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Nanotechnology, ISSN 1361-6528, 2016, Volume 27, Issue 12, pp. 125704 - 125713
.... Atomic force microscopy (AFM), in particular, is used extensively since it provides three-dimensional images that enable the measurement of the lateral dimensions of graphene films as well as the thickness... 
atomic force microscopy | graphite | graphene | PHYSICS, APPLIED | ANOMALIES | MATERIALS SCIENCE, MULTIDISCIPLINARY | RAMAN-SPECTROSCOPY | MODE | NANOSCIENCE & NANOTECHNOLOGY | ATOMIC-FORCE MICROSCOPY | GROWTH | CRYSTALS | ROADMAP | MICA | Thickness | Atomic force microscopy | Graphene | Tapping | Imaging | Images | Electronics | Three dimensional
Journal Article
Circulation (New York, N.Y.), ISSN 0009-7322, 12/2012, Volume 126, Issue 24, pp. 2890 - 2909
Journal Article
Journal Article
Journal of Materials Processing Tech, ISSN 0924-0136, 08/2017, Volume 246, pp. 267 - 275
Journal Article
Measurement : journal of the International Measurement Confederation, ISSN 0263-2241, 2019, Volume 137, pp. 179 - 188
•The research investigates parameters in Ultrasonic Thickness Measurement (UTM).•Each parameter has an impact on measurement result... 
Ultrasonic thickness measurement | Measurement uncertainty | Design of experiments | Monte Carlo simulation | VELOCITY | INSTRUMENTS & INSTRUMENTATION | ENGINEERING, MULTIDISCIPLINARY | STATISTICAL CALCULATIONS | METRICS | SURFACE | SIGNALS | Measurement | Monte Carlo method | Mechanical engineering | Analysis
Journal Article
Reviews in chemical engineering, ISSN 2191-0235, 2019, Volume 35, Issue 5, pp. 627 - 647
Journal Article