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Journal Article
NANOTECHNOLOGY, ISSN 0957-4484, 10/2019, Volume 30, Issue 43, p. 435301
We present a novel framework for the fabrication of geometrically complex structures at the micro- and nano-scale which relies on the synergy of integrated... 
PHYSICS, APPLIED | focused ion beam | MATERIALS SCIENCE, MULTIDISCIPLINARY | electron microscopy | NANOSCIENCE & NANOTECHNOLOGY | nano-fabrication | FABRICATION | patterning | computer-aided manufacturing | sample preparation | SURFACES
Journal Article
Journal of Crystal Growth, ISSN 0022-0248, 02/2018, Volume 484, pp. 56 - 63
We report on the selective area growth of InAs nanowires on patterned SiO /Si (1 1 1) nano-holes, prepared by focused helium ion beam technology. We used a... 
Focused helium ion beam | Selective area growth | InAs nanowire | NANOSPHERE LITHOGRAPHY | EPITAXY | PHYSICS, APPLIED | MATERIALS SCIENCE, MULTIDISCIPLINARY | CRYSTALLOGRAPHY
Journal Article
2007, ISBN 0521831997, xi, 395
The focused ion beam (FIB) system is an important tool for understanding and manipulating the structure of materials at the nanoscale. Combining this system... 
Industrial applications | Focused ion beams
Book
Microscopy Research and Technique, ISSN 1059-910X, 03/2013, Volume 76, Issue 3, pp. 290 - 295
Journal Article
Surface & Coatings Technology, ISSN 0257-8972, 2011, Volume 206, Issue 5, pp. 801 - 805
In this study, nano-patterned triangular photonic crystal arrays have been prepared on the surface of blue InGaN/GaN light-emitting diodes by focused ion beam... 
Gallium nitride | Nano-patterning | Focused ion beam | LIGHT-EMITTING-DIODES | PHYSICS, APPLIED | EXTRACTION EFFICIENCY | MATERIALS SCIENCE, COATINGS & FILMS | Chemical vapor deposition | Liquors | Electric potential | Gallium nitrides | Photonic crystals | Voltage | Nanomaterials | Nanostructure | Arrays | Ion beams
Journal Article
08/2015, ISBN 9781498711760, 260
Materials Processing by Cluster Ion Beams: History, Technology, and Applications discusses the contemporary physics, materials science, surface engineering... 
Physics | Surfaces (Technology) | Condensed Matter Physics | Materials Science | Industrial Electronics | Silicon | Congresses | Nanostructured materials | Ion bombardment | Materials | Effect of radiation on | Ion implantation
eBook
Surface & Coatings Technology, ISSN 0257-8972, 2005, Volume 198, Issue 1, pp. 165 - 168
An outline of the application of the focused ion beam (FIB) workstation to the characterization of wear-resistant coatings is provided. Specimen preparation... 
Coatings | Electron microscopy | Focused ion beam | THIN-FILMS | coatings | PHYSICS, APPLIED | focused ion beam | electron microscopy | MICROSCOPY | TEM | DAMAGE | MATERIALS SCIENCE, COATINGS & FILMS | Coatings industry | Chemical properties
Journal Article
Polish Journal of Chemical Technology, ISSN 1509-8117, 09/2014, Volume 16, Issue 3, pp. 40 - 44
The capabilities and applications of the focused ion beam (FIB) technology for detection of an electrochemical signal in nanoscale area are shown. The FIB... 
electrochemistry | FIB nanotechnology | nanosensor | ENGINEERING, CHEMICAL | NANOPARTICLES | BIOSENSORS | METAL | CHEMISTRY, APPLIED | ARRAYS | DIAGNOSTICS | MOLECULES | Electrodes | Liquids | Nanostructure | Sensors | Chemical technology | Constraining | Ion beams | Contact
Journal Article
Microelectronic Engineering, ISSN 0167-9317, 2011, Volume 88, Issue 1, pp. 121 - 126
By combining low-cost printed circuit board technology and focused ion beam techniques, a simple method has been developed to produce thermal microsensors in a... 
Printed circuit board | Focused ion beam | Thermal sensor | PHYSICS, APPLIED | NANOSCIENCE & NANOTECHNOLOGY | OPTICS | ENGINEERING, ELECTRICAL & ELECTRONIC | Microelectromechanical systems | Circuit components | Circuit printing | Printed circuits | Mechanical engineering | Platforms | Packages | Circuit boards | Evaporation | Devices | Deposition | Ion beams
Journal Article
Nami Jishu yu Jingmi Gongcheng/Nanotechnology and Precision Engineering, ISSN 1672-6030, 11/2014, Volume 12, Issue 6, pp. 424 - 428
Journal Article
Applied Physics Letters, ISSN 0003-6951, 01/2009, Volume 94, Issue 1, pp. 013101 - 013101-3
The authors report micro-Raman investigation of changes in the single and bilayer graphene crystal lattice induced by the low and medium energy electron-beam... 
PHYSICS, APPLIED | RESONANT RAMAN-SCATTERING | SPECTROSCOPY | DIAMOND | electron beam effects | GRAPHITE | SPECTRA | 1ST-ORDER | amorphisation | CARBON NANOTUBES | DAMAGE | focused ion beam technology | KEV RANGE 01-10 | ELECTRON BEAMS | ION BEAMS | NANOSTRUCTURES | RADIATION DOSES | MATERIALS SCIENCE | AMORPHOUS STATE | ELECTRON MICROSCOPY | CRYSTAL LATTICES | KEV RANGE 10-100 | IRRADIATION | CRYSTALS | FABRICATION
Journal Article
Applied Physics Letters, ISSN 0003-6951, 05/2012, Volume 100, Issue 21, pp. 213104 - 213104-4
Recent work on protein nanopores indicates that single molecule characterization (including DNA sequencing) is possible when the length of the nanopore... 
DNA TRANSLOCATION | PHYSICS, APPLIED | FABRICATION | GRAPHENE NANOPORES | Nanoscale Science and Technology
Journal Article
International Journal of Fatigue, ISSN 0142-1123, 2007, Volume 29, Issue 9, pp. 1803 - 1811
Journal Article
Review of Scientific Instruments, ISSN 0034-6748, 07/2011, Volume 82, Issue 7, pp. 076103 - 076103-3
We introduce a highly compact fiber-optic Fabry-Pérot refractive index sensor integrated with a fluid channel that is fabricated directly near the tip of a 32... 
REFRACTOMETER | INSTRUMENTS & INSTRUMENTATION | PHYSICS, APPLIED | INTERFEROMETER | fibre optic sensors | refractive index measurement | microcavities | focused ion beam technology | FEMTOSECOND LASER
Journal Article
Microelectronic Engineering, ISSN 0167-9317, 2000, Volume 54, Issue 3, pp. 211 - 221
Microfabrication process of plano-convex microlens arrays with continuous relief for refractive and diffractive usage by focused ion beam (FIB) technology is... 
Microfabrication | Focussed ion beam | Microlens array | PHYSICS, APPLIED | focussed ion beam | microfabrication | FABRICATION | OPTICS | microlens array | ENGINEERING, ELECTRICAL & ELECTRONIC
Journal Article
Applied Mechanics and Materials, ISSN 1660-9336, 2011, Volume 58-60, pp. 2171 - 2176
Focused ion beam (FIB) system is a powerful microfabrication tool which uses electronic lenses to focus the ion beam even up to nanometer level. The FIB... 
Bonding failure | Microelectronic device | Failure analysis | Focused ion beam
Conference Proceeding
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