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2006, 1. Aufl., ISBN 9783527310524, xxii, 356
With contributions by Paul F. Fewster and Christoph Genzel While X-ray diffraction investigation of powders and polycrystalline matter was at the forefront of... 
Thin films | X-ray spectroscopy | Analysis | Scattering | X-rays | Mechanical engineering & materials
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X-ray spectrometry, ISSN 0049-8246, 1972
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11.