X
Search Filters
Format Format
Format Format
X
Sort by Item Count (A-Z)
Filter by Count
Journal Article (375) 375
Conference Proceeding (33) 33
Publication (27) 27
Book Chapter (15) 15
Dissertation (7) 7
Book Review (3) 3
Patent (2) 2
Book / eBook (1) 1
Government Document (1) 1
more...
Subjects Subjects
Subjects Subjects
X
Sort by Item Count (A-Z)
Filter by Count
internal photoemission (259) 259
physics, applied (175) 175
materials science, multidisciplinary (93) 93
physics, condensed matter (86) 86
photoemission (67) 67
silicon (64) 64
nanoscience & nanotechnology (63) 63
optics (61) 61
engineering, electrical & electronic (60) 60
chemistry, physical (42) 42
spectroscopy (31) 31
analysis (28) 28
photodetectors (28) 28
chemistry, multidisciplinary (27) 27
detectors (26) 26
interface (26) 26
photodetector (26) 26
interface barrier (25) 25
electrons (24) 24
index medicus (23) 23
nanoparticles (23) 23
physics (23) 23
materials science, coatings & films (22) 22
devices (20) 20
graphene (19) 19
materials science (19) 19
films (18) 18
heterojunction (18) 18
internal photoemission effect (18) 18
oxidation (18) 18
band offsets (17) 17
heterojunctions (17) 17
photoelectric emission (17) 17
semiconductors (17) 17
gold (16) 16
hot electrons (16) 16
quantum efficiency (16) 16
solar cells (16) 16
surface (16) 16
absorption (15) 15
diodes (15) 15
germanium (15) 15
heterostructures (15) 15
oxides (15) 15
plasmons (15) 15
schottky barrier (15) 15
schottky-kontakt (15) 15
electric properties (14) 14
elektron (14) 14
leitungsband (14) 14
nanostructure (14) 14
oxid (14) 14
plasmonics (14) 14
sperrschichthöhe (14) 14
work function (14) 14
metals (13) 13
photocurrent (13) 13
photostrom (13) 13
photovoltaic cells (13) 13
thin films (13) 13
barriers (12) 12
electrodes (12) 12
emission (12) 12
internal quantum efficiency (12) 12
semiconductor (12) 12
silicium (12) 12
austrittsenergie (11) 11
band offset (11) 11
energy (11) 11
instruments & instrumentation (11) 11
model (11) 11
performance (11) 11
photoleitfähigkeit (11) 11
thin-films (11) 11
al2o3 (10) 10
band (10) 10
band alignment (10) 10
discontinuities (10) 10
dynamics (10) 10
elektrode (10) 10
generation (10) 10
infrared detectors (10) 10
internal energy (10) 10
internal medicine (10) 10
microscopy (10) 10
physics, atomic, molecular & chemical (10) 10
research (10) 10
schottky barriers (10) 10
silicon dioxide (10) 10
solar energy (10) 10
solarzelle (10) 10
spannung (10) 10
spektroskopie (10) 10
usage (10) 10
aluminium (9) 9
breakdown (9) 9
carriers (9) 9
contacts (9) 9
electronic-structure (9) 9
gaas (9) 9
more...
Library Location Library Location
Language Language
Publication Date Publication Date
Click on a bar to filter by decade
Slide to change publication date range


physica status solidi (a), ISSN 1862-6300, 03/2018, Volume 215, Issue 6, pp. 1700865 - n/a
Journal Article
Thin Solid Films, ISSN 0040-6090, 09/2019, Volume 685, pp. 17 - 25
We used herein scanning internal photoemission microscopy (SIPM) that can map electrical characteristics and applied it to characterize the thermal stability... 
Schottky barrier diodes | Scanning internal photoemission microscopy | α–gallium oxide | Interfacial reaction | Two-dimensional characterization | Thermal degradation | PHYSICS, CONDENSED MATTER | PHYSICS, APPLIED | alpha-gallium oxide | MATERIALS SCIENCE, MULTIDISCIPLINARY | MATERIALS SCIENCE, COATINGS & FILMS
Journal Article
The Journal of Physical Chemistry C, ISSN 1932-7447, 06/2018, Volume 122, Issue 22, pp. 11985 - 11992
We elaborate a semi-analytical model for calculation of the bulk internal emission of photoelectrons from metal nanoparticles into a semiconductor matrix. We... 
METAL NANOCRYSTALS | NANOPARTICLES | INTERNAL PHOTOEMISSION | ELECTRONS | MATERIALS SCIENCE, MULTIDISCIPLINARY | SURFACE | CHEMISTRY, PHYSICAL | NANOSCIENCE & NANOTECHNOLOGY
Journal Article
physica status solidi (b), ISSN 0370-1972, 02/2017, Volume 254, Issue 2, pp. np - n/a
We have demonstrated scanning internal photoemission microscopy to characterize the degradation of Au/amorphous In–Ga–Zn–O Schottky contacts. After applying a... 
