IEEE Journal of Solid-State Circuits, ISSN 0018-9200, 05/2017, Volume 52, Issue 5, pp. 1210 - 1220
A fractional-N digital phase-locked loop (PLL) architecture with low fractional spur is presented in this paper. A 2-D Vernier time-to-digital convertor (TDC)...
2-D Vernier | Frequency conversion | N">fractional-N | Calibration | Frequency measurement | DPLL | Phase locked loops | Linearity | multimodulus divider (MMD) | least-mean-square (LMS) filter | time-to-digital convertor (TDC) | digital calibration | Delays | Clocks | fractional-N | POWER | TIME | OSCILLATOR | CMOS TECHNOLOGY | ENGINEERING, ELECTRICAL & ELECTRONIC | FREQUENCY-SYNTHESIZER | CONVERTER
2-D Vernier | Frequency conversion | N">fractional-
Journal Article
The Journal of Engineering, ISSN 2051-3305, 4/2014, Volume 2014, Issue 4, pp. 140 - 154
This study provides an in-depth review of the principles, architectures and design techniques of CMOS time-to-digital converters (TDCs). The classification of...
oscillators | relaxation oscillator TDC | vernier TDC | MASH TDC | flash TDC | tapped delay line TDC | ΔΣ TDC | successive approximation TDC | delay lines | CMOS time-to-digital converters | sampling TDC | time-digital conversion | direct-counter TDCs | pulse-shrinking delay line TDC | noise-shaping TDC | sigma-delta modulation | switched ring oscillator TDC | CMOS integrated circuits | cyclic pulse-shrinking TDCs | pipelined TDC | mixed-mode signal processing
oscillators | relaxation oscillator TDC | vernier TDC | MASH TDC | flash TDC | tapped delay line TDC | ΔΣ TDC | successive approximation TDC | delay lines | CMOS time-to-digital converters | sampling TDC | time-digital conversion | direct-counter TDCs | pulse-shrinking delay line TDC | noise-shaping TDC | sigma-delta modulation | switched ring oscillator TDC | CMOS integrated circuits | cyclic pulse-shrinking TDCs | pipelined TDC | mixed-mode signal processing
Journal Article
IEEE Transactions on Very Large Scale Integration (VLSI) Systems, ISSN 1063-8210, 09/2018, Volume 26, Issue 9, pp. 1777 - 1787
In this paper, we propose a time-based analog-to-digital converter (ADC) architecture combining a flash ADC and vernier time-to-digital converter (TDC) to...
pipeline | Capacitors | Logic gates | Signal processing | subranging | CMOS technology | Calibration | Power dissipation | Time-domain analysis | time-based ADC (TB ADC) | Flash analog-to-digital converter (ADC) | vernier time-to-digital converter (TDC) | COMPUTER SCIENCE, HARDWARE & ARCHITECTURE | ENGINEERING, ELECTRICAL & ELECTRONIC | CMOS | Power consumption | Steering | Amplifiers | Analog to digital conversion | Figure of merit | Analog to digital converters
pipeline | Capacitors | Logic gates | Signal processing | subranging | CMOS technology | Calibration | Power dissipation | Time-domain analysis | time-based ADC (TB ADC) | Flash analog-to-digital converter (ADC) | vernier time-to-digital converter (TDC) | COMPUTER SCIENCE, HARDWARE & ARCHITECTURE | ENGINEERING, ELECTRICAL & ELECTRONIC | CMOS | Power consumption | Steering | Amplifiers | Analog to digital conversion | Figure of merit | Analog to digital converters
Journal Article
IEEE Transactions on Circuits and Systems I: Regular Papers, ISSN 1549-8328, 10/2019, pp. 1 - 14
A 77-GHz frequency-modulated continuous-wave (FMCW) generator is presented for millimeter-wave (mm-wave) radar applications. The FMCW chirp is provided by a...
