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temperature measurement (17) 17
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reliability (4) 4
temperature (4) 4
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2017 33rd Thermal Measurement, Modeling & Management Symposium (SEMI-THERM), ISSN 1065-2221, 2017, pp. 208 - 212
The variations of the electrical parameters of semiconductor devices with changes in temperature are important for industrial and other applications of these... 
Temperature measurement | Temperature distribution | Semiconductor device measurement | Ovens | thermo-sensitive electrical parameter | semiconductor devices | Temperature control | TSEP | power electronics | Testing | Thermo-sensitive electrical parameter | Power electronics | Semiconductor devices
Conference Proceeding
2016 IEEE Energy Conversion Congress and Exposition (ECCE), 09/2016, pp. 1 - 6
Junction temperature of insulated gate bipolar transistors (IGBTs) plays an important role in power semiconductor devices reliability. However, it is difficult... 
Temperature measurement | Integrated circuits | Insulated gate bipolar transistors | Temperature sensors | IGBT | turn-off transient | Market research | junction temperature | Delays | thermo-sensitive electrical parameter (TSEP) | Junctions
Conference Proceeding
2017 4th International Conference on Electric Power Equipment - Switching Technology (ICEPE-ST), 10/2017, Volume 2017-, pp. 384 - 388
This paper aims at reliability assessment of power semiconductor in hybrid DC switch. Design considerations of reliability issues are explained. Specific focus... 
Temperature measurement | Semiconductor device measurement | Power semiconductor | Thermo-sensitive electrical parameter (TSEP) | Switches | Temperature-based condition monitoring | Calibration | Reliability | Junctions | Hybrid switching technique | Junction temperature | Switching circuits
Conference Proceeding
2016 IEEE 8th International Power Electronics and Motion Control Conference (IPEMC-ECCE Asia), 05/2016, pp. 3262 - 3267
The reliability of power electronic converters is a major concern in industrial applications because of the use of high-power semiconductor devices, which have... 
Insulated gate bipolar transistors | Temperature measurement | IGBT | Wires | three-level inverters | reliability | Inverters | Circuit faults | thermo-sensitive electrical parameter (TSEP) | Junctions | Testing | Electric power generation | Fault tolerance | Precursors | Modules | Converters | Electronics | Electric wire
Conference Proceeding
EPE Journal, ISSN 0939-8368, 07/2017, Volume 27, Issue 3, pp. 106 - 117
Semiconductor devices incorporated into power electronics systems are proven to be highly sensitive to their thermal environment. Thus, temperature measurement... 
Temperature measurement | thermo-sensitive electrical parameters | infrared thermography | RTD sensor | instrumented chip | thermal impedance | THERMOSENSITIVE ELECTRICAL PARAMETERS | VOLTAGE | MODULES | RELIABILITY | TEMPERATURE-MEASUREMENTS | ENGINEERING, ELECTRICAL & ELECTRONIC
Journal Article
IEEE Transactions on Device and Materials Reliability, ISSN 1530-4388, 06/2019, Volume 19, Issue 2, pp. 333 - 340
Journal Article
2017 IEEE Transportation Electrification Conference and Expo, Asia-Pacific (ITEC Asia-Pacific), 08/2017, pp. 1 - 5
Conference Proceeding
Conference Proceedings - IEEE Applied Power Electronics Conference and Exposition - APEC, 05/2016, Volume 2016-, pp. 499 - 504
Junction temperature monitoring of IGBT modules is crucial for power devices in high power applications. In this paper, a thermo-sensitive electrical parameter... 
trench/field-stop IGBTs | junction temperature extraction | Thermo-sensitive electrical parameter | maximum collector current declining rate | Electric power generation | Collectors | Trenches | Accumulators | Modules | Falling | Extraction | Electrical junctions
Conference Proceeding
2016 IEEE 8th International Power Electronics and Motion Control Conference (IPEMC-ECCE Asia), 05/2016, pp. 3125 - 3130
Junction temperature is an important condition variable for IGBT and can be indirectly measured by the Thermo-Sensitive Electrical Parameter (TSEP). However,... 
Temperature measurement | Insulated gate bipolar transistors | Temperature distribution | power converter | Current measurement | IGBT junction temperature | self-calibration | thermo-sensitive electrical parameter | Logic gates | Junctions | Power converters | Test rigs | Electronics | Inverters | Hardware | Calibration | Devices | Electrical junctions
Conference Proceeding
2016 IEEE Energy Conversion Congress and Exposition (ECCE), 09/2016, pp. 1 - 8
Temperature measurement of semiconductor components is essential, in particular to evaluate performances and to propose health monitoring of power modules.... 
Temperature measurement | Temperature sensors | Semiconductor device measurement | Temperature Sensor | Instruments | Current measurement | Thermo Sensitive Electrical Parameters | Calibration | monitoring | power electronic converters | instrumented chip
Conference Proceeding
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