X
Search Filters
Format Format
Format Format
X
Sort by Item Count (A-Z)
Filter by Count
Journal Article (4115) 4115
Conference Proceeding (1570) 1570
Publication (196) 196
Book Chapter (111) 111
Dissertation (68) 68
Patent (61) 61
Magazine Article (32) 32
Book / eBook (12) 12
Book Review (11) 11
Newspaper Article (10) 10
Government Document (5) 5
Trade Publication Article (5) 5
Newsletter (2) 2
Paper (2) 2
Journal / eJournal (1) 1
Reference (1) 1
Report (1) 1
Streaming Video (1) 1
more...
Subjects Subjects
Subjects Subjects
X
Sort by Item Count (A-Z)
Filter by Count
voltage (1919) 1919
engineering, electrical & electronic (1510) 1510
voltage stability (1287) 1287
voltage collapse (1104) 1104
electric potential (989) 989
power system stability (956) 956
reactive power (714) 714
stability (520) 520
voltage control (512) 512
collapse (417) 417
stability analysis (406) 406
load flow (400) 400
physics, applied (398) 398
analysis (397) 397
optimization (390) 390
electric power systems (365) 365
power systems (360) 360
power system dynamics (314) 314
control systems (292) 292
algorithms (284) 284
mathematical models (277) 277
spannung (275) 275
power system modeling (269) 269
bifurcation (258) 258
index medicus (255) 255
materials science, multidisciplinary (254) 254
computer simulation (245) 245
animals (232) 232
research (207) 207
energy & fuels (204) 204
power generation (203) 203
power system analysis computing (203) 203
power system security (197) 197
stability criteria (181) 181
electric power generation (157) 157
distributed generation (154) 154
devices (153) 153
usage (152) 152
generators (151) 151
mathematical analysis (151) 151
capacitors (149) 149
breakdown voltage (144) 144
electrodes (142) 142
dynamics (140) 140
buses (137) 137
current collapse (136) 136
load modeling (135) 135
power flow (132) 132
networks (127) 127
engineering (126) 126
hemts (122) 122
security (120) 120
spannungsstabilität (118) 118
humans (116) 116
simulation (115) 115
power system simulation (112) 112
jacobian matrices (106) 106
threshold voltage (105) 105
electrical engineering (104) 104
load shedding (104) 104
voltage measurement (104) 104
switches (98) 98
gallium nitride (97) 97
physics, condensed matter (97) 97
equations (93) 93
aluminum gallium nitride (91) 91
bifurcations (91) 91
instability (91) 91
aluminum gallium nitrides (90) 90
blindleistung (87) 87
algorithm (86) 86
gan (86) 86
batteries (84) 84
load (84) 84
cell biology (83) 83
circuits (83) 83
technology (83) 83
design (82) 82
performance (82) 82
physics (82) 82
power system reliability (82) 82
chemistry, physical (81) 81
semiconductor devices (81) 81
dynamical systems (80) 80
cathodes (79) 79
spannungseinbruch (78) 78
article (77) 77
multidisciplinary sciences (77) 77
power system control (77) 77
chemistry (75) 75
electricity distribution (74) 74
indexes (74) 74
measurement (73) 73
transistors (73) 73
automatic voltage control (72) 72
biochemistry & molecular biology (72) 72
data buses (72) 72
elektrisches netz (72) 72
breakdown (71) 71
steady-state (71) 71
more...
Library Location Library Location
Language Language
Language Language
X
Sort by Item Count (A-Z)
Filter by Count
English (5545) 5545
Chinese (111) 111
Japanese (36) 36
Portuguese (34) 34
Spanish (17) 17
French (14) 14
Russian (4) 4
German (3) 3
Polish (3) 3
Korean (2) 2
Slovenian (2) 2
Ukrainian (2) 2
Czech (1) 1
Indonesian (1) 1
Latvian (1) 1
Norwegian (1) 1
Romanian (1) 1
more...
Publication Date Publication Date
Click on a bar to filter by decade
Slide to change publication date range


IEEE Transactions on Smart Grid, ISSN 1949-3053, 07/2016, Volume 7, Issue 4, pp. 1979 - 1988
Journal Article
Electric Power Systems Research, ISSN 0378-7796, 02/2014, Volume 107, pp. 77 - 84
•Using some indices which share a common background, proximity to voltage instability is estimated.•A novel index for estimating proximity to voltage... 
