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Australian Journal of Basic and Applied Sciences, ISSN 1991-8178, 07/2010, Volume 4, Issue 7, pp. 1691 - 1698
Journal Article
Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics), ISSN 0302-9743, 2018, Volume 10992, pp. 129 - 159
Conference Proceeding
Radioengineering, ISSN 1210-2512, 06/2011, Volume 20, Issue 2, pp. 533 - 539
In Very Large Scale Integrated Circuits (VLSI) design, the existing Design-for-Test(DFT) based watermarking techniques usually insert watermark through... 
IP reuse | LFSR | DFT | VLSI | Multiple scan chains | multiple scan chains | ENGINEERING, ELECTRICAL & ELECTRONIC
Journal Article
Finite Fields and Their Applications, ISSN 1071-5797, 2011, Volume 17, Issue 5, pp. 461 - 472
We discuss a conjecture concerning the enumeration of nonsingular matrices over a finite field that are block companion and whose order is the maximum possible... 
Linear feedback shift register (LFSR) | Singer cycle | Block companion matrix | Splitting subspace | Multiple recursive matrix method | Toeplitz matrix | MATHEMATICS | MATHEMATICS, APPLIED | FACTORIZATION | FEEDBACK SHIFT REGISTERS | Singers
Journal Article
IEEE Transactions on Circuits and Systems II: Express Briefs, ISSN 1549-7747, 03/2018, Volume 65, Issue 3, pp. 361 - 365
Journal Article
IEEE Transactions on Circuits and Systems I: Regular Papers, ISSN 1549-8328, 07/2006, Volume 53, Issue 7, pp. 1487 - 1495
Journal Article
2017 IEEE International Conference on Computational Intelligence and Computing Research (ICCIC), 12/2017, pp. 1 - 4
Now a days low power consumption is essential for portable computing devices and mobile operated devices. BIST is a technique to make chip self testable and to... 
MISR (Multiple Input Signature Register) | Computer architecture | Built-in self-test | Benchmark testing | BIST (Built-in-self Test) | TPG(Test Pattern Generator) | Circuit faults | Test pattern generators | LFSR (Linear Feedback Shift Register) | Clocks
Conference Proceeding
Tien Tzu Hsueh Pao/Acta Electronica Sinica, ISSN 0372-2112, 05/2012, Volume 40, Issue 5, pp. 1030 - 1033
Journal Article
Conference Proceeding
International Conference on Information Communication and Embedded Systems (ICICES2014), 02/2014, pp. 1 - 4
MISR architectures are proposed to remove the unknown (X) values in the output sequences. The MISR signature is represented as a system of linear equations in... 
Linear Feedback Shift Register (LFSR) | Output response compaction | Multiple Input Signature Register (MISR) | Gauss-Jordan Elimination | Computer architecture | Built-in self-test | Educational institutions | Registers | Compaction | Mathematical model | Symbolic simulation | Equations
Conference Proceeding
ICIIECS 2015 - 2015 IEEE International Conference on Innovations in Information, Embedded and Communication Systems, 08/2015, pp. 1 - 6
This paper proposes a methodology to generate the multiple test patterns varying in single bit position for built-in-self-test (BIST). The traditional patterns... 
Multiple Single Input Change Vector (MSIC) | Test Pattern Generator (TPG) | Linear feedback shift registers (LFSR) | Built-in-self-test (BIST) | Electric power generation | Correlation | Architecture | Methodology | Mathematical analysis | Vectors (mathematics) | Pattern generation | Decoders
Conference Proceeding
2015 International Conference on Smart Technologies and Management for Computing, Communication, Controls, Energy and Materials (ICSTM), 05/2015, pp. 434 - 438
Conference Proceeding
2015 International Conference on Smart Technologies and Management for Computing, Communication, Controls, Energy and Materials (ICSTM), 05/2015, pp. 428 - 433
Conference Proceeding
International Conference on Circuits, Communication, Control and Computing, 11/2014, pp. 89 - 92
Conference Proceeding
2013 Fourth International Conference on Computing, Communications and Networking Technologies (ICCCNT), 07/2013, pp. 1 - 4
Conference Proceeding
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