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Nano Letters, ISSN 1530-6984, 11/2010, Volume 10, Issue 11, pp. 4405 - 4408
Journal Article
Chemical Communications, ISSN 1359-7345, 4/2014, Volume 5, Issue 38, pp. 4873 - 488
One of the experimental challenges in the study of nanomaterials in liquids in the (scanning) transmission electron microscope ((S)TEM) is gaining quantitative... 
IN-SITU OBSERVATION | NANOPARTICLES | IMAGING PROTEIN | GROWTH | RESOLUTION | NANOMATERIALS | DYNAMICS | NUCLEATION | CELL | CHEMISTRY, MULTIDISCIPLINARY | WATER | Scanning electron microscopy | Electric potential | Liquids | Transmission electron microscopy | Imaging | Voltage | Nanomaterials | Optimization
Journal Article
Ultramicroscopy, ISSN 0304-3991, 05/2015, Volume 152, pp. 57 - 62
We present results from an aberration corrected scanning transmission electron microscope which has been customised for high resolution quantitative Lorentz... 
Differential phase contrast | Aberration correction | Lorentz microscopy | Magnetic thin films | ELEMENTS | RESOLUTION | MICROSCOPY | STEM | Magnetism | Magnetization | Electron microscopy | Transmission electron microscopes | Scanning electron microscopy | Microscopy | Imaging | Customizing | Instrumentation | Hardware | Aberration | Magnetic fields
Journal Article
1998, Royal Microscopical Society microscopy handbooks, ISBN 9781859960660, Volume 39., xii, 114
Book
Nano Letters, ISSN 1530-6984, 03/2010, Volume 10, Issue 3, pp. 1028 - 1031
Journal Article
Ultramicroscopy, ISSN 0304-3991, 2010, Volume 110, Issue 7, pp. 903 - 923
We explore the dynamics of image formation in the so-called annular bright field mode in scanning transmission electron microscopy, whereby an annular detector... 
Annular bright field (ABF) | Scanning transmission electron microscopy (STEM) | High angle annular dark field (HAADF) | S-STATE MODEL | PHASE-CONTRAST | RESOLUTION | DETECTOR | CRYSTALS | DIFFRACTION | TILT | ADF-STEM | MICROSCOPY | Electron microscopy | Detectors | Scanning electron microscopy | Dynamics | Annular | Imaging | Images | Scanning transmission electron microscopy | Image contrast
Journal Article
Ultramicroscopy, ISSN 0304-3991, 03/2014, Volume 138, pp. 28 - 35
We report the development of revolving scanning transmission electron microscopy – RevSTEM – a technique that enables characterization and removal of sample... 
Revolving STEM (RevSTEM) | Drift correction | Scanning transmission electron microscopy (STEM) | Projective standard deviation (PSD) | Image distortion | Signal to noise ratio | Z-CONTRAST | MICROSCOPY | Revolving STEM (ReySTEM) | STEM | Electron microscopy | Structure | Analysis | Crystals
Journal Article
Ultramicroscopy, ISSN 0304-3991, 02/2016, Volume 161, pp. 146 - 160
Journal Article