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Journal of lightwave technology, ISSN 0733-8724, 03/2006, Volume 24, Issue 3, pp. 1470 - 1477
semiconductor optical amplifier (SOA) | Optoelectronic devices | Photodetectors | Electroabsorption modulator (EAM) | Semiconductor waveguides | Optical waveguides | undercut etching | Semiconductor optical amplifiers | Wet etching | Anisotropic magnetoresistance | photodiode | Indium gallium arsenide | Performance analysis | Quantum well devices | Undercut etching | Photodiode | Semiconductor optical amplifier (SOA) | Engineering | Physical Sciences | Technology | Engineering, Electrical & Electronic | Optics | Telecommunications | Science & Technology | Optical and optoelectronic circuits | Integrated optoelectronics. Optoelectronic circuits | Telecommunications and information theory | Exact sciences and technology | Electronics | Circuit properties | Access methods and protocols, osi model | Electric, optical and optoelectronic circuits | Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices | Teleprocessing networks. Isdn | Integrated optics. Optical fibers and wave guides | Applied sciences | Indium gallium arsenides | Anisotropy | Performance enhancement | Etching | Devices | Undercuts
Journal Article
IEEE photonics technology letters, ISSN 1041-1135, 04/2009, Volume 21, Issue 8, pp. 510 - 512
Plasma applications | Semiconductor films | Epitaxial layers | Light emitting diodes | light-emitting diode (LED) | undercut | Gallium nitride | Substrates | Fabrication | Wet etching | phosphoric acid etching | Silicon carbide | GaN | Liquid crystal displays | Undercut | Light-emitting diode (LED) | Phosphoric acid etching | Engineering | Physical Sciences | Technology | Engineering, Electrical & Electronic | Optics | Physics | Science & Technology | Physics, Applied | Optical fibers | Phosphoric acid | Conferences | Etching | Light-emitting diodes | Undercuts | Fiber optics | Photonics
Journal Article
Optical fiber technology, ISSN 1068-5200, 07/2016, Volume 30, pp. 48 - 64
Data center links | Analytical model | Contact force | Finite element modeling and simulation | Optical multi-fiber connector | Fiber polishing process | MPO/MTP connector | Engineering | Physical Sciences | Technology | Engineering, Electrical & Electronic | Optics | Telecommunications | Science & Technology | Electronic components industry | Finite element method | Models | Analysis | Monte Carlo method
Journal Article
Guangxue Jishu/Optical Technique, ISSN 1002-1582, 01/2005, Volume 31, Issue 1, pp. 38 - 43
Journal Article
Microelectronic engineering, ISSN 0167-9317, 2009, Volume 86, Issue 4, pp. 1081 - 1084
Undercut | Lift-off | Electron beam lithography | Bilayer technique | Meta fish scale | Chiral structure | Magnetic wall | Optical and optoelectronic circuits | Exact sciences and technology | Microelectronic fabrication (materials and surfaces technology) | Electronics | Integrated optics. Optical fibers and wave guides | Applied sciences | Circuit properties | Electric, optical and optoelectronic circuits | Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices | Integrated circuit fabrication | Polymethylmethacrylate | Optical properties | Nanotechnology
Journal Article
02/2013
MICROSTRUCTURAL TECHNOLOGY | CHEMICAL COMPOSITION OF GLASSES, GLAZES, OR VITREOUSENAMELS | CHEMICAL SURFACE TREATMENT | OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS | TECHNICAL SUBJECTS COVERED BY FORMER USPC | SURFACE TREATMENT OF GLASS | GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC | GLASS | PROCESSES OR APPARATUS SPECIALLY ADAPTED FOR THE MANUFACTUREOR TREATMENT OF MICROSTRUCTURAL DEVICES OR SYSTEMS | BASIC ELECTRIC ELEMENTS | CHEMISTRY | ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR | INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION INGENERAL | OPTICS | SURFACE TREATMENT OF FIBRES OR FILAMENTS MADE FROM GLASS,MINERALS OR SLAGS | NON-MECHANICAL REMOVAL OF METALLIC MATERIAL FROM SURFACE | TRANSPORTING | COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATIONOR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL | SEMICONDUCTOR DEVICES | DIFFUSION TREATMENT OF METALLIC MATERIAL | MICROSTRUCTURAL DEVICES OR SYSTEMS, e.g. MICROMECHANICALDEVICES | GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS | TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS | METALLURGY | COATING MATERIAL WITH METALLIC MATERIAL | MINERAL OR SLAG WOOL | MULTI-STEP PROCESSES FOR SURFACE TREATMENT OF METALLICMATERIAL INVOLVING AT LEAST ONE PROCESS PROVIDED FOR IN CLASSC23 AND AT LEAST ONEPROCESS COVERED BY SUBCLASS C21D OR C22F OR CLASS C25 | JOINING GLASS TO GLASS OR OTHER MATERIALS | PHYSICS | TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION | PERFORMING OPERATIONS | ELECTRICITY | COATING METALLIC MATERIAL
Patent
IEEE photonics technology letters, ISSN 1041-1135, 02/2001, Volume 13, Issue 2, pp. 97 - 99
Semiconductor lasers | Surface emitting lasers | Apertures | Threshold current | Etching | Mirrors | Vertical cavity surface emitting lasers | Indium phosphide | Fiber lasers | Optical surface waves | Engineering | Physical Sciences | Technology | Engineering, Electrical & Electronic | Optics | Physics | Science & Technology | Physics, Applied | Threshold currents | Vertical cavity surface emission lasers | Lasers | Materials selection | Undercuts | Photonics
