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Science (American Association for the Advancement of Science), ISSN 1095-9203, 2018, Volume 359, Issue 6381, pp. 1243 - 1246
...). The catalytic action of individual Ni atoms at the edges of a growing graphene flake was directly captured by scanning tunneling microscopy imaging at the millisecond time scale, while force field... 
CATALYSIS | GOLD | MULTIDISCIPLINARY SCIENCES | ATOMISTIC MECHANISMS | EQUILIBRIUM | SURFACE | IN-SITU OBSERVATIONS | DIFFUSION | NI | IDENTIFICATION | EDGE | Atoms | Nickel | Research | Graphene | Chemical research | Atomic force microscopy | Metals | Molecular dynamics | High temperature | Heavy metals | Scanning tunneling microscopy | Solid surfaces | Metal surfaces | Microscopy | Mathematical analysis | Density functional theory | Catalysis | Diffusion
Journal Article
Angewandte Chemie International Edition, ISSN 1433-7851, 04/2010, Volume 49, Issue 15, pp. 2708 - 2710
Close up: The atomic arrangement of industrial‐style MoS2 nanocatalysts can be scrutinized by using single‐atom‐sensitive electron microscopy (see picture).... 
electron microscopy | heterogeneous catalysis | chalcogens | single‐atom imaging | molybdenum | Heterogeneous catalysis | Chalcogens | Electron microscopy | Single-atom imaging | Molybdenum | single-atom imaging | RESOLUTION | FULLERENE-LIKE NANOPARTICLES | MICROSCOPY | CHEMISTRY, MULTIDISCIPLINARY | INORGANIC NANOTUBES | SITES | HYDROTREATING CATALYSTS | S NANOCLUSTERS | MORPHOLOGY
Journal Article
Nature (London), ISSN 1476-4687, 2008, Volume 454, Issue 7202, pp. 319 - 322
Journal Article
Physical review. B, Condensed matter and materials physics, ISSN 1550-235X, 2014, Volume 90, Issue 8
High-resolution atomic force microscopy (AFM) and scanning tunneling microscopy (STM) imaging with functionalized tips is well established, but a detailed understanding of the imaging mechanism is still missing... 
PHYSICS, CONDENSED MATTER | ENERGY | PHYSICS, APPLIED | SINGLE-ATOM | MOLECULE | MATERIALS SCIENCE, MULTIDISCIPLINARY | FORCE MICROSCOPY | SURFACE | DYNAMICS | Physics - Mesoscale and Nanoscale Physics
Journal Article
Physical review. B, Condensed matter and materials physics, ISSN 1098-0121, 07/2013, Volume 88, Issue 2
The dynamic responses of a rhodium catalyst and a graphene sheet are investigated upon random excitation with 80 kV electrons. An extraordinary electron... 
PHYSICS, CONDENSED MATTER | PHYSICS, APPLIED | CARBON | MONOCHROMATOR | ILLUMINATION | MATERIALS SCIENCE, MULTIDISCIPLINARY | RESOLUTION | MOLECULES | TRANSMISSION ELECTRON-MICROSCOPY | SINGLE-ATOM SENSITIVITY | RADIATION-DAMAGE | TEM | DOSE-RATE
Journal Article
Ultramicroscopy, ISSN 0304-3991, 09/2017, Volume 180, pp. 150 - 155
Single-atom imaging and spectroscopy at a lower accelerating voltage (~60kV) has been largely facilitated by the development of aberration correctors for transmission electron microscopy (TEM)/ scanning TEM (STEM... 
Low voltage | STEM-EELS | Light element | One-dimensional material | Single-atom detection | VOLTAGE | RESOLUTION | DELOCALIZATION | CRYSTAL | MICROSCOPY | STEM | ENERGY-LOSS SPECTROSCOPY | FIELD ELECTRON-MICROSCOPY | CORRECTOR | ABERRATION CORRECTION | SCATTERING | Atoms | Spectrum analysis
Journal Article
Ultramicroscopy, ISSN 0304-3991, 2010, Volume 110, Issue 8, pp. 935 - 945
...) imaging, for which the signal is larger. Because of its strong Z dependence, ADF allows the chemical identification of individual atoms, both heavy and light... 
Aberration correction | ADF | Graphene | EELS | Nanotube | STEM | SINGLE ATOMS | CARBON | RESOLUTION | LOSS SPECTROSCOPY | MICROSCOPY | DAMAGE | NANOPEAPOD | TRANSMISSION ELECTRON-MICROSCOPE | Atoms | Scanning electron microscopy | Energy transmission | Imaging | Images | Nanostructure | Scanning transmission electron microscopy | Electron energy loss spectroscopy
Journal Article
Nature communications, ISSN 2041-1723, 2016, Volume 7, Issue 1, pp. 12532 - 12532
The aberration-corrected scanning transmission electron microscope (STEM) has emerged as a key tool for atomic resolution characterization of materials, allowing the use of imaging modes such as Z-contrast and spectroscopic mapping... 
TOMOGRAPHY | SINGLE ATOMS | PHASE | HOLOGRAPHY | SPHERICAL-ABERRATION | ILLUMINATION | MULTIDISCIPLINARY SCIENCES | MICROSCOPY | WALLED CARBON NANOTUBES | WIGNER-DISTRIBUTION DECONVOLUTION | STEM
Journal Article
Philosophical Magazine: Electron Microscopy and Diffraction of Defects, Nanostructures, Interfaces and Amorphous Materials: Conference to Mark the Retirement of Professor David Cockayne FRS, ISSN 1478-6435, 12/2010, Volume 90, Issue 35-36, pp. 4731 - 4749
Journal Article
Microscopy and microanalysis, ISSN 1431-9276, 07/2016, Volume 22, Issue S3, pp. 862 - 863
...  862 doi:10.1017/S1431927616005158 Single Atom Imaging and Spectroscopy of Impurities in 2D Materials Wu Zhou1, Andrew R. Lupini1, Junhao Lin1,2, Yongji Gong3... 
Analytical and Instrumentation Science Symposia | Single Atom Electron Microscopy and Spectroscopy
Journal Article
Nano letters, ISSN 1530-6984, 05/2012, Volume 12, Issue 5, pp. 2352 - 2356
Journal Article
New journal of physics, ISSN 1367-2630, 2011, Volume 13, Issue 4, p. 043007
.... One of the microscope objectives allows local imaging of the trapped Fermi gas of Li-6 atoms with a maximum resolution of 660 nm, while the other enables the generation of arbitrary optical dipole... 
PHYSICS, MULTIDISCIPLINARY | SINGLE ATOMS | QUANTUM
Journal Article
New journal of physics, ISSN 1367-2630, 09/2014, Volume 16, Issue 9, pp. 93064 - 15
Journal Article
Microscopy and microanalysis, ISSN 1431-9276, 07/2016, Volume 22, Issue S3, pp. 878 - 879
...  878 doi:10.1017/S1431927616005237 Performance of the SALVE-microscope: Atomic-resolution TEM Imaging at 20kV Martin Linck1, Peter Hartel1, Stephan Uhlemann1... 
Analytical and Instrumentation Science Symposia | Single Atom Electron Microscopy and Spectroscopy
Journal Article
Microscopy and microanalysis, ISSN 1431-9276, 07/2016, Volume 22, Issue S3, pp. 876 - 877
...  876 doi:10.1017/S1431927616005225 Imaging at the Single-Atom Level in Closed-Cell In Situ Gas Reactions Lawrence F. Allard1, Sibin Duan2 and Jingyue (Jimmy... 
Analytical and Instrumentation Science Symposia | Single Atom Electron Microscopy and Spectroscopy
Journal Article