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2009, 2nd ed., ISBN 0387765026, lxii, 760 p., (I1-15)
This groundbreaking text has been established as the market leader throughout the world. Profusely illustrated now in full colour throughout, the book provides... 
Microscopy | Transmission electron microscopy | Materials | Solid State Physics | Characterization and Evaluation of Materials | Materials Science | Spectroscopy and Microscopy | Continuum Mechanics and Mechanics of Materials | Nanotechnology
Book
Science (American Association for the Advancement of Science), ISSN 1095-9203, 2008, Volume 321, Issue 5887, pp. 379 - 382
Journal Article
2003, ISBN 9781402073656, xxiii, 713
This textbook provides an in-depth introduction to the theories and applications of the powder diffraction method for structure determination... 
X-ray crystallography | Measurement | Powders | Diffraction | Optical properties | X-rays | Atomic and Molecular Structure and Spectra | Characterization and Evaluation of Materials | Condensed Matter | Material Science | Physical Chemistry | Crystallography
Book
Journal of the American Chemical Society, ISSN 0002-7863, 04/2012, Volume 134, Issue 14, pp. 6337 - 6343
.... In this Article, these changes in Li–S batteries are studied in operando by X-ray diffraction and transmission X-ray microscopy... 
CATHODE | LIQUID ELECTROLYTES | CELLS | LI-ION | SPECTROSCOPY | ION BATTERY | DISCHARGE PROCESS | COMPOSITES | CHEMISTRY, MULTIDISCIPLINARY | ELECTROCHEMICAL PERFORMANCE | Measurement | Usage | Diffraction | X-ray microscopy | Innovations | X-rays | Lithium cells | Chemical properties | Sulfur | Surface energy | Methods | Electric properties
Journal Article
Journal Article
Journal of the Optical Society of America. A, Optics, image science, and vision, ISSN 1520-8532, 2006, Volume 23, Issue 5, pp. 1179 - 1200
Journal Article
Applied physics letters, ISSN 1077-3118, 2010, Volume 96, Issue 9, pp. 091102 - 091102-3
We have carried out a ptychographic scanning coherent diffraction imaging experiment on a test object in order to characterize the hard x-ray nanobeam in a scanning x-ray microscope... 
X-ray diffraction | PHYSICS, APPLIED | PHASE RETRIEVAL | X-ray microscopy | RESOLUTION | statistics | INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY | X RADIATION | SPATIAL RESOLUTION | HARD X RADIATION | STATISTICS | X-RAY DIFFRACTION | MICROSCOPES | COHERENT SCATTERING | MICROSCOPY | IONIZING RADIATIONS | MATHEMATICS | ELECTROMAGNETIC RADIATION | RADIATIONS | DIFFRACTION | POSITIONING | SCATTERING
Journal Article