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Diffusion and defect data, ISSN 0377-6883
Journal
Nano letters, ISSN 1530-6984, 06/2013, Volume 13, Issue 6, pp. 2615 - 2622
point defects | dislocation | first-principles calculations | edge reconstruction | grain boundary | Monolayer molybdenum sulfide | atomic resolution imaging | Materials Science | Materials Science, Multidisciplinary | Physics, Condensed Matter | Science & Technology - Other Topics | Chemistry, Physical | Physics | Science & Technology | Physics, Applied | Physical Sciences | Chemistry | Nanoscience & Nanotechnology | Technology | Chemistry, Multidisciplinary | Molecular electronics, nanoelectronics | Exact sciences and technology | Condensed matter: structure, mechanical and thermal properties | Electron states and collective excitations in thin films, multilayers, quantum wells, mesoscopic and nanoscale systems | Electronics | Condensed matter: electronic structure, electrical, magnetic, and optical properties | Low-dimensional structures (superlattices, quantum well structures, multilayers): structure, and nonelectronic properties | Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties) | Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices | Optical properties and condensed-matter spectroscopy and other interactions of matter with particles and radiation | Optical properties of low-dimensional, mesoscopic, and nanoscale materials and structures | Applied sciences | Electronic structure and electrical properties of surfaces, interfaces, thin films and low-dimensional structures | Grain boundaries | Crystal defects | Molybdenum disulfide | Point defects | Semiconductors | Graphene | Monolayers | Dislocations
Journal Article
Journal Article
11.