Chirp | Image edge detection | Millimeter-wave (mm-wave) radar | Frequency conversion | frequency- modulated continuous-wave (FMCW) | segmented digital-to-analog converter (DAC) | Generators | Phase locked loops | phase-locked loop (PLL) | divider-less | glitch | Detectors | Delays | Vernier time-to-digital converter (TDC)
Chirp | Image edge detection | Millimeter-wave (mm-wave) radar | Frequency conversion | frequency- modulated continuous-wave (FMCW) | segmented digital-to-analog converter (DAC) | Generators | Phase locked loops | phase-locked loop (PLL) | divider-less | glitch | Detectors | Delays | Vernier time-to-digital converter (TDC)
Journal Article
Sensors (Basel, Switzerland), ISSN 1424-8220, 11/2018, Volume 18, Issue 11, p. 3948
Herein, we present a low-power cyclic Vernier two-step time-to-digital converter (TDC) that achieves a wide input range with good linearity. Since traditional...
Vernier | time-to-digital converter | startup time | digitally controlled oscillator | time-of-flight | cyclic | input range | ELECTROCHEMISTRY | CHEMISTRY, ANALYTICAL | INSTRUMENTS & INSTRUMENTATION | TO-DIGITAL CONVERTER | ARRAYS
Vernier | time-to-digital converter | startup time | digitally controlled oscillator | time-of-flight | cyclic | input range | ELECTROCHEMISTRY | CHEMISTRY, ANALYTICAL | INSTRUMENTS & INSTRUMENTATION | TO-DIGITAL CONVERTER | ARRAYS
Journal Article
IEEE Transactions on Circuits and Systems I: Regular Papers, ISSN 1549-8328, 07/2011, Volume 58, Issue 7, pp. 1511 - 1517
This paper presents a cyclic Vernier time-to-digital converter (TDC) with digitally controlled oscillators (DCOs), targeted for a synthesizable all-digital...
synthesis | Vernier | All-digital PLL (ADPLL) | time-to-digital converter (TDC) | Image edge detection | Microprocessors | Layout | Computer architecture | standard cell library | Time measurement | Libraries | Calibration | CMOS | TO-DIGITAL CONVERTER | OSCILLATOR | ENGINEERING, ELECTRICAL & ELECTRONIC | Measurement | Technology application | Phase-locked loops | Oscillators (Electronics) | Circuit design | Analysis | Voltage | Design and construction | Methods | Complementary metal oxide semiconductors | Design engineering | Circuits | Digital | Phase locked loops | Oscillators | Standards
synthesis | Vernier | All-digital PLL (ADPLL) | time-to-digital converter (TDC) | Image edge detection | Microprocessors | Layout | Computer architecture | standard cell library | Time measurement | Libraries | Calibration | CMOS | TO-DIGITAL CONVERTER | OSCILLATOR | ENGINEERING, ELECTRICAL & ELECTRONIC | Measurement | Technology application | Phase-locked loops | Oscillators (Electronics) | Circuit design | Analysis | Voltage | Design and construction | Methods | Complementary metal oxide semiconductors | Design engineering | Circuits | Digital | Phase locked loops | Oscillators | Standards
Journal Article
Measurement, ISSN 0263-2241, 10/2017, Volume 108, pp. 48 - 54
A novel implementation technique for Vernier-based time-to-digital converters is reported. It is based on fractional- phase-locked loops which allows the...
Vernier | FPGA | Fractional-N PLL | Phase-locked loop | Time-to-digital converter | TO-DIGITAL CONVERTER | RING OSCILLATOR TDC | TIME | METASTABILITY | CMOS | INSTRUMENTS & INSTRUMENTATION | ENGINEERING, MULTIDISCIPLINARY | FLIP-FLOPS | Digital integrated circuits | Time-to-digital converter; Phase-locked loop; Vernier; FPGA; Fractional-N PLL | Other Electrical Engineering, Electronic Engineering, Information Engineering | Acceleratorfysik och instrumentering | Inbäddad systemteknik | Accelerator Physics and Instrumentation | Signalbehandling | Embedded Systems | Signal Processing | Annan elektroteknik och elektronik
Vernier | FPGA | Fractional-N PLL | Phase-locked loop | Time-to-digital converter | TO-DIGITAL CONVERTER | RING OSCILLATOR TDC | TIME | METASTABILITY | CMOS | INSTRUMENTS & INSTRUMENTATION | ENGINEERING, MULTIDISCIPLINARY | FLIP-FLOPS | Digital integrated circuits | Time-to-digital converter; Phase-locked loop; Vernier; FPGA; Fractional-N PLL | Other Electrical Engineering, Electronic Engineering, Information Engineering | Acceleratorfysik och instrumentering | Inbäddad systemteknik | Accelerator Physics and Instrumentation | Signalbehandling | Embedded Systems | Signal Processing | Annan elektroteknik och elektronik
Journal Article
Informacije MIDEM, ISSN 0352-9045, 12/2017, Volume 47, Issue 4, pp. 223 - 231
Time to digital converter (TDC) is a device, which measures time interval between two edges of signals and converts it to digital code. Lately it is used as...
