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Probe microscopy, ISSN 1355-185X, 1997
Journal
2005, ISBN 0387258000, ix, 202
This book introduces current theory and practice of electron microscopy, primarily for undergraduates, as well as for technologists who use electron microscopes and to graduate students, university... 
Microscopy | Electron microscopy | Characterization and Evaluation of Materials | Chemistry | Biological Microscopy | Nanotechnology | Electromagnetism, Optics and Lasers
Book
2010, ISBN 9780199570454, Volume 9780199570454, viii, 248 p., [4] p. of plates
Atomic force microscopy (AFM) is an amazing technique that allies a versatile methodology... 
Atomic force microscopy | Atomic, Molecular, and Optical Physics | AFM | SPM | Scanning probe microscopy | Instrumental techniques | Microscopes | Imaging
Book
2006, ISBN 0521832241, Volume 9780521832243, xvii, 539
Nano-optics is the study of optical phenomena and techniques on the nanometer scale, that is, near or beyond the diffraction limit of light. It is an emerging... 
Quantum optics | Near-field microscopy | Nanostructured materials | Photonics | Nanophotonics
Book
2006, 3rd ed., ISBN 9780387259215, xxviii, 985
This third edition of a classic text in biological microscopy includes detailed descriptions and in-depth comparisons of parts of the microscope itself, digital aspects of data acquisition... 
Microscopie confocale | Confocal microscopy | Life Sciences | Biochemistry, general | Biotechnology
Book
2005, 2nd ed., ISBN 052184875X, Volume 9780521848756, xiii, 189 p., [7] p. of plates
...) and scanning electron microscopy (SEM) specifically from a geological viewpoint. Topics discussed include... 
Scanning electron microscopy | Electron probe microanalysis | Petrofabric analysis | Geology
Book
Annual review of neuroscience, ISSN 1545-4126, 2009, Volume 32, Issue 1, pp. 435 - 506
Journal Article
2006, ISBN 3527312692, xxiii, 544
This first book to focus on the use of SPMs to actively manipulate molecules and nanostructures on surfaces goes way beyond conventional treatments of scanning microscopy merely for imaging purposes... 
Scanning probe microscopy | Nanotechnology | Nanostructures | Microscopy
Book
Journal of physics. D, Applied physics, ISSN 1361-6463, 2011, Volume 44, Issue 46, pp. 464003 - 1-17
Piezoresponse force microscopy (PFM) detects the local piezoelectric deformation of a sample caused by an applied electric field from the tip of a scanning force microscope... 
THIN-FILMS | PIEZOELECTRIC COEFFICIENT MEASUREMENTS | SINGLE-CRYSTALS | SPONTANEOUS POLARIZATION | PHYSICS, APPLIED | DETECTION MECHANISM | PERIODICALLY POLED LINBO3 | FERROELECTRIC DOMAIN-STRUCTURES | PHOTONIC CRYSTAL | NONLINEAR OPTICS | LITHIUM-NIOBATE | Ferroelectric domains | Deformation | Microscopy | Images | Piezoelectricity | Recording | Scanning force microscopes | Quantitative analysis
Journal Article