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2012, ISBN 1439873127, cm.
Book
Journal of Applied Crystallography, ISSN 1600-5767, 08/2018, Volume 51, Issue 4, pp. 1226 - 1228
Journal Article
Journal Article
Nuclear Inst. and Methods in Physics Research, A, ISSN 0168-9002, 2012, Volume 667, pp. 32 - 37
SPODI is a high-resolution thermal neutron diffractometer at the research reactor Heinz Maier-Leibnitz (FRM II) especially dedicated to structural studies of... 
Neutron instrumentation | Powder diffraction | Neutron diffraction | Multidetector | Powder diffractometer | INSTRUMENTS & INSTRUMENTATION | NUCLEAR SCIENCE & TECHNOLOGY | DIFFRACTION | PHYSICS, NUCLEAR | PHYSICS, PARTICLES & FIELDS | Furnaces | Powders | Diffractometers | Detectors | Monochromators | Devices | Arrays | Electric fields | Nuclear research reactors | Standards
Journal Article
Journal of Synchrotron Radiation, ISSN 1600-5775, 11/2013, Volume 20, Issue 6, pp. 994 - 998
Journal Article
Journal of Applied Crystallography, ISSN 1600-5767, 06/2018, Volume 51, Issue 3, pp. 761 - 767
This article reports the development and characterization of a laboratory‐based high‐resolution X‐ray powder diffractometer equipped with a 5.5 T magnet and... 
X‐ray powder diffraction | X‐ray diffractometers | phase transitions | magnetic fields | X-ray diffractometers | Magnetic fields | Phase transitions | X-ray powder diffraction | ROOM-TEMPERATURE | MARTENSITIC PHASES | DETECTOR | CRYSTAL-STRUCTURES | CRYSTALLOGRAPHY | CHEMISTRY, MULTIDISCIPLINARY | Investigations | Diffraction patterns | Energy resolution | Radiation | Helium | Powder
Journal Article
Journal of Applied Crystallography, ISSN 1600-5767, 10/2014, Volume 47, Issue 5, pp. 1520 - 1534
The application of Rietveld texture analysis (RTA) to time‐of‐flight (TOF) neutron diffraction data allows complex materials with many diffraction peaks to be... 
full pattern fit methods | geological materials | neutron time‐of‐flight diffractometers | texture analysis | neutron time-of-flight diffractometers | MICROSTRUCTURES | BIOTITE GNEISS | ZONE | DIFFRACTION | ELASTIC-ANISOTROPY | CRYSTALLOGRAPHY | PREFERRED ORIENTATION | DEFORMATION | CHEMISTRY, MULTIDISCIPLINARY | QUARTZ | Neutrons | Crystallography | Diffraction
Journal Article
Journal of Applied Crystallography, ISSN 1600-5767, 02/2011, Volume 44, Issue 1, pp. 247 - 251
SINGLE, a program that runs under Windows operating systems, can be used to control a variety of four‐circle Eulerian‐cradle single‐crystal diffractometers... 
diffractometer control software | single‐crystal diffraction | cell parameter determination | single-crystal diffraction | REFINEMENT | PRESSURE | CONSTANTS | CRYSTALLOGRAPHY | CHEMISTRY, MULTIDISCIPLINARY | Eulers equations | Diffraction | Crystallography | Windows operating system | Crystals | Diffractometers | Single crystals
Journal Article
Journal of Applied Crystallography, ISSN 1600-5767, 12/2014, Volume 47, Issue 6, pp. 1931 - 1938
Journal Article
Journal of Applied Crystallography, ISSN 1600-5767, 06/2018, Volume 51, Issue 3, pp. 895 - 900
The coverage of a given diffraction instrument as a percentage of the area 2π of a pole figure hemisphere is a crucial parameter of each diffraction instrument... 
pole figure coverage | neutron diffraction | texture | GMT | Neutron diffraction | Texture | Pole figure coverage | POST-PEROVSKITE | CRYSTALLOGRAPHY | DEFORMATION | CHEMISTRY, MULTIDISCIPLINARY | EVOLUTION | ALLOYS | RIETVELD METHOD | HIPPO | SYNCHROTRON DIFFRACTION IMAGES | TOF DIFFRACTOMETER | Diffraction | Diffractometers | Rotation | Flight | Distribution functions
Journal Article
Journal of Applied Crystallography, ISSN 1600-5767, 06/2011, Volume 44, Issue 3, pp. 655 - 658
A four‐circle neutron diffractometer with a new multi‐wafer 331 Si monochromator has been installed and commissioned on a thermal beamline at the High Flux... 
magnetism | neutron diffraction | monochromators | CRYSTALLOGRAPHY | Structure | Analysis | Crystals | Diffractometers | Bending | Mapping | Monochromators | Silicon | Curvature | Density | Symmetry
Journal Article
Journal of Applied Crystallography, ISSN 1600-5767, 04/2015, Volume 48, Issue 2, pp. 528 - 532
The occurrence of the basis‐forbidden Si 200 and Si 222 reflections in specular X‐ray diffraction ω–2Θ scans is investigated in detail as a function of the... 
forbidden reflections | multiple diffraction | X‐ray diffraction | silicon | Umweganregung | X-ray diffraction | CRYSTALLOGRAPHY | Crystallography | Diffraction | X rays | Planes | Diffractometers | Shoulders | X-rays | Silicon | Reflection | Orientation
Journal Article