddy current testing | Testing | Graphical user interfaces | Matlab
Conference Proceeding
JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE, ISSN 1598-1657, 2016, Volume 16, Issue 5, pp. 713 - 718
Predicting precise specifications of differential mixed-signal circuits is a difficult problem, because analytically derived correlation between process... 
ADC | Digital-to-analog converter | Analog-to-digital converter | Mixed-signal testing | DAC | mixed-signal testing | PHYSICS, APPLIED | digital-to-analog converter | analog-to-digital converter | ENGINEERING, ELECTRICAL & ELECTRONIC
Journal Article
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, ISSN 0278-0070, 04/2012, Volume 31, Issue 4, pp. 597 - 609
Journal Article
Journal of Electronic Testing, ISSN 0923-8174, 6/2002, Volume 18, Issue 3, pp. 333 - 342
Pseudo-random testing techniques for mixed-signal circuits offer several advantages compared to explicit time-domain and frequency-domain test methods,... 
pseudo-random test | Engineering | mixed-signal test | circuit signature | Computer-Aided Engineering (CAD, CAE) and Design | Electronic and Computer Engineering | Mixed-signal test | Pseudo-random test | Circuit signature | ENGINEERING, ELECTRICAL & ELECTRONIC | Studies
Journal Article
Journal of Electronic Testing, ISSN 0923-8174, 12/2012, Volume 28, Issue 6, pp. 857 - 863
Journal Article
IEEE Transactions on Emerging Topics in Computing, ISSN 2168-6750, 12/2017, pp. 1 - 1
We present a theory and design techniques for polynomial division circuits with the primary focus on testing of digital and mixed-signal devices. We estimate... 
algebraic error-control code | cryptography | Generators | Encoding | arithmetic error-control code | Complexity theory | Decoding | Circuit faults | Polynomial division circuit | Systematics | digital system test | mixed-signal system test | signature analyzer | digital broadcasting | Testing
Journal Article
IEEE Transactions on Circuits and Systems II: Express Briefs, ISSN 1549-7747, 02/2016, Volume 63, Issue 2, pp. 121 - 125
Journal Article
Journal of Electronic Testing, ISSN 0923-8174, 4/2001, Volume 17, Issue 2, pp. 139 - 147
Journal Article
Electronics and Communications in Japan (Part II: Electronics), ISSN 8756-663X, 08/2003, Volume 86, Issue 8, pp. 1 - 11
This paper describes multitone curve‐fitting algorithms for accurate determination of intermodulation distortion products in the multitone testing of ADCs used... 
ADC | multitone signal | sine curve fitting | intermodulation distortion | mixed‐signal LSI tester | Mixed-signal LSI tester | Intermodulation distortion | Multitone signal | Sine curve fitting | mixed-signal LSI tester | ENGINEERING, ELECTRICAL & ELECTRONIC
Journal Article
2006, Frontiers in electronic testing, ISBN 1402053150, Volume 36
Web Resource
IEEE Transactions on Instrumentation and Measurement, ISSN 0018-9456, 10/1999, Volume 48, Issue 5, pp. 978 - 985
Journal Article
Proceedings of SPIE - The International Society for Optical Engineering, ISSN 0277-786X, 2015, Volume 9608
Conference Proceeding
2016 IEEE 25th Asian Test Symposium (ATS), ISSN 1081-7735, 11/2016, pp. 96 - 101
We present a methodology for algorithmic generation of test signals for the detection and diagnosis of a variety of short and open-circuit defects in analog... 
Algorithm design and analysis | Heuristic algorithms | Analog circuits | Mixed-Signal | Circuit faults | Trojans | Optimization | Fault detection | Analog | Capacitance | Integrated circuit modeling | Testing | Defect detection
Conference Proceeding
2016 Conference on Design of Circuits and Integrated Systems (DCIS), 11/2016, pp. 1 - 6
This work proposes a criterion to select a subset of indirect measurements avoiding redundant information. The key idea of the proposal is to reduce the actual... 
Correlation | Pairwise error probability | Indirect Measurements | Redundancy | Quadtrees | Mixed-Signal Test | Signature Selection | Biquad Filter | Proposals | Analog Test | Alternate Test | Test Metrics | Band-pass filters | Current measurement | Octrees | Measurements Selection | Alternate Feature Selection | Testing | Analog Filter
Conference Proceeding
No results were found for your search.

Cannot display more than 1000 results, please narrow the terms of your search.