Journal Article
LEOS 2006 - 19th Annual Meeting of the IEEE Lasers and Electro-Optics Society, ISSN 1092-8081, 10/2006, pp. 404 - 405
Conference Proceeding
IEEE photonics technology letters, ISSN 1041-1135, 11/2010, Volume 22, Issue 22, pp. 1653 - 1655
gallium nitride (GaN) | Lighting | Surface morphology | Light emitting diodes | Surface roughness | light-emitting diode (LED) | photoenhanced electrochemical (PEC) | Gallium nitride | Finite-difference time-domain (FDTD) | Surface treatment | Finite difference methods | Engineering | Physical Sciences | Technology | Engineering, Electrical & Electronic | Optics | Physics | Science & Technology | Physics, Applied | Optical fibers | Conferences | Simulation | Gallium nitrides | Illumination | Extraction | Light-emitting diodes | Undercuts | Fiber optics
Journal Article
LEOS 2007 - IEEE Lasers and Electro-Optics Society Annual Meeting Conference Proceedings, ISSN 1092-8081, 10/2007, pp. 268 - 269
Conference Proceeding
2006 Conference on Optoelectronic and Microelectronic Materials and Devices, ISSN 1097-2137, 12/2006, pp. 236 - 238
Conference Proceeding
Applied surface science, ISSN 0169-4332, 02/2011, Volume 257, Issue 9, pp. 4113 - 4122
Geometry | Defect | Load | Parameters | Shape | Laser welding | Physical Sciences | Chemistry | Materials Science | Technology | Materials Science, Coatings & Films | Physics, Condensed Matter | Chemistry, Physical | Physics | Science & Technology | Physics, Applied | Condensed matter: electronic structure, electrical, magnetic, and optical properties | Cross-disciplinary physics: materials science; rheology | Exact sciences and technology | Condensed matter: structure, mechanical and thermal properties | Case studies | Lasers | Mechanical engineering | Analysis | Welded joints | Welding | Roots | Documentation | Trends | Flow charts | Cross sections | Weld metal pool
Journal Article
13.
Full Text
High-speed undercut-wet-etching-active-region traveling-wave electroabsorption modulator
2005 IEEE LEOS Annual Meeting Conference Proceedings, ISSN 1092-8081, 2005, Volume 2005, pp. 426 - 427
Conference Proceeding
The 16th Annual Meeting of the IEEE Lasers and Electro-Optics Society, 2003. LEOS 2003, ISSN 1092-8081, 2003, Volume 2, pp. 1032 - 1033 vol.2
Conference Proceeding
Journal of Central South University of Technology. Science & technology of mining and metallurgy, ISSN 1005-9784, 6/2005, Volume 12, Issue 3, pp. 320 - 323
Engineering | optical fiber undercut | optical fiber connector | TN253 | polishing | Engineering, general | Metallic Materials | return loss | TN205 | Optical fiber undercut | Polishing | Optical fiber connector | Return loss | Technology | Metallurgy & Metallurgical Engineering | Science & Technology
Journal Article
Journal of lightwave technology, ISSN 0733-8724, 08/2007, Volume 25, Issue 8, pp. 2159 - 2167
Blades | Micro-Opto-Electromechanical Systems (MOEMS) | Electrothermal effects | Etching | Micromechanical devices | Silicon on insulator technology | Iris | Optical attenuators | Optical materials | Microelectromechanical systems (MEMS) | Optical fiber devices | variable optical attenuator (VOA) | Bonding | Variable optical attenuator (VOA) | Engineering | Physical Sciences | Technology | Engineering, Electrical & Electronic | Optics | Telecommunications | Science & Technology | Electronics | Applied sciences | Micro- and nanoelectromechanical devices (mems/nems) | Exact sciences and technology | Microelectronic fabrication (materials and surfaces technology) | Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices | Finite element analysis | Optical fibers | Diffraction theory | Noise levels | Wavelengths | Resonant frequencies | Mathematical models | Devices
Journal Article
17.
Full Text
Comparison of methods for data analysis in the remote monitoring of remote laser welding
Optics and lasers in engineering, ISSN 0143-8166, 01/2013, Volume 51, Issue 1, pp. 34 - 46
Through Optical Combiner Monitoring | Spectroscopy | Remote laser welding | Zinc-coated steel | Principal component analysis | Optics | Physical Sciences | Science & Technology | Comparative analysis | Lasers | Mechanical engineering | Methods | Laser beam welding | Emission spectroscopy | Wavelengths | Welding | Emission analysis | Position (location) | Indicators | Monitoring
Journal Article
Measurement science & technology, ISSN 0957-0233, 10/2007, Volume 18, Issue 10, pp. 3202 - 3210
Journal Article
19.
Feasibility study of manufacturing process and quality control for the new alternating PSM structure
Proceedings of SPIE - The International Society for Optical Engineering, ISSN 0277-786X, 2002, Volume 4764, pp. 224 - 234
Conference Proceeding
Journal of lightwave technology, ISSN 0733-8724, 05/2002, Volume 20, Issue 5, pp. 879 - 885
Connectors | Laser theory | Stimulated emission | Contacts | Impurities | Dielectric materials | Power lasers | Optical materials | Dielectric breakdown | Fiber lasers | Laser damage | Optical connectors | High power | Reliability | Near infrared | Fiber optics | Optical fibers | Thresholds | Contact angle | Contamination | Failure | Contact
Journal Article
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