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ACM Transactions on Architecture and Code Optimization (TACO), ISSN 1544-3566, 09/2016, Volume 13, Issue 3, pp. 1 - 24
This article proposes a rate-adaptive, two-tiered error-correction scheme (RATT-ECC) that provides strong reliability (10 10 x reduction in raw FIT rate) for... 
error control coding | performance | 3D memory | reliability | Performance | Reliability | Error control coding | COMPUTER SCIENCE, HARDWARE & ARCHITECTURE | COMPUTER SCIENCE, THEORY & METHODS | Power consumption | Fault detection | Banks | Error detection | Error correction | Time measurements | Optimization
Journal Article
IEEE Transactions on Computers, ISSN 0018-9340, 02/2017, Volume 66, Issue 2, pp. 368 - 374
Journal Article
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, ISSN 0278-0070, 09/2017, Volume 36, Issue 9, pp. 1580 - 1591
Journal Article
IEEE Transactions on Circuits and Systems I: Regular Papers, ISSN 1549-8328, 02/2011, Volume 58, Issue 2, pp. 429 - 439
Journal Article
IEEE Micro, ISSN 0272-1732, 01/2011, Volume 31, Issue 1, pp. 11 - 19
Virtualized error checking and correcting (ECC) is a scheme that virtualizes memory-error correction. Unlike traditional uniform ECC, which provides a fixed... 
error checking and correcting | Virtual environment | fault tolerance | memory systems | ECC | Memory management | DRAM chips | Error correction codes | Error correction | Reliability | Servers | reliability | COMPUTER SCIENCE, SOFTWARE ENGINEERING | COMPUTER SCIENCE, HARDWARE & ARCHITECTURE | CODES | Memory (Computers) | Error-correcting codes | Usage | Demand | Redundant | Mapping | Tolerances | Marketing
Journal Article
IEEE Transactions on Computers, ISSN 0018-9340, 01/2011, Volume 60, Issue 1, pp. 20 - 34
Journal Article
IEEE Transactions on Circuits and Systems I: Regular Papers, ISSN 1549-8328, 07/2015, Volume 62, Issue 7, pp. 1794 - 1804
The reliability of NAND Flash memory deteriorates due to multi-level cell technique and advanced manufacturing technology. To deal with more errors, LDPC codes... 
NAND flash memory | Codecs | reconfigurable VLSI design | early-termination | quasi-cyclic low-density parity-check (QC-LDPC) codes | high-throughput | Generators | Encoding | Decoding | Flash memories | Iterative decoding | Cost-effective | ALGORITHM | ENGINEERING, ELECTRICAL & ELECTRONIC | DECISION ERROR-CORRECTION | WIMAX SYSTEM | PARITY-CHECK CODES | DECODER DESIGN | MU-M CMOS
Journal Article
IEICE Transactions on Electronics, ISSN 0916-8524, 01/2015, Volume E98C, Issue 1, pp. 53 - 61
A design strategy (the required ECC strength and the judgment method of the dominant error mode) of error-prediction low-density parity-check (EP-LDPC)... 
LDPC | NAND flash memory | ECC | Error-correcting code | Low-density parity-check | low-density parity-check | CELL | ENGINEERING, ELECTRICAL & ELECTRONIC | Design engineering | Errors | Tables (data) | Interference | Strategy | Flash memory (computers) | Error correction | Acceptability
Journal Article
IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences, ISSN 0916-8508, 12/2016, Volume E99A, Issue 12, pp. 2398 - 2411
Journal Article
Journal of Parallel and Distributed Computing, ISSN 0743-7315, 2009, Volume 69, Issue 10, pp. 848 - 853
Due to the potential wide deployment of Radio Frequency Identification (RFID), the security of RFID systems has drawn extensive attention from both academia... 
Error correction code | Anonymity | EPCglobal | RFID | Security | Authentication | CODES | COMPUTER SCIENCE, THEORY & METHODS | Computer network protocols | Radio frequency identification (RFID)
Journal Article
IEEE Transactions on Very Large Scale Integration (VLSI) Systems, ISSN 1063-8210, 10/2015, Volume 23, Issue 10, pp. 2332 - 2336
Journal Article
Expert Systems With Applications, ISSN 0957-4174, 06/2012, Volume 39, Issue 7, pp. 6562 - 6574
Journal Article
电子科学学刊:英文版, ISSN 0217-9822, 2014, Volume 31, Issue 4, pp. 290 - 297
In deep sub-micron ICs,growing amounts of on-die memory and scaling effects make embedded memories more vulnerable to reliability problems,such as soft errors... 
Engineering | Error Correction Code (ECC) | TN432 | Performance | Memory | Electrical Engineering | Error correction code (Ecc) | Error-correcting codes | Traffic regulations | Methods | Complementary metal oxide semiconductors
Journal Article
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