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Microscopy and Microanalysis, ISSN 1431-9276, 12/2013, Volume 19, Issue 6, pp. 1688 - 1697
Journal Article
Journal Article
03/2015, Volume 23, Issue 2
* katherine.rice@ametek.com Introduction Transmission electron backscatter diffraction (t-EBSD) [1] also known as transmission electron forward scatter... 
Nanoparticles | Diffraction patterns | Thickness | Transmission electron microscopy | Energy | Electron back scatter | Cameras | Sensors | Spatial resolution | Ion beams
Magazine Article
07/2013, Volume 21, Issue 4
The field of electron microscopy, by its diverse nature, abounds with acronyms: AEM, EF-TEM, ESEM, FE-SEM, HREM, HRTEM, HVEM, SEM, STEM, TEM, and VP-SEM, to... 
Names | Scanning electron microscopy | Accuracy | Transmission electron microscopy | Abbreviations | Eels
Magazine Article
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