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Applied Physics Letters, ISSN 0003-6951, 08/2016, Volume 109, Issue 6, p. 62101
Journal Article
Journal of Microscopy, ISSN 0022-2720, 01/2017, Volume 265, Issue 1, pp. 51 - 59
Summary We have investigated the Ga+ ion‐damage effect induced by focused ion beam (FIB) milling in a [001] single crystal of a 316 L stainless steel by the... 
SEM | ECCI | EBSD | FIB | Dislocations | MICROSCOPY | LAYERS | SINGLE-CRYSTALS | BULK MATERIALS | STEEL | MICROSCOPE | SCALE | BACKSCATTER DIFFRACTION | MICROSTRUCTURE | PLASTICITY | Electron microscopes | Crystal defects | Ion beams
Journal Article
Scripta Materialia, ISSN 1359-6462, 03/2019, Volume 162, pp. 103 - 107
The dislocation structure of copper single crystal during cyclic fatigue has been characterized by the Rotational-Electron Channeling Contrast Imaging (R-ECCI)... 
Fatigue | Crystal defects | Scanning Electron microscopy (SEM) | Copper | Electron Channeling Contrast Imaging (ECCI) | MATERIALS SCIENCE, MULTIDISCIPLINARY | METALLURGY & METALLURGICAL ENGINEERING | NANOSCIENCE & NANOTECHNOLOGY | DEFORMATION | Engineering Sciences | Materials
Journal Article
Applied Physics Letters, ISSN 0003-6951, 06/2014, Volume 104, Issue 23, p. 232111
Journal Article
Microscopy, ISSN 2050-5698, 04/2017, Volume 66, Issue 2, pp. 63 - 67
We have investigated the dislocation configurations in a [0 0 1] single crystal of a facecentered alloy (316L stainless steel) by the electron channeling... 
SEM | Fcc metals | Dislocation contrast | Electron channeling contrast imaging | Local stress | Dislocation plasticity | dislocation plasticity | FRACTURE | local stress | STEEL | TEMPERATURE | dislocation contrast | MICROSCOPY | fcc metals | EBSD | electron channeling contrast imaging | PLASTICITY
Journal Article
Philosophical Magazine, ISSN 1478-6435, 02/2017, Volume 97, Issue 5, pp. 346 - 359
Journal Article
Scripta Materialia, ISSN 1359-6462, 2011, Volume 64, Issue 6, pp. 513 - 516
Journal Article
Key Engineering Materials, ISSN 1013-9826, 04/2018, Volume 768, pp. 52 - 58
In the paper, the influence factors of electron channeling contrast imaging (ECCI) on crystalline material microstructure characterization by scanning electron... 
Accelerating voltage | Electric current | Scanning electron microscope | Electron channeling contrast imaging | Sample material's surface conditions | Grain boundaries | Electric potential | Scanning electron microscopy | Channeling | Electron microscopes | Microscopes | Image contrast
Journal Article
Materials Science in Semiconductor Processing, ISSN 1369-8001, 06/2016, Volume 47, pp. 44 - 50
Journal Article
Scientific Reports, ISSN 2045-2322, 12/2017, Volume 7, Issue 1, pp. 9742 - 8
Nowadays Field Emission Gun-Scanning Electron Microscopes provide detailed crystallographic information with high spatial and angular resolutions, and allow... 
PATTERNS | DEFECTS | MULTIDISCIPLINARY SCIENCES | IN-SITU | DYNAMICAL THEORY | Scanning electron microscopy | Spatial discrimination | Condensed Matter | Materials Science | Physics
Journal Article
Acta Materialia, ISSN 1359-6454, 02/2017, Volume 125, pp. 125 - 135
We describe the development of cross-correlation based high resolution electron backscatter diffraction (HR-EBSD) and electron channelling contrast imaging... 
HEMTs | InAlN | ECCI | EBSD | Dislocations | DEFECT STRUCTURE | ALN | THREADING DISLOCATIONS | MATERIALS SCIENCE, MULTIDISCIPLINARY | METALLURGY & METALLURGICAL ENGINEERING | ALINN | DENSITY | GAN | InAIN | ORIENTATION | GROWTH | Thin films | Nitrides | Motion pictures | Dielectric films | Distribution
Journal Article