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1. Full Text Scanning Electron Microscopy and X-Ray Microanalysis
by Goldstein, Joseph I and Newbury, Dale E and Michael, Joseph R and Ritchie, Nicholas W. M and Scott, John Henry J and Joy, David C
2017, 4th ed. 2018, ISBN 9781493966745, 554
Spectroscopy/Spectrometry | Materials Science | Spectroscopy and Microscopy | Measurement Science and Instrumentation | Biological Microscopy | Characterization and Evaluation of Materials | Chemistry and Materials Science | Dual column instruments | Quantitative X-ray analysis | Electron backscatter diffraction | Table top SEM | X-ray microanalysis book | EBSD | SEM textbook | X-ray spectral measurement | Environmental SEM | SDD x-ray detectors | Focused ion beam | X-ray mapping | Variable pressure SEM | Ion beam microanalysis | Qualitative X-ray analysis | Scanning electron microscopy | X-ray microanalysis
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2. Full Text Is Scanning Electron Microscopy/Energy Dispersive X‐ray Spectrometry (SEM/EDS) Quantitative?
by Newbury, Dale E and Ritchie, Nicholas W. M
Scanning, ISSN 0161-0457, 05/2013, Volume 35, Issue 3, pp. 141 - 168
scanning electron microscopy | silicon drift detector | SDD | EDS | X‐ray microanalysis | SEM | elemental analysis | quantitative analysis | energy dispersive X‐ray spectrometry | X‐ray spectrometry | X-ray microanalysis | energy dispersive X-ray spectrometry | X-ray spectrometry | Microscopy | Technology | Instruments & Instrumentation | Science & Technology | X-ray spectroscopy | Invisibility | Electron microscopy | Analysis | Detectors | Studies | Scanning electron microscopy | Spectroscopy | Constituents | Accuracy | Spectrometry | Energy dispersive | Systematic errors | Spectrometers
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3. Full Text Response functions of Si(Li), SDD and CdTe detectors for mammographic x-ray spectroscopy
by Tomal, A and Cunha, D.M and Antoniassi, M and Poletti, M.E
Applied radiation and isotopes, ISSN 0969-8043, 07/2012, Volume 70, Issue 7, pp. 1355 - 1359
CdTe detector | Mammographic x-ray spectra | Response functions | Si(Li) detector | Silicon drift detector (SDD) | Spectrum Analysis - methods | X-Rays | Silicon - analysis | Cadmium Compounds - analysis | Mammography - methods | Lithium - analysis | Tellurium - analysis | Monte Carlo method | Mammography | X-ray spectroscopy | Spectrum analysis | Detectors | Index Medicus
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4. Full Text Counting‐loss correction for X‐ray spectroscopy using unit impulse pulse shaping
by Hong, Xu and Zhou, Jianbin and Ni, Shijun and Ma, Yingjie and Yao, Jianfeng and Zhou, Wei and Liu, Yi and Wang, Min
Journal of synchrotron radiation, ISSN 1600-5775, 03/2018, Volume 25, Issue 2, pp. 505 - 513
X‐ray spectroscopy | unit impulse pulse shaping | counting loss correction | FAST‐SDD detector | X-ray spectroscopy | FAST-SDD detector | Physical Sciences | Technology | Instruments & Instrumentation | Optics | Physics | Science & Technology | Physics, Applied | Variations | Spectrum analysis | Pulse shape
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5. Full Text EDS Measurements of X-Ray Intensity at WDS Precision and Accuracy Using a Silicon Drift Detector
by Ritchie, Nicholas W.M and Newbury, Dale E and Davis, Jeffrey M
Microscopy and microanalysis, ISSN 1431-9276, 07/2012, Volume 18, Issue 4, pp. 892 - 904
electron probe microanalysis | energy dispersive X-ray spectrometry | wavelength spectrometry | quantitative correction | silicon drift detector (SDD) | WDS | ZAF | EPMA
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6. Full Text A Multichannel Integrated Readout Circuit for High Throughput X-Ray Spectroscopy With Silicon Drift Detectors
by Bombelli, L and Quaglia, R and Fiorini, C and Alberti, R and Frizzi, T
IEEE transactions on nuclear science, ISSN 0018-9499, 02/2013, Volume 60, Issue 1, pp. 430 - 436
high rate | Data acquisition | Noise | Throughput | PUR | pile up | Application specific integrated circuits | ASIC | SDD | Energy resolution | spectroscopy | Detectors | JFETs | X-ray | detector | Engineering, Electrical & Electronic | Engineering | Technology | Nuclear Science & Technology | Science & Technology | Technology application | Usage | X-ray spectroscopy | Digital filters | Complementary metal oxide semiconductors
