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1. Probe microscopy
Probe microscopy, ISSN 1355-185X, 1997
Microscopy | Medical microscopy | Periodicals
Journal
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2. Scanning probe microscopy and spectroscopy
: theory, techniques, and applications
by Bonnell, Dawn A
2001, 2nd ed., ISBN 047124824X, xiv, 493 p., [4] p. of plates
Scanning probe microscopy | Tunneling spectroscopy
Book
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3. Atomic force microscopy
by Eaton, Peter Jonathan and West, Paul
2010, ISBN 9780199570454, Volume 9780199570454, viii, 248 p., [4] p. of plates
Atomic force microscopy | AFM | SPM | Scanning probe microscopy | Instrumental techniques | Microscopes | Imaging
Book
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4. Principles of nano-optics
by Novotny, Lukas and Hecht, Bert, 1968 and Books24x7, Inc
2006, ISBN 0521832241, Volume 9780521832243, xvii, 539
Quantum optics | Near-field microscopy | Nanostructured materials | Photonics | Nanophotonics
Book
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5. Instrumental community
: probe microscopy and the path to nanotechnology
by Mody, Cyrus C. M
2011, Inside Technology, ISBN 9780262134941, xiii, 260
Case studies | Scanning probe microscopy | United States | Technology | Europe | Intellectual cooperation | Research | Scientists | Interviews | Nanotechnology | TECHNOLOGY & ENGINEERING | History | Nanotechnology & MEMS
Book
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6. Atom probe microscopy
by Gault, Baptiste
2012, Springer series in materials science, ISBN 1461434351, Volume 160., xxiii, 396
Scanning probe microscopy | Atomic force microscopy | Atom-probe field ion microscopy
Book
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7. Scanning probe microscopies beyond imaging
: manipulation of molecules and nanostructures
by Samorì, Paolo
2006, ISBN 3527312692, xxiii, 544
Scanning probe microscopy | Nanotechnology | Nanostructures | Microscopy
Book
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8. Micron and microscopica acta
Micron and microscopica acta, ISSN 0739-6260, 1983
Electron probe microanalysis | Periodicals | Image processing | Microscopy | Electron microscopy
Journal
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9. Electron microprobe analysis and scanning electron microscopy in geology
by Reed, S. J. B
2005, 2nd ed., ISBN 052184875X, Volume 9780521848756, xiii, 189 p., [7] p. of plates
Scanning electron microscopy | Electron probe microanalysis | Petrofabric analysis | Geology
Book
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10. Applied scanning probe methods II
: scanning probe microscopy techniques
by Bhushan, Bharat, 1949 and Fuchs, H. O. 1907- (Henry Otten)
2005, Nanoscience and technology, ISBN 9783540262428, 390
Industrial applications | Scanning probe microscopy | Microscopy | Materials
Book
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11. Full Text Kelvin probe force microscopy and its application
by Melitz, Wilhelm and Shen, Jian and Kummel, Andrew C and Lee, Sangyeob
Surface science reports, ISSN 0167-5729, 2011, Volume 66, Issue 1, pp. 1 - 27
Scanning probe miscroscopy | Kelvin probe force microscopy | Electron, ion, and scanning probe microscopy | Electronic structure of nanoscale materials: clusters, nanoparticles, nanotubes, and nanocrystals | Electronic structure of nanoscale materials : clusters, nanoparticles, nanotubes, and nanocrystals | Exact sciences and technology | Condensed matter: structure, mechanical and thermal properties | Surface double layers, schottky barriers, and work functions | Structure of solids and liquids; crystallography | Electronic structure and electrical properties of surfaces, interfaces, thin films and low-dimensional structures | Condensed matter: electronic structure, electrical, magnetic, and optical properties | Physics | Scanning electron microscopy | Microscopy | Nanocomposites | Contact potentials | Tools | Nanomaterials | Nanostructure | Optimization
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12. Scanning probe microscopy of soft matter
