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IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, ISSN 0278-0070, 09/2017, Volume 36, Issue 9, pp. 1571 - 1579
Journal Article
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, ISSN 0278-0070, 04/2012, Volume 31, Issue 4, pp. 610 - 619
Journal Article
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, ISSN 0278-0070, 01/2017, Volume 36, Issue 1, pp. 184 - 197
Journal Article
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, ISSN 0278-0070, 09/2013, Volume 32, Issue 9, pp. 1369 - 1382
Journal Article
Computers and Electrical Engineering, ISSN 0045-7906, 10/2018, Volume 71, pp. 309 - 320
Journal Article
Journal Article
IEICE Electronics Express, ISSN 1349-2543, 2017, Volume 14, Issue 13, p. 20170502
Test data compression is an effective methodology for reducing test data volume and testing time. This paper presents a new test data compression approach... 
Code | Test data compression | Bit reversion | SCHEME | POWER | code | bit reversion | test data compression | ENGINEERING, ELECTRICAL & ELECTRONIC | Reversion | Compression ratio | Fault detection | Data compression | Testing time | Compression tests | Reversing
Journal Article
Journal of Electronic Testing, ISSN 0923-8174, 12/2018, Volume 34, Issue 6, pp. 685 - 695
Journal Article
Integration, the VLSI Journal, ISSN 0167-9260, 09/2014, Volume 47, Issue 4, pp. 499 - 509
Journal Article
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, ISSN 0278-0070, 11/2013, Volume 32, Issue 11, pp. 1762 - 1775
Journal Article
Computers and Electrical Engineering, ISSN 0045-7906, 05/2014, Volume 40, Issue 4, pp. 1053 - 1063
[Display omitted] •An efficient technique for the reduction of test data volume and test power is presented.•Test set with more X-bits are considered for... 
SYSTEM | SCHEME | SHIFT | COMPUTER SCIENCE, HARDWARE & ARCHITECTURE | COMPUTER SCIENCE, INTERDISCIPLINARY APPLICATIONS | TEST DATA VOLUME | ARCHITECTURE | TIME | RUN-LENGTH | CAPTURE | ENGINEERING, ELECTRICAL & ELECTRONIC | Electrical engineering | Electric power generation | Power consumption | Circuits | Compression tests | Benchmarking | Digital | Test sets
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