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Applied Optics, ISSN 1559-128X, 10/2012, Volume 51, Issue 28, pp. 6789 - 6798
The complex refractive index components, n and k, have been studied for thin films of several common dielectric materials with a low to medium refractive index... 
REFRACTIVE-INDEX | OPTICS | ELLIPSOMETRY | DEPOSITION | Measurement | Silicon compounds | Thermal properties | Usage | Refractive index | Optical properties | Sputtering (Physics) | Mass spectrometry | Methods
Journal Article
Small, ISSN 1613-6810, 08/2017, Volume 13, Issue 30, p. n/a
In article number 1701154, Jiandi Wan and co‐workers, show that flow in microfluidics significantly enhances the anodic growth of TiO2 nanotubes and controls... 
crystal orientation | silicon substrates | titanium dioxide nanotubes | horizontally aligned | microfluidics | Titanium dioxide | Microfluidics | Nanotubes | Titanium oxides | Spatial distribution | Silicon substrates | Crystal structure
Journal Article
Journal of the American Chemical Society, ISSN 0002-7863, 11/2011, Volume 133, Issue 44, pp. 17548 - 17551
Journal Article
Surface & Coatings Technology, ISSN 0257-8972, 02/2019, Volume 359, pp. 247 - 251
High density of the inductively coupled plasma chemical vapor deposition (ICPCVD) enables growth of films on soft substrate such as polyethylene terephthalate... 
Silicon oxide | Polyethylene terephthalate | Inductively coupled plasma | Optical emission spectroscopy | Tetramethylsilane | Hydrochloric acid | Plasma | Organic chemistry | Silicon oxides | Chemical vapor deposition | Substrates | Silicon dioxide
Journal Article
Journal of Membrane Science, ISSN 0376-7388, 03/2015, Volume 477, pp. 161 - 171
Journal Article