Vernier | CMOS | Time to digital converter | Gated ring oscillator | Integrated circuit | time to digital converter | MATERIALS SCIENCE, MULTIDISCIPLINARY | RESOLUTION | TO-DIGITAL CONVERTER | gated ring oscillator | integrated circuit | PHASE-LOCKED LOOP | ENGINEERING, ELECTRICAL & ELECTRONIC
Vernier | CMOS | Time to digital converter | Gated ring oscillator | Integrated circuit | time to digital converter | MATERIALS SCIENCE, MULTIDISCIPLINARY | RESOLUTION | TO-DIGITAL CONVERTER | gated ring oscillator | integrated circuit | PHASE-LOCKED LOOP | ENGINEERING, ELECTRICAL & ELECTRONIC
Journal Article
IET CIRCUITS DEVICES & SYSTEMS, ISSN 1751-858X, 11/2017, Volume 11, Issue 6, pp. 676 - 681
Single-event transients (SETs) due to heavy-ion (HI) strikes adversely affect the electronic circuits in sub-100nm regime in radiation environment....
staircase transfer characteristics | SET | TO-DIGITAL CONVERTER | space applications | priority encoder | time-digital conversion | electronic component | time-to-digital converter | time interval | size 45 nm | D-flip-flop | VCDL | single-event transients | radiation environment | guard gate technique | vernier-type TDC | START-STOP pulse transition | radiation hardening (electronics) | SIMULATION | cadence spectre circuit simulator | ENGINEERING, ELECTRICAL & ELECTRONIC | delay lines | HIS | HIGH-RESOLUTION | heavy-ion strikes | PROPAGATION | top-bottom voltage-controlled delay line | regular staircase pattern
staircase transfer characteristics | SET | TO-DIGITAL CONVERTER | space applications | priority encoder | time-digital conversion | electronic component | time-to-digital converter | time interval | size 45 nm | D-flip-flop | VCDL | single-event transients | radiation environment | guard gate technique | vernier-type TDC | START-STOP pulse transition | radiation hardening (electronics) | SIMULATION | cadence spectre circuit simulator | ENGINEERING, ELECTRICAL & ELECTRONIC | delay lines | HIS | HIGH-RESOLUTION | heavy-ion strikes | PROPAGATION | top-bottom voltage-controlled delay line | regular staircase pattern
Journal Article
IEEE Transactions on Instrumentation and Measurement, ISSN 0018-9456, 08/2014, Volume 63, Issue 8, pp. 2064 - 2071
A time-to-digital converter (TDC) plays an important role in time interval measurement. Among various TDC structures, the Vernier-based TDC (VTDC) is promising...
Differential nonlinearity (DNL) | time-to-digital converter (TDC) | Radiation detectors | Image edge detection | Vernier-based TDC (VTDC) | Resonant frequency | soft-injection-locked ring (SILR) oscillators | Tin | integral nonlinearity (INL) | Oscillators | Clocks | INSTRUMENTS & INSTRUMENTATION | TO-DIGITAL CONVERTER | ENGINEERING, ELECTRICAL & ELECTRONIC | Digital control systems | Usage | Time measurement | Oscillators (Electronics) | Timekeeping | Analysis | CMOS | Electric potential | Voltage | Instrumentation | Nonlinearity | Calibration | Deviation
Differential nonlinearity (DNL) | time-to-digital converter (TDC) | Radiation detectors | Image edge detection | Vernier-based TDC (VTDC) | Resonant frequency | soft-injection-locked ring (SILR) oscillators | Tin | integral nonlinearity (INL) | Oscillators | Clocks | INSTRUMENTS & INSTRUMENTATION | TO-DIGITAL CONVERTER | ENGINEERING, ELECTRICAL & ELECTRONIC | Digital control systems | Usage | Time measurement | Oscillators (Electronics) | Timekeeping | Analysis | CMOS | Electric potential | Voltage | Instrumentation | Nonlinearity | Calibration | Deviation
Journal Article
IEEE Journal of Solid-State Circuits, ISSN 0018-9200, 09/2019, Volume 54, Issue 9, pp. 2513 - 2522
A phenomenon called parallel-output misalignment (POM), which intrinsically occurs in ring-type time-to-digital converters (TDCs) like gated-ring oscillator...