Schottky contacts | degradation | scanning internal photoemission microscopy | InGaZnO | amorphous materials | PHYSICS, CONDENSED MATTER | SEMICONDUCTOR | Microscope and microscopy | Degradation | Photoelectric effect | Scanning | Microscopy | Semiconductors | Photoemission | Images | Contact
Journal Article
physica status solidi (b), ISSN 0370-1972, 05/2018, Volume 255, Issue 5, pp. 1700480 - n/a
We characterized the effects of surface morphology on the electrical properties of n‐GaN drift‐layers by using scanning internal photoemission microscopy... 
Schottky contacts | surface morphology | n‐type semiconductors | scanning internal photoemission microscopy | GaN | n-type semiconductors | VAPOR-PHASE EPITAXY | PHYSICS, CONDENSED MATTER | HEMT | VOID-ASSISTED SEPARATION | DEVICES | DIODES | Chemical vapor deposition | Microscope and microscopy | Liquors
Journal Article
Thin Solid Films, ISSN 0040-6090, 03/2019, Volume 674, pp. 39 - 43
Internal photoemission of electrons from uncapped monolayer graphene to insulating SiO2 has been observed in samples prepared by water-intercalation based... 
Internal photoemission | Interface barrier | Uncapped graphene | Graphene | Effective work function | PHYSICS, CONDENSED MATTER | CONTACT | ENERGY | PHYSICS, APPLIED | MATERIALS SCIENCE, MULTIDISCIPLINARY | INTERFACE | SCIENCE | MATERIALS SCIENCE, COATINGS & FILMS | WATER | Silicon | Silica | Analysis | Graphite
Journal Article
Materials Science in Semiconductor Processing, ISSN 1369-8001, 11/2017, Volume 70, pp. 86 - 91
Nitrogen-ion-implantation damage on SiC has been clearly imaged using scanning internal photoemission microscopy (SIPM). Ni Schottky contacts were formed on... 
Ion implantation | Scanning internal photoemission microscopy | Schottky contact | SiC | Damage characterization | PHOSPHORUS | PHYSICS, CONDENSED MATTER | PHYSICS, APPLIED | MATERIALS SCIENCE, MULTIDISCIPLINARY | ELECTRICAL-PROPERTIES | ENGINEERING, ELECTRICAL & ELECTRONIC | Microscope and microscopy | Silicon carbide
Journal Article
physica status solidi (a), ISSN 1862-6300, 04/2019, Volume 216, Issue 8, p. n/a
Journal Article
physica status solidi (b), ISSN 0370-1972, 05/2015, Volume 252, Issue 5, pp. 1017 - 1023
We have developed a new mapping technique, termed scanning internal‐photoemission microscopy, to characterize the electrical inhomogeneity of... 
gold | Schottky contacts | nickel | internal photoemission | GaN | Gold | Internal photoemission | Nickel | CONTACTS | PHYSICS, CONDENSED MATTER | VOLTAGE | N-GAN | STABILITY | Microscope and microscopy | Liquors | Annealing | Microscopy | Inhomogeneity | Mapping | Diffusion | Thermal degradation | Contact
Journal Article
Journal of Electronic Materials, ISSN 0361-5235, 10/2019, Volume 48, Issue 10, pp. 6446 - 6450
Journal Article
Current Applied Physics, ISSN 1567-1739, 02/2017, Volume 17, Issue 2, pp. 267 - 271
We report the Schottky barrier height (SBH) at metal–insulator interfaces in Pt/ZrO2–Al2O3–ZrO2(ZAZ)/TiN dynamic random access memory capacitors by analyzing... 
Internal photoemission spectroscopy | MIM capacitor | Schottky barrier height | PHYSICS, APPLIED | OXIDE | MATERIALS SCIENCE, MULTIDISCIPLINARY | AL2O3 | ATOMIC LAYER DEPOSITION | TRIMETHYLALUMINUM | WATER
Journal Article
Optics Communications, ISSN 0030-4018, 08/2017, Volume 397, pp. 10 - 16
This paper presents the design and optimization of a microring resonator enhanced-internal photoemission effect-photodetectors (MRRE-IPE-PDs) suitable for... 
Microring resonator | Nanoscale | Slot | Quantum efficiency | Optics communication | Internal photoemission effect | SCHOTTKY-BARRIER DETECTORS | CONFINING LIGHT | OPTICS | Electrical engineering | Silicides | Analysis | Waveguides
Journal Article
Materials Science in Semiconductor Processing, ISSN 1369-8001, 11/2017, Volume 70, pp. 92 - 98
In this study, we used scanning internal