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IEEE Transactions on Components, Packaging and Manufacturing Technology, ISSN 2156-3950, 11/2016, Volume 6, Issue 11, pp. 1677 - 1686
Journal Article
Journal of Membrane Science, ISSN 0376-7388, 08/2019, Volume 584, pp. 181 - 190
.... For green fabrication of pore-filling anion exchange membranes (PAEMs), we optimized the process parameters such as pretreatment time, impregnation time, water amount, and photo-polymerization rate of each step using roll to roll (R2R) equipment... 
Green fabrication | R2R equipment | Pore filling | Photopolymerization | Anion-exchange membrane | ENGINEERING, CHEMICAL | POLYMER SCIENCE | PERFORMANCE | REVERSE ELECTRODIALYSIS | FILLED MEMBRANES | Polyethylene terephthalate | Polymerization | Usage
Journal Article
23rd International Display Workshops in conjunction with Asia Display, IDW/AD 2016, 2018, Volume 4, pp. 2121 - 2123
Conference Proceeding
2018 29th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC), 04/2018, pp. 346 - 352
Conference Proceeding
Journal of the Imaging Society of Japan, ISSN 1344-4425, 01/2017, Volume 56, Issue 6, p. 611
Printed electronics is technology for manufacturing electronic circuits, sensors and elements by applying coating and printing technology. Typical devices of... 
Electronic devices | Circuits | Ink jet printers | Electronics | Inkjet printing | Universe | Biosensors | Photolithography | Electronic circuits | Substrates | Radio frequency identification
Journal Article
23rd International Display Workshops in conjunction with Asia Display, IDW/AD 2016, 2016, Volume 1, pp. 455 - 457
Conference Proceeding
IEEE Transactions on Automation Science and Engineering, ISSN 1545-5955, 04/2014, Volume 11, Issue 2, pp. 473 - 484
...) controller to adapt equipment parameters to enhance the overlay control performance. This study evaluates the performance of controllers via the variation of each overlay factor and the variation of maximum overlay errors in real settings... 
Semiconductor device modeling | Fabrication | run-to-run (R2R) control | yield enhancement | Measurement uncertainty | proportional-integral controller | Process control | Companies | overlay errors | Advanced process control (APC) | manufacturing intelligence | Lenses | SYSTEM | DESIGN | TO-RUN CONTROL | WAFER BIN MAP | YIELD | SEMICONDUCTOR PROCESSES | OPTIMIZATION | STEPPERS | FABRICATION | VARIABLE EWMA CONTROLLER | AUTOMATION & CONTROL SYSTEMS | Performance evaluation | Error analysis | Semiconductors | Adjustment | Error compensation | Control equipment | Tolerances | Nanotechnology
Journal Article
2018 29th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC), 04/2018, pp. 334 - 339
Conference Proceeding
International Journal of Precision Engineering and Manufacturing, ISSN 2234-7593, 2014, Volume 15, Issue 7, pp. 1303 - 1310
Printed electronics is a set of printing methods used to create electrical devices such as OLEDs, e-paper, RFID on various substrates with common printing equipment, such as screen printing... 
Electric printing | R2R | Dryer | Oven drying process | Printed electronics | POLYMER SOLAR-CELLS | PATTERNS | ENGINEERING, MANUFACTURING | ENGINEERING, MECHANICAL
Journal Article
Expert systems with applications, ISSN 0957-4174, 10/2020, Volume 155, p. 113424
•A new R2R control framework based on Dynamic Bayesian Network is proposed.•Physic-informed DBN is constructed based on equipment sensor data and prior knowledge... 
Chemical-Mechanical Polishing (CMP) | Run-to-Run (R2R) control | Physics-informed | Advanced Process Control (APC) | Dynamic Bayesian Network (DBN) | Fault Detection and Classification (FDC) | Machine Learning | Computer Science
Journal Article
SID Symposium Digest of Technical Papers, ISSN 0097-966X, 06/2019, Volume 50, Issue 1, pp. 1183 - 1186
...‐volume manufacturing, enabling the Internet of Things (IOT). R2R process capabilities are demonstrated along with key equipment considerations and de... 
Roll-to-Roll | scaling | R2R | TFT | flexible | stainless steel | polysilicon | CMOS | Electronic devices | Internet of Things | Substrates | Stainless steels
Journal Article
2018 International Wafer Level Packaging Conference (IWLPC), 10/2018, pp. 1 - 6
Frontend semiconductor manufacturing has a long history of using advanced process control (APC) techniques to control chip-manufacturing processes, detect... 
Fault Detection | Process control | Tools | Production facilities | Temperature sensors | Run-to-Run | Backend | R2R | Wafer Level Packaging | APC | TCPIP | Data collection | Advanced Process Control | Cpk
Conference Proceeding
2018 7th Electronic System-Integration Technology Conference (ESTC), 09/2018, pp. 1 - 5
... units.This paper presents an automated electrical test equipment for R2R testing purposes by means of stop and go bed-of-nails test method... 
Printing | Performance evaluation | functional testing | quality assurance | Organic light emitting diodes | Conductors | OLED | Manufacturing | Electrical resistance measurement | roll-to-roll (R2R) | conductor | Testing
Conference Proceeding
Laser Physics Letters, ISSN 1612-2011, 05/2018, Volume 15, Issue 5, p. 55701
A simple method, based on a roll-to-roll ultraviolet micro-pyramid imprinting technique and a nanoparticle self-assembling process in aqueous solution, to... 
R2R UV imprinting | dye detection | portable Raman spectrometer | flexible micro-pyramid SERS substrate | herbal tea | ENHANCED RAMAN-SPECTROSCOPY | PHYSICS, APPLIED | ARRAY | TANDEM MASS-SPECTROMETRY | PRODUCTS | OPTICS | RESIDUES | SCATTERING | PLASMON RESONANCE | MALACHITE GREEN
Journal Article
2018 29th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC), 04/2018, pp. 340 - 345
.... In this paper, a modified Non-threaded Run-to-Run approach is proposed. This approach permits the control of the maximum possible number of equipment simultaneously... 
Context | Electronics industry | Run-to-Run control (R2R) | Process control | Estimation | Kalman filter | Tools | Controllability | Non-threaded R2R | Kalman filters
Conference Proceeding
IEEE Transactions on Semiconductor Manufacturing, ISSN 0894-6507, 02/2013, Volume 26, Issue 1, pp. 69 - 81
Journal Article
2019 14th IEEE International Conference on Electronic Measurement & Instruments (ICEMI), 11/2019, pp. 1033 - 1039
This paper takes flexible material R2R processing equipment as the research object, aiming at the problem of roll shaft performance degradation during the actual processing, proposes a roll shaft... 
Shafts | Degradation | logistic regression model | Predictive models | Feature extraction | Data models | performance degradation | Time-domain analysis | Logistics | R2R processing roll shaft
Conference Proceeding
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