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IEEE Electron Device Letters, ISSN 0741-3106, 08/2013, Volume 34, Issue 8, pp. 939 - 941
We investigate the temperature accelerated recovery from hot-carrier (HC) damage with the help of local polycrystalline heating structures in n-MOSFETs... 
oxide and interface defects | high-temperature techniques | hot carrier degradation | bias temperature instability | Automotive electronics | power MOSFET | semiconductor device reliability | MOSFETs | temperature annealing | PASSIVATION | CENTERS | ENGINEERING, ELECTRICAL & ELECTRONIC | HYDROGEN | SI-SIO2 INTERFACE | MODELS
Journal Article
IEEE Transactions on Electron Devices, ISSN 0018-9383, 07/2006, Volume 53, Issue 7, pp. 1583 - 1592
Journal Article
IEEE Electron Device Letters, ISSN 0741-3106, 09/2013, Volume 34, Issue 9, pp. 1139 - 1141
Journal Article
IEEE Electron Device Letters, ISSN 0741-3106, 03/2014, Volume 35, Issue 3, pp. 348 - 350
Journal Article
半导体学报, ISSN 1674-4926, 2009, Volume 30, Issue 7, pp. 70 - 75
A simple standard reaction-diffusion(RD) model assumes an infinite oxide thickness and a zero initial interface trap density, which is not the case in real MOS... 
初始值 | 边界条件 | 恢复时间 | 反应扩散 | 氧化层厚度 | 模型 | 界面陷阱密度 | 有限区域 | Negative bias temperature instability | Reaction-diffusion model | Interface-trap generation/passivation | Direct-current current-voltage | Charge pumping
Journal Article
IEEE Transactions on Nuclear Science, ISSN 0018-9499, 10/2017, Volume 64, Issue 10, pp. 2633 - 2638
Journal Article
IEEE Transactions on Electron Devices, ISSN 0018-9383, 03/2013, Volume 60, Issue 3, pp. 901 - 916
Journal Article
IEEE Electron Device Letters, ISSN 0741-3106, 11/2009, Volume 30, Issue 11, pp. 1194 - 1196
Journal Article
Applied Physics Letters, ISSN 0003-6951, 04/2008, Volume 92, Issue 13, pp. 133508 - 133508-3
Bias temperature-dependent characteristics of nanoscale silicon-oxide-nitride-oxide-silicon memories are investigated under program/erase (P/E) Fowler-Nordheim... 
RECOVERY | TRANSISTORS | PHYSICS, APPLIED | MOSFETS | INTERFACE-TRAP GENERATION
Journal Article