Phase noise | parallel-output misalignment (POM) | Quantization (signal) | time-to-digital converter (TDC) | digital phase-locked loop (DPLL) | Logic gates | Delays | Error correction | Conjoined-ring Vernier (CRV) | PLL | RESOLUTION | phase noise | ENGINEERING, ELECTRICAL & ELECTRONIC
Phase noise | parallel-output misalignment (POM) | Quantization (signal) | time-to-digital converter (TDC) | digital phase-locked loop (DPLL) | Logic gates | Delays | Error correction | Conjoined-ring Vernier (CRV) | PLL | RESOLUTION | phase noise | ENGINEERING, ELECTRICAL & ELECTRONIC
Journal Article
IEEE Journal of Solid-State Circuits, ISSN 0018-9200, 03/2018, Volume 53, Issue 3, pp. 738 - 749
This paper presents an 8-bit 1.25-ps resolution reconfigurable Vernier time-to-digital converter (TDC) with a 2-D spiral comparator array and ΔΣ modulators for...
Phase noise | Spirals | Phase modulation | ΔΣ modulation | autocalibration | integral nonlinearity (INL) | Topology | differential nonlinearity (DNL) | time-to-digital converter (TDC) | Measurement uncertainty | digital phase-locked loop (DPLL) | Linearity | Vernier TDC | Delays | linearization | ENGINEERING, ELECTRICAL & ELECTRONIC | N FREQUENCY-SYNTHESIZER | CMOS | PLL | TRANSMITTER | TDC | Delta Sigma modulation | Converters | Nonlinearity | Power consumption | Modulators | Linearization
Phase noise | Spirals | Phase modulation | ΔΣ modulation | autocalibration | integral nonlinearity (INL) | Topology | differential nonlinearity (DNL) | time-to-digital converter (TDC) | Measurement uncertainty | digital phase-locked loop (DPLL) | Linearity | Vernier TDC | Delays | linearization | ENGINEERING, ELECTRICAL & ELECTRONIC | N FREQUENCY-SYNTHESIZER | CMOS | PLL | TRANSMITTER | TDC | Delta Sigma modulation | Converters | Nonlinearity | Power consumption | Modulators | Linearization
Journal Article
2014 IEEE 57th International Midwest Symposium on Circuits and Systems (MWSCAS), ISSN 1548-3746, 08/2014, pp. 13 - 16
Advancements in imaging and ranging system performance creates the need for increased resolution, range, and speed of time-to-digital converters, a core part...
Image resolution | Radiation detectors | Dynamic range | Signal resolution | Vernier delay loop | positron-emission tomography (PET) | Quantization (signal) | TDC | coarse-fine architecture | Delay lines | time-of-flight (ToF) | laser/light detection and ranging (LIDAR) | Delays | CMOS | Circuits | Imaging | Converters | Sampling | Conversion | Delay | Coarsening | Clocks
Image resolution | Radiation detectors | Dynamic range | Signal resolution | Vernier delay loop | positron-emission tomography (PET) | Quantization (signal) | TDC | coarse-fine architecture | Delay lines | time-of-flight (ToF) | laser/light detection and ranging (LIDAR) | Delays | CMOS | Circuits | Imaging | Converters | Sampling | Conversion | Delay | Coarsening | Clocks
Conference Proceeding
Nuclear Science and Techniques, ISSN 1001-8042, 08/2013, Volume 24, Issue 4
In this paper, a high precision vernier delay line (VDL) TDC (Time-to-Digital Convertor) in an actel flash-based Field-Programmable-Gate-Arrays A3PE1500 is...
