X
Search Filters
Format Format
Format Format
X
Sort by Item Count (A-Z)
Filter by Count
Newspaper Article (27408) 27408
Journal Article (13961) 13961
Conference Proceeding (973) 973
Magazine Article (712) 712
Book Chapter (463) 463
Book Review (378) 378
Dissertation (342) 342
Book / eBook (232) 232
Publication (129) 129
Government Document (128) 128
Trade Publication Article (105) 105
Web Resource (85) 85
Transcript (55) 55
Archival Material (34) 34
Report (20) 20
Newsletter (11) 11
Paper (5) 5
Music Score (3) 3
Art (2) 2
Data Set (1) 1
Library Holding (1) 1
Video Recording (1) 1
more...
Subjects Subjects
Subjects Subjects
X
Sort by Item Count (A-Z)
Filter by Count
sims (5959) 5959
sims, rod (3994) 3994
tof-sims (3259) 3259
chemistry, physical (2716) 2716
physics, applied (2012) 2012
mass spectrometry (1910) 1910
physics, condensed matter (1576) 1576
materials science, multidisciplinary (1449) 1449
analysis (1327) 1327
secondary ion mass spectrometry (1249) 1249
materials science, coatings & films (1225) 1225
sim (1152) 1152
xps (1114) 1114
chemistry, analytical (1073) 1073
spectroscopy (976) 976
sims, calvin (956) 956
sekundärionenmassenspektrometrie (947) 947
competition (882) 882
sims, jinny (870) 870
ion mass-spectrometry (823) 823
consumers (811) 811
diffusion (705) 705
chemistry (628) 628
silicon (620) 620
gill, sim (572) 572
humans (561) 561
tof‐sims (510) 510
oxidation (509) 509
animals (501) 501
physics, atomic, molecular & chemical (467) 467
mass-spectrometry (466) 466
sims, brian (447) 447
surface (434) 434
adsorption (426) 426
geochemistry & geophysics (416) 416
trump, donald j (411) 411
acquisitions & mergers (405) 405
ions (405) 405
thin films (393) 393
biochemical research methods (387) 387
sims, cliff (383) 383
sim卡 (375) 375
methods (371) 371
depth profiling (365) 365
microscopy (360) 360
polymers (359) 359
social networks (358) 358
surfaces (357) 357
engineering, electrical & electronic (356) 356
mineralogy (353) 353
research (351) 351
metallurgy & metallurgical engineering (344) 344
prices (337) 337
sims, ryan (335) 335
mass spectroscopy (334) 334
imaging (329) 329
chemistry, multidisciplinary (326) 326
nanoscience & nanotechnology (322) 322
athletes (318) 318
analytical chemistry (317) 317
oxygen (315) 315
materials science (312) 312
sim, michael (310) 310
chemical properties (306) 306
instruments & instrumentation (300) 300
bombardment (299) 299
usage (299) 299
hydrogen (298) 298
nuclear science & technology (292) 292
sims, john (292) 292
sims, robert (291) 291
secondary ion mass spectroscopy (290) 290
röntgenphotoelektronenspektroskopie (287) 287
ionization (286) 286
growth (280) 280
deposition (277) 277
tiefenprofil (271) 271
energy (269) 269
carbon (260) 260
spectra (260) 260
surface properties (258) 258
x-ray photoelectron spectroscopy (258) 258
sputtering (253) 253
engineering, chemical (252) 252
proteins (251) 251
sims, ron (244) 244
temperature (242) 242
biochemistry & molecular biology (240) 240
polymer science (236) 236
sauerstoff (236) 236
spectrometry, mass, secondary ion - methods (236) 236
sims, paul (234) 234
sims, david (232) 232
tem (231) 231
organic chemistry (229) 229
stockholders (229) 229
sims, phillip (228) 228
thin-films (228) 228
more...
Library Location Library Location
Library Location Library Location
X
Sort by Item Count (A-Z)
Filter by Count
Robarts - Stacks (42) 42
East Asian (Cheng Yu Tung) - Stacks (35) 35
Online Resources - Online (17) 17
Gerstein Science - Stacks (14) 14
UTL at Downsview - May be requested (13) 13
UofT at Mississauga - Stacks (11) 11
Collection Dvlpm't (Acquisitions) - Vendor file (8) 8
Victoria University E.J. Pratt - Stacks (4) 4
East Asian (Cheng Yu Tung) - Audio Visual (3) 3
New College (Ivey) - Stacks (3) 3
St. Michael's College (John M. Kelly) - 2nd Floor (3) 3
Architecture Landscape (Shore + Moffat) - Stacks (2) 2
Collection Dvlpm't (Acquisitions) - Closed Orders (2) 2
OISE - Stacks (2) 2
St. Michael's College (John M. Kelly) - 3rd Floor (2) 2
Thomas Fisher Rare Book - Rare Book (2) 2
UofT at Scarborough - Stacks (2) 2
Art - Library use only (1) 1
Art - Protected Material (1) 1
East Asian (Cheng Yu Tung) - Protected Material (1) 1
Engineering & Comp. Sci. - Stacks (1) 1
Music - Processing (1) 1
Music - Stacks (1) 1
Physics - Stacks (1) 1
Robarts - Storage (1) 1
Royal Ontario Museum - Stacks (1) 1
St. Augustine's Seminary - Stacks (1) 1
Thomas Fisher Rare Book - May be requested at Fisher (1) 1
Trinity College (John W Graham) - Rare Book (1) 1
Trinity College (John W Graham) - Stacks (1) 1
Trinity College (John W Graham) - Storage (1) 1
UofT Schools - Stacks (1) 1
UofT at Mississauga - Oversize (1) 1
Victoria University E.J. Pratt - Storage (1) 1
more...