Voltage index | Power system voltage stability | Thévenin impedance | Voltage collapse | STABILITY | ONLINE TRACKING | PARAMETERS | Thevenin impedance | ENGINEERING, ELECTRICAL & ELECTRONIC
Journal Article
IEEE Transactions on Power Systems, ISSN 0885-8950, 03/2018, Volume 33, Issue 2, pp. 1184 - 1194
Journal Article
International Journal of Electrical Power and Energy Systems, ISSN 0142-0615, 11/2016, Volume 82, pp. 392 - 399
•Statistical models are able to infer about voltage collapse proximity.•The method is applied to IEEE 14-bus system and the 190-buses Mexican equivalent.•The... 
Voltage stability | Statistic | Estimation | Voltage collapse | SYSTEM | STABILITY | VULNERABILITY | ENGINEERING, ELECTRICAL & ELECTRONIC | Electric power systems | Control systems | Methods | Databases | Proximity | Equivalence | Mathematical analysis | Test procedures | On-line systems | Strategy
Journal Article
Journal of Physics D: Applied Physics, ISSN 0022-3727, 08/2018, Volume 51, Issue 34, p. 345102
This paper reports on the studies of current collapse phenomenon induced by surface trapped charges during gate pulse switching in AlGaN/GaN heterostructure... 
current collapse | gallium nitride (GaN) | surface donor-like traps | semiconductor devices | VOLTAGE | PHYSICS, APPLIED | PASSIVATION | HETEROSTRUCTURES | SILICON | LEAKAGE CURRENT | SIMULATION | FIELD-EFFECT TRANSISTORS | TRANSIENTS | HEMTS | DEVICES
Journal Article
IEEE Transactions on Electron Devices, ISSN 0018-9383, 03/2008, Volume 55, Issue 3, pp. 712 - 720
Journal Article
Superlattices and Microstructures, ISSN 0749-6036, 01/2018, Volume 113, pp. 810 - 820
In this paper, the drain current collapse in AlGaN/GaN High Electron Mobility Transistor (HEMT) with field plate engineering is investigated. A small signal... 
Current collapse | Small signal model | HighPower | GaN | HEMT | AlGaN | PHYSICS, CONDENSED MATTER | GAN-HEMT | GATE STRUCTURE | ELECTRON-MOBILITY TRANSISTORS | PARAMETERS | FIELD PLATES | BREAKDOWN VOLTAGE | CHANNEL MOSFETS | SURFACE | DEVICES | SIMULATIONS
Journal Article
IEEE Transactions on Circuits and Systems II: Express Briefs, ISSN 1549-7747, 10/2016, Volume 63, Issue 10, pp. 964 - 968
This brief describes a charge redistribution transient cell supply voltage collapse write assist (CR-TVC-WA) for static random access memory. Although wordline... 
Energy consumption | write assist circuit | FinFET static random access memory (SRAM) | Random access memory | Logic gates | Energy-efficient assist technique | Capacitance | Stability analysis | Circuit stability | Voltage control | ENGINEERING, ELECTRICAL & ELECTRONIC | Research | Analysis | Voltage
Journal Article
Solid State Electronics, ISSN 0038-1101, 11/2017, Volume 137, pp. 1 - 5
•Neutral beam etching is applied to the gate recess process of AlGaN/GaN HEMTs.•The plasma beams with sufficient and insufficient neutralization are... 
Current collapse | HEMTs | Gate recess | Neutral beam | GaN | PHYSICS, CONDENSED MATTER | VOLTAGE | PHYSICS, APPLIED | PERFORMANCE | SUPPRESSION | ENGINEERING, ELECTRICAL & ELECTRONIC | Transistors | Research institutes | Electric properties
Journal Article
International Journal of Electrical Power and Energy Systems, ISSN 0142-0615, 06/2016, Volume 78, pp. 248 - 257
•This paper presents an optimal load shedding scheme to prevent voltage collapse.•The proposed method utilizes wide area voltage stability index.•Improved... 
Wide Area Measurement System (WAMS) | Voltage collapse | Load shedding | Stability index | STABILITY | ALGORITHM | ENGINEERING, ELECTRICAL & ELECTRONIC | Electric power systems | Algorithms | Electric properties | Electric potential | Buses (vehicles) | Stability | Run time (computers) | Voltage | Instability | Optimization
Journal Article
IEEE Transactions on Power Delivery, ISSN 0885-8977, 10/2016, Volume 31, Issue 5, pp. 2114 - 2122
Journal Article
IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control, ISSN 0885-3010, 11/2011, Volume 58, Issue 11, pp. 2475 - 2483
Journal Article
IEEE Transactions on Power Systems, ISSN 0885-8950, 02/2003, Volume 18, Issue 1, pp. 3 - 10
Journal Article
IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control, ISSN 0885-3010, 08/2006, Volume 53, Issue 8, pp. 1513 - 1523
Journal Article
IEEE Transactions on Power Systems, ISSN 0885-8950, 02/1999, Volume 14, Issue 1, pp. 158 - 165
Journal Article