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Journal of Applied Crystallography, ISSN 1600-5767, 06/2015, Volume 48, Issue 3, pp. 797 - 813
Journal Article
Materials Characterization, ISSN 1044-5803, 01/2019, Volume 147, pp. 271 - 279
Microstructure characterisation has been greatly enhanced through the use of electron backscatter diffraction (EBSD), where rich maps are generated through... 
Microstructure | Electron imaging | Sparse sampling | ORIENTATION | MATERIALS SCIENCE, MULTIDISCIPLINARY | METALLURGY & METALLURGICAL ENGINEERING | MATERIALS SCIENCE, CHARACTERIZATION & TESTING | ABNORMAL GRAIN-GROWTH | EBSD
Journal Article
Ultramicroscopy, ISSN 0304-3991, 07/2011, Volume 111, Issue 8, pp. 1395 - 1404
A set of dynamically simulated electron backscatter patterns (EBSPs) for α-Ti crystals progressively rotated by 1° steps were analysed using cross-correlation... 
Deformation | Electron backscatter diffraction | Copper | Scanning electron microscope | EBSD | Strain | ORIENTATION | MICROSCOPY | ACCURACY | Fittings | High resolution | Lattices | Images | Density | Electron back scatter diffraction | Dislocations
Journal Article
Microscopy Research and Technique, ISSN 1059-910X, 12/2019, Volume 82, Issue 12, pp. 2035 - 2041
Electron backscatter diffraction (EBSD) device can provide crystal structure, orientation, and phase content data through analysis of EBSD patterns. The... 
image processing | edge detection | electron backscatter diffraction | Kikuchi bands | Diffraction patterns | Diffraction | Image processing | Mathematical analysis | Hough transformation | Electron back scatter | Reliability analysis | Axes (reference lines) | Crystal structure | Electrons | Kikuchi lines
Journal Article
Geology, ISSN 0091-7613, 05/2019, Volume 47, Issue 5, pp. 445 - 448
Cumulates, exposed as plutonic lithics in a volcanic host, provide insight into the storage conditions, evolution, and eruptibility of an otherwise invisible... 
ORIGIN | COMPLEX | GRANITE | NEW-ZEALAND | GEOLOGY | CALDERA | QUARTZ CLUSTERS | INSIGHTS | Compression | Deformation | Creep | Distortion | Compaction | Crystallography | Expulsion | Dislocation | Evolution | Volcanic eruptions | Backscatter | Grains | Lava | Microstructural analysis | Grain boundary migration | Orientation | Preferred orientation | Rotation | Magma | Dislocations | Diffraction | Analysis | Storage conditions | Organizations | Electron back scatter | Plagioclase
Journal Article
Acta Materialia, ISSN 1359-6454, 2006, Volume 54, Issue 15, pp. 3863 - 3870
The microtexture of 0.5–10 μm thick Cu films on polyimide substrates was characterized by automated electron backscatter diffraction (EBSD). The transition... 
Thin films | XRD | Copper | Texture | EBSD | texture | MATERIALS SCIENCE, MULTIDISCIPLINARY | METALLURGY & METALLURGICAL ENGINEERING | STRAIN-ENERGY | thin films | EVOLUTION | SUBSTRATE | SURFACE | copper | ABNORMAL GRAIN-GROWTH | STRESS | LAYER | Diffraction | Dielectric films | Analysis | X-rays | Surface layer | Driving | Evolution | Mathematical models | Microtexture | Electron back scatter diffraction
Journal Article
International Journal of Pressure Vessels and Piping, ISSN 0308-0161, 07/2018, Volume 164, pp. 32 - 38
Electron backscatter diffraction (EBSD) has been used to obtain orientation maps across a multi-pass slot weld in austenitic stainless steel plate.... 
Misorientation | Electron backscatter diffraction | Welding | Plasticity | ENGINEERING, MULTIDISCIPLINARY | ENGINEERING, MECHANICAL | Hardness | Analysis | Aerospace engineering
Journal Article
Ultramicroscopy, ISSN 0304-3991, 03/2012, Volume 114, pp. 82 - 95
In this paper we explore methods of measuring elastic strain variations in the presence of larger lattice rotations (up to ∼11°) using high resolution electron... 
SEM | Deformation | Electron backscatter diffraction | EBSD | Kinematics | Strain | BACK-SCATTER DIFFRACTION | FIELD | PATTERNS | MICROSCOPY | DISTRIBUTIONS | ALUMINUM | ORIENTATION | Measurement | Analysis | Algorithms
Journal Article
Journal of Applied Crystallography, ISSN 1600-5767, 04/2017, Volume 50, Issue 2, pp. 369 - 377
The twin distribution in topological insulators Bi2Te3 and Bi2Se3 was imaged by electron backscatter diffraction (EBSD) and scanning X‐ray diffraction... 
twinning | scanning X‐ray diffraction | topological insulators | electron backscatter diffraction | scanning X-ray diffraction | CRYSTALLOGRAPHY | CHEMISTRY, MULTIDISCIPLINARY | Thin films | Dielectric films | Epitaxy | Microscope and microscopy | Topology | Microscopy | Crystallography | Scattering
Journal Article
Journal of Materials Science, ISSN 0022-2461, 7/2019, Volume 54, Issue 14, pp. 10489 - 10505
Journal Article
Materials Characterization, ISSN 1044-5803, 2009, Volume 60, Issue 9, pp. 913 - 922
Journal Article