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7. Full Text Analytical Formulae for Calculation of X-Ray Detector Solid Angles in the Scanning and Scanning/Transmission Analytical Electron Microscope
by Zaluzec, Nestor J and Argonne National Lab. (ANL), Argonne, IL (United States)
Microscopy and microanalysis, ISSN 1431-9276, 08/2014, Volume 20, Issue 4, pp. 1318 - 1326
Techniques and Instrumentation Development | SDD | X-ray detectors | SiLi | EDS | XEDS | microanalysis | EDXS | SEM | solid angle | TEM | STEM | Materials Science | Microscopy | Technology | Materials Science, Multidisciplinary | Science & Technology
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8. Full Text A new method for removing false peaks to obtain a precise X-ray spectrum
by Tang, Lin and Yu, Jie and Zhou, Jianbin and Fang, Fang and Wan, Wenjie and Yao, Jianfeng and Yu, Songke and Liao, Xianli
Applied radiation and isotopes, ISSN 0969-8043, 05/2018, Volume 135, pp. 171 - 176
Triangular shaping | Fast SDD | False peak elimination | Switch reset preamplifier | Physical Sciences | Chemistry, Inorganic & Nuclear | Chemistry | Life Sciences & Biomedicine | Technology | Radiology, Nuclear Medicine & Medical Imaging | Nuclear Science & Technology | Science & Technology | Analysis | Methods | Detectors
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9. Full Text ASIC for SDD-Based X-Ray Spectrometers
by De Geronimo, Gianluigi and Rehak, Pavel and Ackley, Kim and Carini, Gabriella and Wei Chen and Fried, Jack and Keister, Jeffrey and Shaorui Li and Zheng Li and Pinelli, Donald A and Siddons, D Peter and Vernon, Emerson and Gaskin, Jessica A and Ramsey, Brian D and Tyson, Trevor A and BROOKHAVEN NATIONAL LABORATORY (BNL)
IEEE transactions on nuclear science, ISSN 0018-9499, 06/2010, Volume 57, Issue 3, pp. 1654 - 1663
Spectroscopy | high rate | Extraterrestrial measurements | PUR | Application specific integrated circuits | ASIC | SDD | Space technology | Detectors | charge sharing | Silicon | LVDS | Anodes | Analog memory | FETs | Lifting equipment | Charge sharing | High rate | Engineering, Electrical & Electronic | Engineering | Technology | Nuclear Science & Technology | Science & Technology | Field effect transistors | Spectrometers | Dissipation | X-rays | Charge | Channels | Pixels | FIELD EFFECT TRANSISTORS | INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY | AMPLIFICATION | STABILIZATION | SILICON | DETECTION | X-RAY SPECTROMETERS | ANODES | SENSORS | INTEGRATED CIRCUITS
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10. Full Text Comparison of beam quality parameters computed from mammographic x-ray spectra measured with different high-resolution semiconductor detectors
by Tomal, A and Cunha, D.M and Poletti, M.E
Radiation physics and chemistry (Oxford, England : 1993), ISSN 0969-806X, 02/2014, Volume 95, pp. 217 - 220
CdTe detector | Mammographic x-ray spectra | Si(Li) detector | Silicon drift detector (SDD) | Quality parameters | Physical Sciences | Chemistry | Technology | Nuclear Science & Technology | Physics, Atomic, Molecular & Chemical | Chemistry, Physical | Physics | Science & Technology | Monte Carlo method | Mammography | Comparative analysis | Nuclear radiation | Detectors | Beams (radiation) | Computer simulation | Semiconductors | Computation | Cadmium tellurides | Spectra | Standards
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11. Full Text X‐ray fluorescence analysis of metal distributions in cryogenic biological samples using large‐acceptance‐angle SDD detection and continuous scanning at the Hard X‐ray Micro/Nano‐Probe beamline P06 at PETRA III
by Rumancev, C and Gräfenstein, A and Vöpel, T and Stuhr, S and von Gundlach, A. R and Senkbeil, T and Garrevoet, J and Jolmes, L and König, B and Falkenberg, G and Ebbinghaus, S and Schroeder, W. H and Rosenhahn, A
Journal of synchrotron radiation, ISSN 1600-5775, 01/2020, Volume 27, Issue 1, pp. 60 - 66
HeLa cells | SDD | solid angle | XRF | cryogenic | Physical Sciences | Technology | Instruments & Instrumentation | Optics | Physics | Science & Technology | Physics, Applied | Biological properties | Microprocessors | Energy resolution | Backscattering | Energy measurement | Fluorescence | Two dimensional models | Trace elements | Design optimization | Index Medicus
