X
Search Filters
Format Format
Format Format
X
Sort by Item Count (A-Z)
Filter by Count
Journal Article (7519) 7519
Conference Proceeding (551) 551
Publication (423) 423
Book Chapter (156) 156
Newspaper Article (153) 153
Book / eBook (136) 136
Magazine Article (49) 49
Newsletter (41) 41
Dissertation (15) 15
Trade Publication Article (13) 13
Government Document (12) 12
Book Review (11) 11
Paper (7) 7
Web Resource (3) 3
Reference (1) 1
more...
Subjects Subjects
Subjects Subjects
X
Sort by Item Count (A-Z)
Filter by Count
materials science, multidisciplinary (3392) 3392
microstructure (2628) 2628
metallurgy & metallurgical engineering (2371) 2371
electron backscatter diffraction (2114) 2114
ebsd (1868) 1868
scanning electron microscopy (1384) 1384
mikrostruktur (1379) 1379
deformation (1360) 1360
analysis (1355) 1355
alloys (1189) 1189
rückstreuelektronen-beugung (1162) 1162
texture (1152) 1152
electron back scatter diffraction (1137) 1137
grain boundaries (1114) 1114
materials science (1013) 1013
electron back scatter (968) 968
electron microscopy (949) 949
evolution (873) 873
microscopy (859) 859
diffraction (851) 851
crystallography (826) 826
mechanical properties (808) 808
nanoscience & nanotechnology (770) 770
behavior (737) 737
recrystallization (735) 735
mechanical-properties (719) 719
transmission electron microscopy (677) 677
orientation (649) 649
characterization and evaluation of materials (594) 594
steel (582) 582
physics, applied (565) 565
aluminum (541) 541
annealing (534) 534
backscattering (513) 513
copper (502) 502
elektronenmikroskopie (501) 501
x-ray diffraction (482) 482
korngrösse (474) 474
strain (468) 468
temperature (466) 466
crystals (464) 464
grain size (452) 452
grains (436) 436
transmissionselektronenmikroskopie (433) 433
electrons (429) 429
korngrenze (420) 420
dislocations (415) 415
metallic materials (406) 406
mikrogefüge (401) 401
twinning (401) 401
hardness (397) 397
dynamic recrystallization (375) 375
growth (368) 368
nickel (363) 363
electron diffraction (357) 357
surface layer (353) 353
crystal structure (352) 352
morphology (345) 345
materials science, characterization & testing (341) 341
nucleation (341) 341
plastic deformation (336) 336
chemistry, physical (333) 333
boundaries (329) 329
kristallorientierung (329) 329
deformation mechanisms (326) 326
material science (326) 326
mechanical engineering (324) 324
anisotropy (319) 319
precipitation (313) 313
nanotechnology (309) 309
martensite (308) 308
elektron (303) 303
rekristallisation (301) 301
titanium (298) 298
röntgendiffraktion (290) 290
elektronenbeugung (288) 288
aluminum base alloys (278) 278
metals (277) 277
mineralogy (269) 269
structural materials (269) 269
strength (267) 267
diffusion (265) 265
alloy (263) 263
mechanics (263) 263
plastic-deformation (262) 262
physics, condensed matter (258) 258
thin films (256) 256
materials (255) 255
austenite (249) 249
fatigue (249) 249
materials science, general (249) 249
austenit (242) 242
dislocation density (242) 242
kornorientierung (240) 240
silicon (238) 238
surfaces and interfaces, thin films (238) 238
iron (229) 229
geochemistry & geophysics (227) 227
slip (226) 226
microstructures (224) 224
more...
Library Location Library Location
Library Location Library Location
X
Sort by Item Count (A-Z)
Filter by Count
Gerstein Science - Stacks (62) 62
Engineering & Comp. Sci. - Stacks (18) 18
UofT at Mississauga - Stacks (16) 16
Physics - Stacks (10) 10
UTL at Downsview - May be requested (10) 10
Collection Dvlpm't (Acquisitions) - Closed Orders (8) 8
Earth Sciences (Noranda) - Stacks (6) 6
Online Resources - Online (4) 4
Robarts - Stacks (3) 3
Royal Ontario Museum - Stacks (3) 3
UofT at Scarborough - Stacks (3) 3
Aerospace - Stacks (2) 2
Engineering & Comp. Sci. - May be requested in 6-10 wks (2) 2
Astronomy & Astrophysics - Ask at library (1) 1
Chemistry (A D Allen) - Stacks (1) 1
Collection Dvlpm't (Acquisitions) - Cancelled Order (1) 1
Collection Dvlpm't (Acquisitions) - Vendor file (1) 1
Physics - Missing (1) 1
Physics - Reference (1) 1
UofT at Scarborough - Withdrawn (1) 1
more...