Vernier | Time measurement | Double delay lines | Time-to-digital convertor | Compensation | SYSTEM | PROGRAMMABLE-GATE-ARRAYS | NUCLEAR SCIENCE & TECHNOLOGY | RESOLUTION | TO-DIGITAL CONVERTER | PHYSICS, NUCLEAR
Vernier | Time measurement | Double delay lines | Time-to-digital convertor | Compensation | SYSTEM | PROGRAMMABLE-GATE-ARRAYS | NUCLEAR SCIENCE & TECHNOLOGY | RESOLUTION | TO-DIGITAL CONVERTER | PHYSICS, NUCLEAR
Journal Article
IEEE Transactions on Circuits and Systems II: Express Briefs, ISSN 1549-7747, 10/2014, Volume 61, Issue 10, pp. 773 - 777
A new Vernier time-to-digital converter (TDC) architecture using a delay line and a chain of delay latches is proposed. The delay latches replace the...
Latches | Power demand | Delay lines | Delays | CMOS integrated circuits | Transistors | Standards | Vernier | CMOS | Delay latch | Time-to-digital converter (TDC) | TDC | time-to-digital converter (TDC) | 90 NM CMOS | RESOLUTION | delay latch | ENGINEERING, ELECTRICAL & ELECTRONIC | Measurement | Usage | Digital integrated circuits | Voltage | Design and construction | Complementary metal oxide semiconductors | Analog to digital converters | Architecture | Converters | Chains | Digital | Registers | Delay | Teknik och teknologier | Engineering and Technology | Elektroteknik och elektronik | Electrical Engineering, Electronic Engineering, Information Engineering | CMOS; delay latch; time-to-digital converter (TDC); Vernier
Latches | Power demand | Delay lines | Delays | CMOS integrated circuits | Transistors | Standards | Vernier | CMOS | Delay latch | Time-to-digital converter (TDC) | TDC | time-to-digital converter (TDC) | 90 NM CMOS | RESOLUTION | delay latch | ENGINEERING, ELECTRICAL & ELECTRONIC | Measurement | Usage | Digital integrated circuits | Voltage | Design and construction | Complementary metal oxide semiconductors | Analog to digital converters | Architecture | Converters | Chains | Digital | Registers | Delay | Teknik och teknologier | Engineering and Technology | Elektroteknik och elektronik | Electrical Engineering, Electronic Engineering, Information Engineering | CMOS; delay latch; time-to-digital converter (TDC); Vernier
Journal Article
IEEE Transactions on Circuits and Systems I: Regular Papers, ISSN 1549-8328, 03/2013, Volume 60, Issue 3, pp. 557 - 569
This paper presents a time-to-digital converter (TDC) architecture capable of reaching high-precision and high-linearity with moderate area occupation per...
Coarse-fine architecture | delay-locked loop (DLL) | Radiation detectors | TCSPC | single photon avalanche diode (SPAD) | Synchronization | Delay | Interpolation | time-to-digital converter (TDC) | Linearity | time-of-flight | Clocks | time interval measurement | Vernier delay line | CMOS TIME | ANALOG | FREQUENCY-SYNTHESIS | ENGINEERING, ELECTRICAL & ELECTRONIC | CIRCUITS | TDC | HIGH-RESOLUTION | Technology application | Usage | Signal processing | Photodetectors | Equipment and supplies | Design and construction | Complementary metal oxide semiconductors | Electronic circuits | Studies | Sensors | Architecture | Circuits | Converters | Channels | Three dimensional
Coarse-fine architecture | delay-locked loop (DLL) | Radiation detectors | TCSPC | single photon avalanche diode (SPAD) | Synchronization | Delay | Interpolation | time-to-digital converter (TDC) | Linearity | time-of-flight | Clocks | time interval measurement | Vernier delay line | CMOS TIME | ANALOG | FREQUENCY-SYNTHESIS | ENGINEERING, ELECTRICAL & ELECTRONIC | CIRCUITS | TDC | HIGH-RESOLUTION | Technology application | Usage | Signal processing | Photodetectors | Equipment and supplies | Design and construction | Complementary metal oxide semiconductors | Electronic circuits | Studies | Sensors | Architecture | Circuits | Converters | Channels | Three dimensional
Journal Article
IEEE Journal of Solid-State Circuits, ISSN 0018-9200, 08/2010, Volume 45, Issue 8, pp. 1504 - 1512
A two-dimensions Vernier algorithm applied to a time to digital converter (TDC) is presented. The solution proposed minimizes the length of the delay lines...
