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IEE PROCEEDINGS-G CIRCUITS DEVICES AND SYSTEMS, ISSN 0956-3768, 04/1992, Volume 139, Issue 2, pp. 231 - 233
The paper describes work at the Polytechnic technic of Huddersfield on SERC/DTI research project IED 2/1/2121 conducted in collaboration with GEC-Plessey... 
MIXED-SIGNAL ICS | GENERIC TESTING | K IQ ENGINEERING, ELECTRICAL & ELECTRONIC | INTEGRATED CIRCUITS | ENGINEERING, ELECTRICAL & ELECTRONIC
Journal Article
Digest of Papers Eleventh Annual 1993 IEEE VLSI Test Symposium, 1993, pp. 66 - 69
The theory of digital self-checking circuits has been developed in order to make formal the techniques of designing digital circuits allowing one to ensure... 
Automatic testing | Electronics industry | Pulp manufacturing | Built-in self-test | Time measurement | Circuit faults | Circuit testing | Integrated circuit reliability | Signal design | Digital circuits
Conference Proceeding
38th Midwest Symposium on Circuits and Systems. Proceedings, 1995, Volume 2, pp. 1145 - 1150 vol.2
The increasing complexity of analogue/mixed-signal integrated circuits is leading test engineers to propose self-test capabilities for these types of circuits.... 
Costs | Automatic testing | Integrated circuit testing | Built-in self-test | Hardware | Circuit faults | Test equipment | Mixed analog digital integrated circuits | Circuit testing | Analog-digital conversion
Conference Proceeding
IEICE transactions on information and systems, ISSN 0916-8532, 07/1995, Volume 78, Issue 7, pp. 845 - 852
Current testing has been proposed as an alternative technique for testing fully CMOS digital LSIs. Current testing has higher fault coverage than conventional... 
DIGITAL AND MIXED-SIGNAL CIRCUIT TESTING | COMPUTER SCIENCE, INFORMATION SYSTEMS | BUILT-IN TEST | DESIGN FOR TESTABILITY | CURRENT TESTING (I-DDQ TESTING)
Journal Article
Conference Proceeding
Proceedings of the 1995 European conference on design and test, 03/1995, pp. 458 - 463
Conference Proceeding
38th Midwest Symposium on Circuits and Systems. Proceedings, 1995, Volume 2, pp. 1151 - 1156 vol.2
For many years, on-line testing techniques have been developed for digital circuits using error-detecting codes. More recently, some approaches on concurrent... 
Performance evaluation | Fabrication | System testing | Analog circuits | Signal processing | Hardware | Circuit faults | Mixed analog digital integrated circuits | Circuit testing | Digital circuits
Conference Proceeding
Conference Proceeding
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, ISSN 0278-0070, 05/1995, Volume 14, Issue 5, pp. 607 - 612
The design of checkers aimed at the concurrent test of analog and mixed-signal circuits is considered in this paper. These checkers can on-line test duplicated... 
System testing | Automatic testing | Laboratories | Redundancy | Analog circuits | Signal generators | Safety | Circuit faults | Circuit testing | Monitoring | COMPUTER SCIENCE, HARDWARE & ARCHITECTURE | Computers | Fault location (Engineering) | Equipment and supplies | Tolerance (Engineering) | Circuits | Analysis | Engineering Sciences | Micro and nanotechnologies | Microelectronics
Journal Article
IEEE Transactions on Components, Packaging, and Manufacturing Technology: Part B, ISSN 1070-9894, 02/1995, Volume 18, Issue 1, pp. 13 - 17
Journal Article
IEICE transactions on information and systems, ISSN 0916-8532, 07/1995, Volume 78, Issue 7, pp. 853 - 860
This paper deals with the problems in testing large mixed-signal ICs. To help generating test patterns of these larger mixed-signal circuits for a functional... 
COMPUTER SCIENCE, INFORMATION SYSTEMS | FAULT-SIMULATION | TEST | FAULT-MODEL | MIXED-SIGNAL CIRCUIT
Journal Article
Analog Integrated Circuits and Signal Processing, ISSN 0925-1030, 09/1995, Volume 8, Issue 2, pp. 201 - 207
Transient Response Testing (TRT) has been shown to be a viable technique for determining the functionality of a linear circuit element [1] [2] [3] [4]. The... 
mixed-signal test | filters | correlation | transient response analysis | MIXED-SIGNAL TEST | CORRELATION | COMPUTER SCIENCE, HARDWARE & ARCHITECTURE | TRANSIENT RESPONSE ANALYSIS | FILTERS | ENGINEERING, ELECTRICAL & ELECTRONIC
Journal Article
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