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Fusion Engineering and Design, ISSN 0920-3796, 05/2017, Volume 118, pp. 111 - 116
...) will be placed after the ITER bio-shield, such as the cubicles instrumentation room. Nevertheless, it is worth to explore real-time mitigation of soft-errors caused by neutrons radiation in ITER related FPGAs... 
Neutrons | SEU detection | Nuclear fusion | FPGA | SEU mitigation | Real-time | SYSTEM | NUCLEAR SCIENCE & TECHNOLOGY | Ionizing radiation | Digital integrated circuits | Error-correcting codes | Information management | Nuclear reactors | Sensors | Data entry
Journal Article
IEEE Transactions on Reliability, ISSN 0018-9529, 12/2016, Volume 65, Issue 4, pp. 1871 - 1883
.... Approximate logic circuits provide a general framework for optimized mitigation of errors arising from a broad class of failure mechanisms, including transient, intermittent, and permanent failures... 
single-event transient (SET) | error mitigation | Approximate logic circuit | Logic circuits | Redundancy | evolutionary computing | Probabilistic logic | Tunneling magnetoresistance | Circuit faults | Transient analysis | single-event upset (SEU) | COMPUTER SCIENCE, SOFTWARE ENGINEERING | COMPUTER SCIENCE, HARDWARE & ARCHITECTURE | MASKING | REDUNDANCY | ENGINEERING, ELECTRICAL & ELECTRONIC | Errors | Scaling | Error reduction
Journal Article
Journal of Physics D: Applied Physics, ISSN 0022-3727, 11/2017, Volume 50, Issue 50, p. 505002
In this paper, we have developed a radiation-hardened non-volatile lookup table (LUT) circuit utilizing spin Hall effect (SHE)-magnetic random access memory... 
magnetic random access memory (MRAM) | lookup table (LUT) | soft error | multi-node upset (MNU) | radiationhardening | single event upset (SEU) | spin Hall effect | COLLECTION | ENERGY | PHYSICS, APPLIED | PERFORMANCE | radiation-hardening | SEU OCCURRENCE | CHARGE | CIRCUIT
Journal Article
Journal of Electronic Testing: Theory and Applications (JETTA), ISSN 0923-8174, 12/2013, Volume 29, Issue 6, pp. 825 - 838
.... Therefore, soft error mitigation has become a compulsory requirement for an increasing number of applications, which operate from the space to the ground level... 
Fault tolerance | Embedded systems | Reliability | Soft errors | Single Event Upset (SEU) | COTS electronic components | Case studies | Computer software industry | Nuclear radiation | Internet software | Methods | Studies | Performance evaluation | Microprocessors | Diagnostic tests | Design engineering
Journal Article
IEEE Transactions on Dependable and Secure Computing, ISSN 1545-5971, 03/2012, Volume 9, Issue 2, pp. 159 - 172
Journal Article
IEEE Transactions on Nuclear Science, ISSN 0018-9499, 06/2015, Volume 62, Issue 3, pp. 1010 - 1015
...) sensitive in the harsh space environment. To comply with radiation hardness assurance (RHA), SEU mitigation methods, including partial triple modular redundancy... 
Data acquisition | FPGA | SEU mitigation | Random access memory | Single event upsets | Tunneling magnetoresistance | Registers | Reliability | Field programmable gate arrays | NUCLEAR SCIENCE & TECHNOLOGY | ENGINEERING, ELECTRICAL & ELECTRONIC | Measurement | Design and construction | Calorimeters | Digital integrated circuits | Cosmic rays | Innovations
Journal Article
Sādhanā, ISSN 0256-2499, 11/2018, Volume 43, Issue 11, pp. 1 - 10
...) on CMOS devices in designing of a voltage-controlled oscillator (VCO) is analysed. Further, mitigation approaches of SEU are also discussed... 
Radiation hardening | Engineering | SEU | SEE | voltage-controlled oscillators | Engineering, general | RHBD | DESIGN | ENGINEERING, MULTIDISCIPLINARY | Models | Complementary metal oxide semiconductors | Radiation
Journal Article
IEEE Transactions on Dependable and Secure Computing, ISSN 1545-5971, 07/2016, Volume 13, Issue 4, pp. 502 - 508
Journal Article
Journal of Beijing Institute of Technology (English Edition), ISSN 1004-0579, 09/2016, Volume 25, Issue 3, pp. 403 - 412
...,0 m ⅡZ ofBeijing Institute ofTechnology,2016,Vo1.25。No.3 LOW complexity SEU mitigation technique for SRAM .based FPGAs JIANG Run—zhen(姜润祯) ,WANG Yong—qing(王... 
Triple modular redundancy | Field programmable gate array (FPGA) | Low complexity | Scrubbing | Static random access memory (SRAM) | Single event upset (SEU)
Journal Article
Scientia Iranica, ISSN 1026-3098, 2015, Volume 22, Issue 6, pp. 2401 - 2414
Following technology scaling trend, CMOS circuits are facing more reliability challenges such as soft errors caused by radiation. Soft error protection imposes... 
Single Event Multiple Upset (SEMU) | Soft Error (SE) | Single Event Transient (SET) | Multiple Event Transient (MET) | Single Event Multiple Transient (SEMT) | Single Event Upset (SEU) | ENGINEERING, MULTIDISCIPLINARY
Journal Article
中国物理B:英文版, ISSN 1674-1056, 2016, Volume 25, Issue 3, pp. 283 - 289
Journal Article
半导体学报:英文版, ISSN 1674-4926, 2015, Volume 36, Issue 11, pp. 97 - 100
A 4-interleaving cell of 2-dual interlocked cells(DICE) is proposed, which reduces single event induced multiple node collection between the sensitive nodes of... 
集合 | 芯片测试 | CMOS | 骰子 | SRAM单元 | 设计单位 | 多节点 | 交错 | hardened-by-design (HBD) | multi-node upset (MNU) | single event upset (SEU) | Static random access memory | Semiconductors | Chips (electronics) | Encounters | Collection | Cross sections
Journal Article
Desenvolvimento e meio ambiente, ISSN 1518-952X, 08/2018, Volume 46
Emissões de gases de efeito estufa estão entre os principais impactos causados pelos humanos no planeta e estão diretamente ligados às mudanças climáticas.... 
carbon storage | protected areas | ecosystem services | climate change
Journal Article
IEEE Transactions on Nuclear Science, ISSN 0018-9499, 06/2019, Volume 66, Issue 6, pp. 946 - 954
Journal Article
Journal of Cleaner Production, ISSN 0959-6526, 09/2015, Volume 103, pp. 197 - 210
A estrutura da matriz energética brasileira define o Brasil como líder mundial na geração elétrica a partir de fontes renováveis. Em 2011, a participação de... 
Energy matrix | Eletricidade | Energia renovável | Renewable energy | Electricity | Matriz energética | GREEN & SUSTAINABLE SCIENCE & TECHNOLOGY | ENVIRONMENTAL SCIENCES | Energia renovivel | Matriz energetica | ENGINEERING, ENVIRONMENTAL | Palavras-chave
Journal Article
Revista Brasileira de Estudos de População, ISSN 1980-5519, 12/2015, Volume 32, Issue 3, pp. 609 - 618
Journal Article
IEEE Transactions on Nuclear Science, ISSN 0018-9499, 10/2017, Volume 64, Issue 10, pp. 2626 - 2632
Journal Article
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