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12. Full Text X-ray transition yields of low-Z kaonic atoms produced in Kapton
by Bazzi, M and Beer, G and Berucci, C and Bombelli, L and Bragadireanu, A.M and Cargnelli, M and Curceanu, C and dʼUffizi, A and Fiorini, C and Ghio, F and Guaraldo, C and Hayano, R.S and Iliescu, M and Ishiwatari, T and Iwasaki, M and Kienle, P and Levi Sandri, P and Longoni, A and Marton, J and Okada, S and Pietreanu, D and Ponta, T and Quaglia, R and Romero Vidal, A and Sbardella, E and Scordo, A and Shi, H and Sirghi, D.L and Sirghi, F and Tatsuno, H and Tudorache, A and Tudorache, V and Vazquez Doce, O and Widmann, E and Zmeskal, J and SIDDHARTA Collaboration
Nuclear physics. A, ISSN 0375-9474, 10/2013, Volume 916, pp. 30 - 47
Atomic physics | deduced | measured | kapton polyimide X-rays using SIDDHARTA SDD detectors | kaonic atoms | estimated | X-ray yields separately | X-ray yields | Deduced | Estimated | Measured | Physical Sciences | Physics, Nuclear | Physics | Science & Technology | Polyimides | Physics - Nuclear Experiment
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13. Full Text Detector Solid Angle Formulas for Use in X-Ray Energy Dispersive Spectrometry
by Zaluzec, Nestor J and Argonne National Lab. (ANL), Argonne, IL (United States)
Microscopy and microanalysis, ISSN 1431-9276, 3/2009, Volume 15, Issue 2, pp. 93 - 98
SDD | Solid angle | X-ray detectors | Collection efficiency | EDS | XEDS | Si(Li) | Materials Science | Microscopy | Technology | Materials Science, Multidisciplinary | Science & Technology | Nanostructures - chemistry | Spectrometry, X-Ray Emission - methods | Lithium - chemistry | Silicon - chemistry | Spectrometry, X-Ray Emission - instrumentation | Index Medicus | LI-DRIFTED SI DETECTORS | EQUATIONS | INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY | APPROXIMATIONS | X-RAY DETECTION
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14. Full Text Low-energy shelf response in thin energy-dispersive X-ray detectors from Compton scattering of hard X-rays
by Michel-Hart, N and Elam, W.T
Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment, ISSN 0168-9002, 08/2017, Volume 863, pp. 1 - 6
Low-energy shelf | Compton scattering | Energy-dispersive X-ray detectors | SDD response function | Physical Sciences | Physics, Nuclear | Technology | Instruments & Instrumentation | Nuclear Science & Technology | Physics, Particles & Fields | Physics | Science & Technology | Fluorescence spectroscopy | X-ray spectroscopy | Analysis | X-rays | Detectors
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15. Full Text Compton Scattering Artifacts in Electron Excited X-Ray Spectra Measured with a Silicon Drift Detector
by Ritchie, Nicholas W.M and Newbury, Dale E and Lindstrom, Abigail P
Microscopy and microanalysis, ISSN 1431-9276, 11/2011, Volume 17, Issue 6, pp. 903 - 910
electron probe microanalysis (EPMA) | Monte Carlo | silicon drift detector (SDD) | energy dispersive | Compton scatter | X-ray | artifacts | Materials Science | Microscopy | Technology | Materials Science, Multidisciplinary | Science & Technology | Artifacts | Spectrometry, X-Ray Emission - methods | Trace Elements - analysis | X-Rays | Spectrometry, X-Ray Emission - instrumentation | Scattering, Radiation | Monte Carlo Method | Silicon - chemistry | Electrons | Atoms & subatomic particles | Trace elements | Monte Carlo simulation | Index Medicus
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16. Full Text A statistical approach to fit Gaussian part of full-energy peaks from Si(PIN) and SDD X-ray spectrometers
by Li, Zhe and Li, Zhe and Tuo, XianGuo and Tuo, XianGuo and Shi, Rui and Shi, Rui and Yang, JianBo and Yang, JianBo
Science China Technological Sciences, ISSN 1674-7321, 1/2014, Volume 57, Issue 1, pp. 19 - 24
Engineering | EDXRF | SDD | Gaussian distribution | Engineering, general | standard deviation of energy resolution | Si(PIN) | Materials Science | Technology | Engineering, Multidisciplinary | Materials Science, Multidisciplinary | Science & Technology | Alloys | Detectors | Fittings | Mathematical analysis | X-rays | Texts | Standard deviation | Gaussian | Spectra | Calibration
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