Phase noise | Vernier | Energy consumption | TDC calibration | time to digital converter | Delay effects | Quantization | Jitter | Phase locked loops | Interpolation | Prototypes | Delay lines | CMOS technology | All digital PLL | CMOS | PLL | TDC | ENGINEERING, ELECTRICAL & ELECTRONIC | Power consumption | Converters | Digital | Two dimensional | Conversion
Phase noise | Vernier | Energy consumption | TDC calibration | time to digital converter | Delay effects | Quantization | Jitter | Phase locked loops | Interpolation | Prototypes | Delay lines | CMOS technology | All digital PLL | CMOS | PLL | TDC | ENGINEERING, ELECTRICAL & ELECTRONIC | Power consumption | Converters | Digital | Two dimensional | Conversion
Journal Article
IEEE Journal of Solid-State Circuits, ISSN 0018-9200, 04/2010, Volume 45, Issue 4, pp. 830 - 842
Journal Article
IEEE Journal of Solid-State Circuits, ISSN 0018-9200, 03/2009, Volume 44, Issue 3, pp. 824 - 834
Digital implementation of analog functions is becoming attractive in CMOS ICs, given the low supply voltage of ultra-scaled processes. Particularly,...
Frequency synthesizers | all-digital phase locked loop | Quantization | CMOS process | Phase locked loops | mismatch correction | Radio frequency | Low voltage | time-to-digital converter (TDC) | Linearity | Bandwidth | spur reduction | Vernier TDC | CMOS technology | ADPLL | digital calibration | fractional frequency synthesizer | Wideband | Mismatch correction | All-digital phase locked loop | Fractional frequency synthesizer | Time-to-digital converter (TDC) | Spur reduction | Digital calibration | PHASE-LOCKED LOOPS | CONVERTER | ENGINEERING, ELECTRICAL & ELECTRONIC | Semiconductors | Consumption | CMOS | Electric potential | Reduction | Chips
Frequency synthesizers | all-digital phase locked loop | Quantization | CMOS process | Phase locked loops | mismatch correction | Radio frequency | Low voltage | time-to-digital converter (TDC) | Linearity | Bandwidth | spur reduction | Vernier TDC | CMOS technology | ADPLL | digital calibration | fractional frequency synthesizer | Wideband | Mismatch correction | All-digital phase locked loop | Fractional frequency synthesizer | Time-to-digital converter (TDC) | Spur reduction | Digital calibration | PHASE-LOCKED LOOPS | CONVERTER | ENGINEERING, ELECTRICAL & ELECTRONIC | Semiconductors | Consumption | CMOS | Electric potential | Reduction | Chips
Journal Article
IEEE Journal of Solid-State Circuits, ISSN 0018-9200, 07/2008, Volume 43, Issue 7, pp. 1666 - 1676
Time-to-digital converters (TDCs) are promising building blocks for the digitalization of mixed-signal functionality in ultra-deep-submicron CMOS technologies....
Phase measurement | Circuits | Phase locked loops | Delay | Signal resolution | Digital calibration | Interpolation | pulse shrinking | time-to-digital converter (TDC) | passive time interpolation | Voltage | Vernier TDC | CMOS technology | digital PLL | Velocity measurement | high-resolution time interval measurement | Signal to noise ratio | High-resolution time interval measurement | Pulse shrinking | Digital PLL | Time-to-digital converter (TDC) | Passive time interpolation | CMOS | digital calibration | CONVERTER | ENGINEERING, ELECTRICAL & ELECTRONIC | Construction | State of the art | Quantization | Voltage dividers | Nonlinearity | Inverters | Coarsening
Phase measurement | Circuits | Phase locked loops | Delay | Signal resolution | Digital calibration | Interpolation | pulse shrinking | time-to-digital converter (TDC) | passive time interpolation | Voltage | Vernier TDC | CMOS technology | digital PLL | Velocity measurement | high-resolution time interval measurement | Signal to noise ratio | High-resolution time interval measurement | Pulse shrinking | Digital PLL | Time-to-digital converter (TDC) | Passive time interpolation | CMOS | digital calibration | CONVERTER | ENGINEERING, ELECTRICAL & ELECTRONIC | Construction | State of the art | Quantization | Voltage dividers | Nonlinearity | Inverters | Coarsening
Journal Article
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