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relibility (15) 15
reliability (7) 7
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2013, ISBN 9781466502468, xxx, 381 p., [16] p. of plates
"Preface Every transmission and distribution apparatus is a complex engineering system of electrical and mechanical components made of various conductive and... 
Relibility | Service life | SCIENCE / Energy | Equipment and supplies | TECHNOLOGY & ENGINEERING / Power Resources / Electrical | TECHNOLOGY & ENGINEERING / Environmental / General | Reliability | Electric power transmission | Electric power distribution | Testing
Book
2002, ISBN 0471293423, 553
With computers becoming embedded as controllers in everything from network servers to the routing of subway schedules to NASA missions, there is a critical... 
Reliability | Computer systems | Computer networks | Technology | Quality Control | Fault-tolerant computing
eBook
2017, 2, ISBN 1498754759, 677
The revised edition presents, extends, and updates a thorough analysis of the factors that cause and accelerate the aging of conductive and insulating... 
Power Engineering | Renewable Energy | Clean Technologies | Service life (Engineering) | Product life cycle | Electric power distribution | Electric power transmission
eBook
2013 IEEE International Reliability Physics Symposium (IRPS), ISSN 1541-7026, 04/2013, pp. 4A.2.1 - 4A.2.5
BTI induced aging degradation threatens circuit reliability through circuit performance degradation. This degradation is strongly workload dependent and can... 
dynamic voltage scaling | workload | asymetric aging | Voltage control | Stress | Degradation | guard band | BTI | Aging | Logic gates | sensor | Sensors | power | circuit relibility | Monitoring
Conference Proceeding
2011 International Reliability Physics Symposium, ISSN 1541-7026, 04/2011, pp. 2B.2.1 - 2B.2.5
An on-chip 45nm test platform that directly monitors circuit performance degradation during dynamic operation is demonstrated. In contrast to traditional... 
Frequency measurement | asymetric aging | duty cycle | NBTI | Delay | Stress | relibility | test structure | Degradation | TDC | variations | Aging | Logic gates | Clocks
Conference Proceeding
Proceedings of the International Conference on computer-aided design, ISSN 1092-3152, 11/2018, pp. 1 - 8
In this paper, we propose anew multi-physics finite element method (FEM) based analysis method for void growth simulation of confined copper interconnects.... 
electromigration | finite element method | IC relibility | Electromigration | Finite Element Method | Wires | IC Relibility | Finite element analysis | Mathematical model | Copper | Current density | Stress
Conference Proceeding
2016 17th International Conference on Electronic Packaging Technology (ICEPT), 08/2016, pp. 261 - 263
In this paper, we presented that, by adding the destabilizing agent of the nitrate to replace the anchoring groups of organic molecules on the AgNP surfaces,... 
conductive printing | Heating | Surface morphology | flexible substrate | Ink | room-temperature sintering | Ag nanoparticles | relibility | room-Temperature sintering
Conference Proceeding
2016 IEEE 8th International Power Electronics and Motion Control Conference (IPEMC-ECCE Asia), 05/2016, pp. 563 - 569
This paper presents an overview of the latest Gallium Nitride High Electron Mobility Transistor (GaN HEMT) technology. The latest development and challenges of... 
device evaluation | application | review | GaN HEMT | relibility | Electric power generation | Dynamic tests | Conferences | Semiconductor devices | Circuits | Gallium nitrides | Electronics | High electron mobility transistors
Conference Proceeding
2016 IEEE 16th International Conference on Environment and Electrical Engineering (EEEIC), 06/2016, pp. 1 - 4
This paper aims to address the method for reliability analysis under the generator voltage-class-reduction scheme, focusing on the cascading blackout analysis.... 
short-term power system plan | blackout | Power transmission lines | Power system protection | cascading failure | relibility analysis | Power system reliability | Reliability | Power system faults | voltage-class-reduction operation | Load flow | Economics | Computer simulation | Blackout | Electronics | Transformers | Reliability analysis | Generators | Cascading
Conference Proceeding
2013 IEEE Seventh International Conference on Software Security and Reliability Companion, 06/2013, pp. 45 - 52
Covert channel has been studied for years due to its ability to divulge sensitive information in computer systems. Constructing covert communication scenarios... 
Protocols | Operating systems | Linux | Receivers | Interference | Security and Relibility | Trojan horses | Informaiton leakage | Covert Channel Analysis | Secure Operating Systems
Conference Proceeding
IEEE Design & Test of Computers, ISSN 0740-7475, 10/2012, Volume 29, Issue 5, pp. 18 - 26
Asymmetric aging under different workload profiles requires on-chip aging sensors to be sensitive to signal edge degradation. The authors in this paper present... 
aging sensor | workload | circuit delay | asymetric aging | Circuit testing | relibility | Degradation | TDC | on-chip test strucutrue | circuit activity | variations | BTI | Aging | Sensors | Delays | Reliability | System-on-a-chip | COMPUTER SCIENCE, HARDWARE & ARCHITECTURE | ENGINEERING, ELECTRICAL & ELECTRONIC
Journal Article
11th International Symposium on Practical Design of Ships and Other Floating Structures, PRADS 2010, 2010, Volume 2, pp. 1483 - 1491
Conference Proceeding
2010 2nd IEEE International Conference on Information Management and Engineering, 04/2010, Volume 3, pp. 131 - 134
Software reliability is a very important and active research field in software engineering. There have been one hundred of prediction model since the first... 
Software testing | Software maintenance | software relibility | Predictive models | Educational institutions | Benchmarking | Software reliability | Software quality | Computer applications | Benchmark testing | Samarium | Software measurement | software reliability prediction model | Software reliability prediction model | Software relibility
Conference Proceeding
Sequential Analysis, ISSN 0747-4946, 01/1999, Volume 18, Issue 3-4, pp. 189 - 202
The predictive-sequential prequential approach is often used to measure the predictive quality of reliability-growth models eg: software-reliability models.... 
Kolmogorov-Smirnov distance and distribution | Empirical distribution function | sequential estimation | u-plot | Prequential approach | Relibility-growth models
Journal Article
2010 The 2nd International Conference on Computer and Automation Engineering (ICCAE), 02/2010, Volume 5, pp. 822 - 826
Conference Proceeding
由於鑽石具有很多優異的性質,利用化學氣相沈積法 (chemical vapor deposition )合成的多晶鑽石薄膜被認為可用來製作高溫電子元件的理想 材料。最近幾年來,有很多人投入鑽石薄膜電性應用的研究。到目前為止 ,合成多晶鑽石膜的電性仍與製程有很大的關係。而鑽石薄膜若想應用在... 
多晶鑽石膜 | polycrystalline diamond | gas effect | 可靠性 | 氣體效應 | relibility
Dissertation
熊本大学教育学部紀要. 自然科学, ISSN 0454-6148, 09/1990, Volume 39, pp. 89 - 99
Journal Article
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