: fundamentals and practices
by T͡Sukruk, V. V. (Vladimir Vasilʹevich) and Singamaneni, Srikanth
2012, ISBN 9783527639984, xix, 642
Scanning probe microscopy | Soft condensed matter
Book
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13. Scanning probe microscopy
: electrical and electromechanical phenomena at the nanoscale
by Kalinin, S. V and Gruverman, A
2007, ISBN 0387286675, 2 v. (xx, 980 p., [8] p. of plates)
Microscopie à sonde à balayage | Scanning probe microscopy | Nanoélectronique | Nanoelectronics
Book
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14. Applied scanning probe methods
2004, ISBN 3540005277, xx, 476
Book
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15. Full Text Fast mechanical model for probe–sample elastic deformation estimation in scanning probe microscopy
by Klapetek, Petr and Charvátová Campbell, Anna and Buršíková, Vilma
Ultramicroscopy, ISSN 0304-3991, 06/2019, Volume 201, pp. 18 - 27
Elastic deformation | Uncertainty | Scanning Probe Microscopy | 68.37.Ps | 62.25.-g | Microscopy | Technology | Science & Technology | Models | Multiprocessing | Analysis | Microscope and microscopy | Investigations
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16. Full Text Peak Force Infrared–Kelvin Probe Force Microscopy
by Jakob, Devon S and Wang, Haomin and Zeng, Guanghong and Otzen, Daniel E and Yan, Yong and Xu, Xiaoji G
Angewandte Chemie (International ed.), ISSN 1433-7851, 09/2020, Volume 59, Issue 37, pp. 16083 - 16090
perovskites | surface potential | scanning probe microscopy | IR spectroscopy | amyloid fibrils | Physical Sciences | Chemistry | Chemistry, Multidisciplinary | Science & Technology | Perovskite | Microscope and microscopy | Investigations | Correlation | Scanning probe microscopy | Fibrils | Crystals | Spatial discrimination | Mechanical properties | Infrared absorption | Nanomaterials | Perovskites | Microscopy | Infrared imaging | Amyloid | Spatial resolution | Nanotechnology | Conformation | Structure-function relationships | Index Medicus
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17. Full Text Nanoscale live-cell imaging using hopping probe ion conductance microscopy
by Moss, Guy W J and Klenerman, David and Smart, Trevor G and Lab, Max J and Frolenkov, Gregory I and Li, Chao and Shevchuk, Andrew I and Caldwell, Matthew and Ostanin, Victor P and Gorelik, Julia and Korchev, Yuri E and Novak, Pavel and Stepanyan, Ruben and Hughes, Simon
Nature Methods, ISSN 1548-7091, 04/2009, Volume 6, Issue 4, pp. 279 - 281
Biochemistry & Molecular Biology | Life Sciences & Biomedicine | Biochemical Research Methods | Science & Technology | Reproducibility of Results | Nanotechnology - methods | Nanotechnology - instrumentation | Ions | Electric Conductivity | Image Enhancement - instrumentation | Equipment Design | Microscopy, Scanning Probe - methods | Animals | Microscopy, Scanning Probe - instrumentation | Cells, Cultured - ultrastructure | Sensitivity and Specificity | Image Enhancement - methods | Equipment Failure Analysis | Atomic force microscopy | Evaluation | Usage | Electrochemical analysis | Research | Cells | Scanning microscopy | Nanoscience | Microscopy | Cellular biology | Research methodology | Rodents | Index Medicus
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18. Full Text Differentiating Ferroelectric and Nonferroelectric Electromechanical Effects with Scanning Probe Microscopy
by Balke, Nina and Maksymovych, Petro and Jesse, Stephen and Herklotz, Andreas and Tselev, Alexander and Eom, Chang-Beom and Kravchenko, Ivan I and Yu, Pu and Kalinin, Sergei V and Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States). Center for Nanophase Materials Sciences (CNMS)
ACS nano, ISSN 1936-0851, 06/2015, Volume 9, Issue 6, pp. 6484 - 6492
scanning probe microscopy | electrostatics | relaxors | ferroelectricity | Physical Sciences | Chemistry | Materials Science | Nanoscience & Nanotechnology | Technology | Materials Science, Multidisciplinary | Science & Technology - Other Topics | Chemistry, Multidisciplinary | Chemistry, Physical | Science & Technology | MATERIALS SCIENCE
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