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IEEE Transactions on Circuits and Systems I: Regular Papers, ISSN 1549-8328, 05/2007, Volume 54, Issue 5, pp. 1018 - 1031
Journal Article
by Acar, E and Ozev, S
IEEE Transactions on Very Large Scale Integration (VLSI) Systems, ISSN 1063-8210, 09/2010, Volume 18, Issue 9, pp. 1348 - 1356
Journal Article
IEEE Microwave and Wireless Components Letters, ISSN 1531-1309, 11/2006, Volume 16, Issue 11, pp. 588 - 590
Journal Article
IEEE Transactions on Very Large Scale Integration (VLSI) Systems, ISSN 1063-8210, 06/2010, Volume 18, Issue 6, pp. 998 - 1002
Journal Article
1996, IEE circuits and systems series, ISBN 9780852968741, Volume 8, xxxiv, 1028
Book
IEEE Transactions on Instrumentation and Measurement, ISSN 0018-9456, 04/2013, Volume 62, Issue 4, pp. 732 - 742
Journal Article
IEEE Communications Magazine, ISSN 0163-6804, 09/2003, Volume 41, Issue 9, pp. 82 - 88
Journal Article
IEEE Journal of Quantum Electronics, ISSN 0018-9197, 04/2010, Volume 46, Issue 4, pp. 541 - 545
Journal Article
Journal of Lightwave Technology, ISSN 0733-8724, 07/2009, Volume 27, Issue 14, pp. 2724 - 2731
Journal Article
by Acar, E and Ozev, S
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, ISSN 0278-0070, 07/2009, Volume 28, Issue 7, pp. 993 - 1005
Journal Article
Proceedings of the 46th Annual Design Automation Conference, ISSN 0738-100X, 07/2009, pp. 720 - 725
In this paper, we propose an adaptive test strategy that tailors the test sequence with respect to the properties of each individual instance of a circuit.... 
adaptive testing | Radio frequency | Adaptive Testing | Costs | Integrated circuit testing | Production | Analog circuits | Permission | Throughput | Manufacturing | Circuit testing | Pattern analysis | Adaptive testing
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