Language Language
Language Language
X
Sort by Item Count (A-Z)
Filter by Count
English (42684) 42684
Chinese (904) 904
Portuguese (514) 514
Japanese (458) 458
Korean (266) 266
German (215) 215
French (144) 144
Spanish (111) 111
Czech (16) 16
Swedish (14) 14
Hebrew (13) 13
Norwegian (9) 9
Indonesian (8) 8
Russian (7) 7
Polish (4) 4
Ukrainian (4) 4
Turkish (3) 3
Croatian (2) 2
Catalan (1) 1
Dutch (1) 1
Italian (1) 1
more...
Publication Date Publication Date
Click on a bar to filter by decade
Slide to change publication date range


Progress in Biomedical Optics and Imaging - Proceedings of SPIE, ISSN 1605-7422, 2007, Volume 6510, Issue 2
SIM
Conference Proceeding
Analytica Chimica Acta, ISSN 0003-2670, 10/2017, Volume 989, Issue C
Currently, considerable attention has been paid to atmospheric particulate matter (PM) investigation due to its importance in human health and global climate... 
Particulate matter | SIMS | aerosol
Journal Article
International journal of mass spectrometry, ISSN 1387-3806, 02/2015, Volume 377, Issue 1, pp. 568 - 579
Journal Article
Surface and interface analysis, ISSN 0142-2421, 11/2014, Volume 46, Issue S1, pp. 285 - 287
A novel time of flight SIMS analyzer provides a new approach to SIMS analysis as an addition to a focused ion beam SEM instrument. The combination of this... 
SIMS quantification | plasma ion source | SIMS depth profiling | FIB‐SIMS | high sputtering rate | TOF‐SIMS analyzer | Plasma ion source | FIB-SIMS | High sputtering rate | TOF-SIMS analyzer | CHEMISTRY, PHYSICAL | Plasma physics | Analysis | Interface analysis | Profiling | Analyzers | Ion sources | Instrumentation | Secondary ion mass spectrometry | Silicon | Ion beams
Journal Article
Analytical chemistry (Washington), ISSN 0003-2700, 09/2012, Volume 84, Issue 18, pp. 7865 - 7873
The depth profiling of organic materials with argon cluster ion sputtering has recently become widely available with several manufacturers of surface... 
ANIMAL-CELLS | POLYMERS | IRRADIATION | CHEMISTRY, ANALYTICAL | MOLECULAR-DYNAMICS | FILMS | CHEMICAL-COMPOSITION | MASS-SPECTROMETRY SIMS | C-60(+) | TOF-SIMS | DAMAGE
Journal Article
Progress in photovoltaics, ISSN 1062-7995, 12/2007, Volume 15, Issue 8, pp. 697 - 712
The degradation and failure mechanisms of a stable photovoltaic device comprising a bilayer heterojunction formed between... 
long lifetime | polymer solar cells | degradation | TOF‐SIMS | failure mechanism | stability | Degradation | Failure mechanism | Long lifetime | Stability | TOF-SIMS | Polymer solar cells
Journal Article
Surface and interface analysis, ISSN 0142-2421, 11/2014, Volume 46, Issue S1, pp. 96 - 99
Interpretation of time‐of‐flight (TOF)‐SIMS spectra of organic molecules could be difficult because of the presence of a high number of secondary ion peaks;... 
PCDTBT | organic solar cell | PC70BM | TOF‐SIMS | gentle‐SIMS (G‐SIMS) | Gentle-SIMS (G-SIMS) | TOF-SIMS | Organic solar cell | ION MASS-SPECTROMETRY | gentle-SIMS (G-SIMS) | CHEMISTRY, PHYSICAL | SEPARATION | Solar cells | Interface analysis | Organic materials | Photovoltaic cells | Data processing | Two materials | Spectra | Ion beams
Journal Article
Book
Journal of analytical atomic spectrometry, ISSN 0267-9477, 8/2017, Volume 32, Issue 9, pp. 1798 - 184
We developed an in situ measurement technique implemented on a Glow Discharge Optical Emission Spectrometry (GD-OES) instrument, which provides the depth... 
CHEMISTRY, ANALYTICAL | SIMS | SPECTROSCOPY | THIN
Journal Article
Surface and interface analysis, ISSN 0142-2421, 06/2012, Volume 44, Issue 6, pp. 789 - 792
The investigation of fragment ions from macromolecules is crucial for the interpretation of time‐of‐flight secondary ion mass spectrometry (TOF‐SIMS) data,... 
polyethylene glycol | TOF‐SIMS | G‐SIMS | MCR | G-SIMS | TOF-SIMS | CHEMISTRY, PHYSICAL | SIMS SPECTRUM-IMAGES | ANALYSIS STRATEGIES
Journal Article
Lithos, ISSN 0024-4937, 10/2012, Volume 150, pp. 243 - 255
The Xuefengshan Belt, characterized by large-scale fold and thrust structures and widespread granites, is a key area to decipher the tectonic evolution of the... 
Lu[sbnd]Hf isotopes | Phanerozoic tectonothermal events | SIMS U[sbnd]Pb zircon dating | South China | Xuefengshan Belt | SIMS UPb zircon dating | LuHf isotopes | Tectonics (Geology)
Journal Article