Language Language
Language Language
X
Sort by Item Count (A-Z)
Filter by Count
English (8018) 8018
Japanese (215) 215
Chinese (92) 92
Spanish (13) 13
German (11) 11
Korean (7) 7
Czech (2) 2
Portuguese (2) 2
Russian (2) 2
Arabic (1) 1
French (1) 1
Swedish (1) 1
more...
Publication Date Publication Date
Click on a bar to filter by decade
Slide to change publication date range


2009, 2. Aufl., ISBN 0387881352, 406
Electron backscatter diffraction is a very powerful and relatively new materials characterization technique aimed at the determination of crystallographic... 
Physics | Materials | Surfaces (Physics) | Condensed Matter | Characterization and Evaluation of Materials | Material Science | Geophysics/Geodesy | Materials Science, general
eBook
Advanced Engineering Materials, ISSN 1438-1656, 03/2017, Volume 19, Issue 3, p. n/a
Results of electron backscatter diffraction and X‐ray diffraction study on a microstructure, long range order, and texture evolution upon a differential speed... 
SINGLE-CRYSTALS | RECRYSTALLIZATION | BOUNDARIES | BORON | BEHAVIOR | MATERIALS SCIENCE, MULTIDISCIPLINARY | CRYSTALLOGRAPHIC TEXTURE | MECHANICAL-PROPERTIES | STRAIN | NI3AL | MICROSTRUCTURE | Twinning (Crystallography) | Diffraction | Intermetallic compounds | X-rays | Alloys
Journal Article
Microscopy and Microanalysis, ISSN 1431-9276, 5/2011, Volume 17, Issue 3, pp. 316 - 329
Since the automation of the electron backscatter diffraction (EBSD) technique, EBSD systems have become commonplace in microscopy facilities within materials... 
electron backscatter diffraction (EBSD) | elastic strain | orientation imaging microscopy (OIM) | residual strain | ALUMINUM | SINGLE-CRYSTALS | MATERIALS SCIENCE, MULTIDISCIPLINARY | PATTERNS | MICROSCOPY | POLYCRYSTALS | EBSD | SCATTERING | Materials science | Crystal lattices | Metallurgy
Journal Article
Crystal Research and Technology, ISSN 0232-1300, 01/2017, Volume 52, Issue 1, pp. 1600252 - n/a
We present special applications of electron backscatter diffraction (EBSD) which aim to overcome some of the limitations of this technique as it is currently... 
lattice parameters | channeling‐in and out | element number contrast | pseudosymmetry | polarity | channeling-in and out | ATOMIC-NUMBER | DETECTOR | CRYSTALLOGRAPHY | IDENTIFICATION | EBSD | KIKUCHI DIFFRACTION | PHASE | PATTERN | GRAIN | ORIENTATION | MICROSCOPE | Scanning electron microscopy | Simulation | Backscattering | Raw | Orientation | Lattice parameters | Electron back scatter diffraction | Standards
Journal Article
Ultramicroscopy, ISSN 0304-3991, 07/2019, Volume 202, pp. 87 - 99
•Systematic analysis on the efficacy of the use of dynamically simulated EBSPs for calibration and absolute strain determination was carried out.•A very... 
Differential evolution | Hr-ebsd | Calibration | Electron backscatter diffraction | Dynamical diffraction simulation | Pattern matching | Algorithms | Structure | Mathematical optimization | Analysis | Detectors | Crystals
Journal Article
Ultramicroscopy, ISSN 0304-3991, 08/2009, Volume 109, Issue 9, pp. 1148 - 1156
In 2006, Angus Wilkinson introduced a cross-correlation-based electron backscatter diffraction (EBSD) texture analysis system capable of measuring lattice... 
Scanning electron microscope | EBSD | Dislocations | Strain | MICROSCOPY | ORIENTATION | Laws, regulations and rules | Mechanical engineering | Alloys
Journal Article
Journal of Applied Crystallography, ISSN 1600-5767, 10/2019, Volume 52, Issue 5, pp. 1157 - 1168
A new methodology to predict potential pseudo‐symmetric or systematically mis‐indexed orientations for an arbitrary crystal structure is presented. The method... 
electron backscatter diffraction | spherical harmonic transform | EBSD | pseudo‐symmetry | autocorrelation | MATCHING APPROACH | CRYSTALLOGRAPHY | pseudo-symmetry | CHEMISTRY, MULTIDISCIPLINARY | Olivine | Diffraction patterns | Diffraction | Algorithms | Strontium titanates | Electron back scatter | Nickel | Autocorrelation | Crystal structure | Electrons | Indexing | Symmetry | MATERIALS SCIENCE
Journal Article
Palaeontology, ISSN 0031-0239, 09/2019, Volume 62, Issue 5, pp. 777 - 803
Journal Article